Patents Assigned to Olympus NDT
  • Patent number: 11573208
    Abstract: A scanning device is provided. The scanning device includes a frame having a first portion and a second portion pivotably coupled to the first frame portion. The scanning device also includes a couplant source disposed in the first frame portion along with a couplant assembly. The couplant assembly includes a first couplant line disposed completely within the first frame portion and the second frame portion. The couplant assembly also includes a second couplant line extending from the first couplant line and out of the second frame portion at a first end of the second couplant line. The couplant assembly has a couplant line branch extending from the second couplant line where a sensor assembly of the ultrasound scanning device couples with the couplant line branch at an end opposite the second end of the second couplant line.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: February 7, 2023
    Assignee: Olympus NDT Canada Inc.
    Inventors: Benjamin Spay, Patrick Mimeault
  • Patent number: 11525805
    Abstract: An eddy current (EC) detection system comprises an EC probe including a plurality of sensors to provide corresponding EC response signals; and processing circuitry to evaluate speed of the EC probe based on a measurement of similarity of the EC response signals; determine whether the speed of the EC probe is too fast or two slow based on quality of the measurement; and generate a command to adjust speed of the EC probe during further EC inspection.
    Type: Grant
    Filed: June 3, 2020
    Date of Patent: December 13, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Rémi Leclerc, Benoit Lepage, Charles Brillon
  • Patent number: 11474076
    Abstract: Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving a plurality of scan plan parameters associated with generating an image of at least one flaw within a specimen based on acoustic echo data obtained using full matrix capture (FMC); applying the plurality of scan plan parameters to an acoustic model, the acoustic model configured to determine a two-way pressure response of a plurality of inspection modes based on specular reflection and diffraction phenomena; generating, by the acoustic model based on the plurality of scan plan parameters, an acoustic region of influence (AROI) comprising an acoustic amplitude sensitivity map for a first inspection mode amongst the plurality of inspection modes; and generating, for display, a first image comprising the AROI associated with the first inspection mode for capturing or inspecting the image of the at least one flaw.
    Type: Grant
    Filed: February 24, 2020
    Date of Patent: October 18, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Chi-Hang Kwan, Nicolas Badeau, Benoit Lepage, Guillaume Painchaud-April
  • Patent number: 11474075
    Abstract: An acoustic technique can be used for performing non-destructive testing. For example, a method for acoustic evaluation of a target can include generating respective acoustic transmission events via selected transmitting ones of a plurality of electroacoustic transducers, and in response to the respective acoustic transmission events, receiving respective acoustic echo signals using other receiving ones of the plurality of electroacoustic transducers, and coherently summing representations of the respective received acoustic echo signals to generate a pixel or voxel value corresponding to a specified spatial location of the target. Such summation can include weighting contributions from the respective representations to suppress contributions from acoustic propagation paths outside a specified angular range with respect to a surface on or within the target, such as to provide an acoustic path-filtered total focusing method (PF-TFM).
    Type: Grant
    Filed: March 31, 2020
    Date of Patent: October 18, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Benoit Lepage, Guillaume Painchaud-April
  • Patent number: 11467129
    Abstract: Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving, by one or more processors, data indicative of a detected tag on a specimen, the tag associated with one or more ultrasonic-based inspections that were previously performed on the specimen; retrieving, by the one or more processors, based on the detected tag, configuration data for a non-destructive testing (NDT) instrument, the configuration data being associated with the one or more ultrasonic-based inspections that were previously performed on the specimen; generating, by the one or more processors, new configuration data for the NDT instrument to perform a new inspection of the specimen at least in part using the received configuration data; and performing the new inspection of the specimen based on spatially positioning the NDT instrument relative to a position of the tag on the specimen.
    Type: Grant
    Filed: March 23, 2020
    Date of Patent: October 11, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Benoit Lepage, Jean Gauthier
  • Patent number: 11448621
    Abstract: An ultrasound probe can detect flaws in an object in a non-destructive manner. The probe includes a row-column addressed (RCA) array with a plurality of row and column electrodes. The row and column electrodes are configurable to have at least four states: 1) a transmission state, 2) a reception state, 3) a ground state, and 4) a high impedance state. The probe also includes a control circuit to operate the RCA array in different transmission and reception configurations.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: September 20, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Jinchi Zhang, Frederic Landry, Benoit Lepage
  • Patent number: 11408860
    Abstract: An ultrasound probe can detect flaws in an object in a non-destructive manner. The probe includes a row-column addressed (RCA) array with a plurality of row and column electrodes. The row and column electrodes are configurable to have at least four states: 1) a transmission state, 2) a reception state, 3) a ground state, and 4) a high impedance state. The probe also includes a control circuit to operate the RCA array in different transmission and reception configurations.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: August 9, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Jinchi Zhang, Frederic Landry, Benoit Lepage
  • Patent number: 9476859
    Abstract: A calibration method for calibrating a phased array probe that is used for testing girth welds for defects. The method utilizes a calibration device on which is defined a series of reflectors that correspond to a series of target zones. The phased array probe is placed via a wedge relative to the calibration device and the phased array probe is configured with an initial set of acoustic parameters which define at least a transmitting aperture, a receiving aperture and a beam steering angle. Using a Full Matrix Capture (FMC) acquisition process and a ray-tracing module, the values of the initial set of acoustic parameters are optimized to evolve a final set of acoustic parameters which the phased array probe utilizes for testing actual devices for weld defects.
    Type: Grant
    Filed: December 16, 2013
    Date of Patent: October 25, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventors: Jason Habermehl, Benoit LePage, Guillaume Painchaud-April
  • Patent number: 9453823
    Abstract: A pulse generation circuit and method includes using digital signals to trigger a first and second varying analog signals and detecting when they reach one or more reference levels. In response to the first and second varying analog signals reaching one or more reference levels, a first and a second digital control signals are produced and provided as input to a pulser producing a voltage excitation pulse having a width and timing defined by the first and second digital control signals.
    Type: Grant
    Filed: August 1, 2014
    Date of Patent: September 27, 2016
    Assignee: OLYMPUS NDT
    Inventor: Andrew Thomas
  • Patent number: 9350985
    Abstract: Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. Embodiments of presently disclosed harmonic rejection filters are tunable and employed to effectively abate or eliminate signals with frequencies that are multiples of operating frequencies, resulting in the removal of the circling effects on the display.
    Type: Grant
    Filed: September 25, 2013
    Date of Patent: May 24, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventor: Andrew Thomas
  • Patent number: 9316618
    Abstract: An eddy current object testing system includes an EC probe and an acquisition channel which is configured to receive an EC signal from the EC probe and to generate a visual output, namely an impedance plane representation, of the output. A display is coupled to the acquisition channel to display the visual output. The at least one probe is provided with a test loop substantially surrounding it and has a series switch which can be selectively closed or opened to thereby cause the image plane to assume a state that is indicative of a fault, if any, in the EC probe.
    Type: Grant
    Filed: March 26, 2014
    Date of Patent: April 19, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventor: Benoit LePage
  • Patent number: 9279786
    Abstract: Disclosed is a system and method suitable for calibrating a phased array system configured to inspect square bars. A square bar is provided with an array of parallel linear notches across the full range of the testing surface of the square bar for this calibrating purpose. The square bar is passed through the probe in probe's passive direction during the calibration. The phased array system is adjusted and calibrated so that the echo amplitude for each inspection channel of the phased array probe received from each notch is substantially equal. Then a known flaw with a typically expected flaw's size and shape is created on the same testing surface so that the system's sensitivity is adjusted using the amplitude of the echo signal from the known flaw as a baseline.
    Type: Grant
    Filed: August 22, 2012
    Date of Patent: March 8, 2016
    Assignee: OLYMPUS NDT
    Inventor: Jinchi Zhang
  • Patent number: 9279785
    Abstract: A coupling wedge for use with a ultrasonic phased array inspection system has a body with a bottom side configured to face the object to be tested and a front side generally oriented at an angle to the bottom side and a top side to be coupled with a phased array probe. The probe includes a plurality of apertures. The front side of the wedge has grooves formed with a plurality of reflectors that are positioned on the front side of the wedge, leaving a distance from the bottom side. The change in TOF values from the reflector to a specific aperture enable the determination of the temperature change in the wedge. An alarm to an operator or alternation of focal laws in the system for temperature compensation can be applied.
    Type: Grant
    Filed: May 31, 2013
    Date of Patent: March 8, 2016
    Assignee: OLYMPUS NDT
    Inventor: Jinchi Zhang
  • Patent number: 9244027
    Abstract: The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.
    Type: Grant
    Filed: May 31, 2013
    Date of Patent: January 26, 2016
    Assignee: OLYMPUS NDT
    Inventor: Brendan Connors
  • Patent number: 9243883
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
    Type: Grant
    Filed: March 27, 2014
    Date of Patent: January 26, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventors: Xiangdeng Xu, Paul DeAngelo
  • Patent number: 9182363
    Abstract: An instrument and a method of detecting a target element in a multi-layer thin coating. L?, L? and L? x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using L? and L? intensities once, and then using the L? and L? intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating.
    Type: Grant
    Filed: November 14, 2013
    Date of Patent: November 10, 2015
    Assignee: OLYMPUS NDT, INC.
    Inventor: Xunming Chen
  • Patent number: 9182212
    Abstract: Disclosed is a Hall sensor probe that configured to be coupled with one of a plurality of magnetic targets for measuring the thickness of a non-ferromagnetic wall. The probe comprises a magnetic field source, a Hall sensor, a concentrator and a main housing. The novel aspects of the probe include a wear tip that is exchangeably affixed onto the main-housing, leaving a permanent gap from and disjoined from the concentrator in a manner that transfers stress from the tip directly onto the main-housing. To serve every aspects of the primary objective, being it mechanical, thermal and operational, the material of the tip preferably has a fracture toughness higher than 20 MPa·m1/2, wear coefficient higher than 100, and a magnetic susceptibility lower than 0.001.
    Type: Grant
    Filed: November 7, 2012
    Date of Patent: November 10, 2015
    Assignee: OLYMPUS NDT, INC.
    Inventors: Matthew Edward Stanton, Steven Abe LaBreck
  • Patent number: 9176080
    Abstract: An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors.
    Type: Grant
    Filed: July 17, 2012
    Date of Patent: November 3, 2015
    Assignee: Olympus NDT, Inc.
    Inventor: Michael Drummy
  • Publication number: 20150276371
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
    Type: Application
    Filed: March 27, 2014
    Publication date: October 1, 2015
    Applicant: Olympus NDT, Inc.
    Inventors: Xiangdeng XU, Paul DeANGELO
  • Patent number: 9110036
    Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.
    Type: Grant
    Filed: July 31, 2013
    Date of Patent: August 18, 2015
    Assignee: OLYMPUS NDT, INC.
    Inventor: Benoit Lepage