Abstract: The invention provides a system and method for microscopic X-ray fluorescence. An X-ray source, X-ray focusing element and a tapered X-ray opaque focusing aperture provide a focused X-ray spot on a sample. The system translates a sample between an imaging position and a testing position. In the imaging position, the sample is aligned in three dimensions and after alignment, the system automatically translates the sample between the imaging position and the testing position. To avoid collision between the sample and other elements of the system, a position detecting device terminates the sample translation if the sample trips the position detecting device. The focusing aperture of the system has a tapered through opening to block unfocused X-rays and reduce or eliminate a halo effect. To detect low atomic number elements, a detector aperture is vacuum sealed to an X-ray detector and X-ray elements of the system are vacuum evacuated.

Abstract: A system and method for correcting automatically the distortions in electron background diffration (EBSD) patterns which result from magnetic fields produced by some scanning electron microscopes (SEMs) used for collecting such patterns from polycrystalline sample materials. The method may be implemented as a software program running on a computer which is part of a conventional system for obtaining and analyzing EBSD patterns to obtain crystallographic information about the sample material. The method includes a calibration procedure and a correction procedure. In the calibration procedure, a distorted EBSD pattern obtained from a calibration sample is displayed on an operator display and user interface. Using an input device, an operator defines segment endpoints along a Kikuchi band in the distorted EBSD pattern image. From the user defined segment endpoints, correction parameters are calculated based on a mathematical curve (e.g., cubic spline) fitting the endpoints.

Abstract: An x-ray optic is employed in combination with an energy dispersive spectroscopy (EDS) detector to enhance detection performance. Such a combined optic and detector may be employed in scanning electron microscope or environmental scanning electron microscope (ESEM) applications. The x-ray optic may be a grazing incidence optic (GIO) employed as a flux enhancing collimator for use with an EDS detector, used to perform electron beam microanalysis. It is found that the GIO in combination with an EDS provides substantial intensity gain for x-ray lines with energy below 1 keV. The GIO is also found to provide a modest focus effect, i.e., by limiting the field of view of the detector, and introduces minimal spectral effects. The combined optic and detector is useful in applications employing broad beam excitation, such as an ESEM or a system using x-ray fluorescence, to spatially limit the x-rays of interest to those within the acceptance angle of the optic.

Abstract: In laser scanning microscope systems using short pulsed laser sources incorporating an acousto-optical deflector, compensation is provided for spatial dispersion introduced by the deflector. Spatial dispersion of short pulses, such as those provided by a laser utilized in two photon fluorescence microscopy, occurs due to the higher and lower wavelength components in the pulsed laser beam as the beam is passed through an acousto-optical deflector or other similar diffractive element. A dispersive prism is mounted adjacent to the exit face of the acousto-optical deflector to spatially recombine the components of the pulse. A mirror may be mounted adjacent to the input face of the acousto-optical deflector and adjusted to adjust the angle of incidence of the beam on the input face of the deflector to match the Bragg condition at the center wavelength and so that both sides of the spectrum of the pulses are somewhat Bragg-mismatched and attenuated.

Abstract: The miller comprises a pair of benches situated on both sides of a framework, in such a manner that on the upper crossbar is mounted, displaceable and guidable, a transverse support that carries a couple of vertical arms on which are mounted the corresponding tools, the arms being dispaceable towards one side or the other with respect to the support, while the tool that is borne by each of the arms may move upward/downward, as well as rotate, in such a manner that a combination of these movements produced by their corresponding motors allows simultaniously making two pieces that are symmetrical or the same, as well as effect simultanious digitalized work with one arm and milling with the other, after having mounted the corresponding tool on one arm and a digitalizer on the other.

Abstract: Wavelength selection apparatus for use in various applications such as spectrometry, the demultiplexing/multiplexing of multiline laser beams, and so forth, includes an input prism and an output prism aligned along an optical axis, and at least one side mirror. A second side mirror spaced from the first side mirror on the opposite side of the optical axis may be provided, as well as end mirrors adjacent to the input and output prisms. An incoming beam incident upon the input prism is refracted so as to deflect and angularly disperse the various wavelengths present in the input beam, with the dispersing beam reflected from the first side mirror either directly to the output prism or with intermediate reflections from the second side mirror and the end mirrors before impinging upon the output prism. The output prism matches the input prism and deflects and recollimates the dispersed wavelengths to provide parallel output beams of different wavelengths spaced from one another.

Abstract: Flash photolysis is carried out in a microscope imaging system while maintaining continuous and superimposed imaging of the target area to which the flash is directed as well as its surroundings. In scanning imaging systems an excitation optical coupler receives the flash excitation beam and directs it onto an optical path through an aperture spatial filter to a main optical coupler, which directs the excitation beam into the microscope. The scanning beam from the scanning system is also passed through the main optical coupler to the microscope and the reflected light from the specimen is passed back from the microscope through the main optical coupler to the scanning system in a normal fashion to allow imaging of the specimen when the excitation beam is not provided.

Abstract: An x-ray collimator for wavelength dispersive spectroscopy and the like includes a grazing incidence mirror optic having a polycapillary x-ray optic nested therein. The polycapillary x-ray optic is mounted in a hollow bore of the grazing incidence mirror optic so as not to interfere with operation of the grazing incidence mirror. The polycapillary x-ray optic extends the range of the grazing incidence mirror optic to higher energy ranges. The x-ray collimator of the present invention may be employed in a wavelength dispersive x-ray spectrometer including a diffracting element positioned to receive x-rays collimated by the x-ray collimator, and an x-ray detector positioned to receive the x-rays defracted by the diffracting element. A wavelength dispersive x-ray spectrometer in accordance with the present invention may be used in combination with an energy beam microscope, such as an electron microscope, to analyze x-rays emanating from a sample specimen.

Abstract: A two-piece collimator for use in high takeoff angle energy dispersive spectroscopy (EDS) is provided. The two-piece collimator includes a base section and an extension section. The collimator base section may be attached rigidly to the end of an EDS detector tube. The collimator extension section is removably attached to and extends from the base section. Apertures through the base and extension sections are easily aligned with each other and with an EDS detector. The length of the collimator extension section is preferably selected such that the distal end of the extension section extends below the bottom of an upper pole piece of an electron microscope in which the collimator is employed. A two-piece collimator in accordance with the present invention effectively reduces stray radiation, including back scattered electrons, which may cause artifacts in a detected EDS X-ray spectrum.

Abstract: An improved X-ray spectrometer detector system includes a mechanical cooling system with a compressor connected by supply and return lines to a cryocooler connected to an X-ray dispersive spectrometer detector for an electron microscope. Within a housing containing a cryocooler heat exchanger, a heat sink thermal mass is thermally connected to a cold finger heat conducting structure which has the X-ray detector mounted at its distal end. The housing insulates the cryocooler heat exchanger and the heat sink from the external ambient. The compressor unit is operated to cool the detector to a desired low operating temperature at which precision measurements may be made. When such measurements are to be made, the compressor is turned off to minimize vibrations that could interfere with X-ray detector measurements or the operation of the electron microscope.

Abstract: A noisy signal obtained from an acquisition system, such as a conventional or confocal microscope, is reconstructed in a manner which simultaneously estimates the true or ideal signal as well as the response function of the acquisition system. The restored signal can be a function of one or more variables, e.g., time or space. Prior knowledge of the response function of the acquisition system is not required, there is no the need to calibrate the acquisition system before acquiring a signal. The true signal and the response function of the acquisition system are estimated in iterative manner. The actual signal data and the frequency content of the actual signal data may be used to determine constraints to be applied to the estimates of the true signal and the impulse response of the acquisition system. These constraints include constraints on the signal (in the spatial domain) and constraints in the frequency domain.

Abstract: A slidable pane power window assembly for mounting in the rear window of truck cabs is disclosed. The assembly comprises a frame dimensioned to fit in the rear window opening of a truck cab and fitted with one or more fixed and slidable window panes. A slidable pane is moved horizontally into an opened and closed position by a rack and pinion drive, wherein a rack affixed to the slidable pane is engaged by a pinion powered by a motor connected to the pinion via power transmission cable. Another embodiment uses a push-pull mechanism for operating the window.

Abstract: A pair of slotted tapes made of a flexible material are slidingly disposed in opposed sides of a window frame to support corresponding side portions of a window pane. The tapes are driven downwardly or upwardly in unison along the opposed sides of the frame to open and close the window.

Abstract: A power window enclosure for replacing the cab window in trucks is disclosed. The enclosure comprises a glass windowpane housed in a substantially self contained flat rectangular enclosure having an upper portion dimensioned to fit in the cab window and defining a window opening and a lower portion containing means for raising and lowering the window. Furthermore, the windowpane is raised and lowered by a plurality of pulley lines coupled to the window pane and to a reciprocating block that selectively pulls on the lines, thereby raising and lowering the window.