Patents Assigned to Olympus NDT Canada Inc.
  • Patent number: 11573208
    Abstract: A scanning device is provided. The scanning device includes a frame having a first portion and a second portion pivotably coupled to the first frame portion. The scanning device also includes a couplant source disposed in the first frame portion along with a couplant assembly. The couplant assembly includes a first couplant line disposed completely within the first frame portion and the second frame portion. The couplant assembly also includes a second couplant line extending from the first couplant line and out of the second frame portion at a first end of the second couplant line. The couplant assembly has a couplant line branch extending from the second couplant line where a sensor assembly of the ultrasound scanning device couples with the couplant line branch at an end opposite the second end of the second couplant line.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: February 7, 2023
    Assignee: Olympus NDT Canada Inc.
    Inventors: Benjamin Spay, Patrick Mimeault
  • Patent number: 11525805
    Abstract: An eddy current (EC) detection system comprises an EC probe including a plurality of sensors to provide corresponding EC response signals; and processing circuitry to evaluate speed of the EC probe based on a measurement of similarity of the EC response signals; determine whether the speed of the EC probe is too fast or two slow based on quality of the measurement; and generate a command to adjust speed of the EC probe during further EC inspection.
    Type: Grant
    Filed: June 3, 2020
    Date of Patent: December 13, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: RĂ©mi Leclerc, Benoit Lepage, Charles Brillon
  • Patent number: 11474076
    Abstract: Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving a plurality of scan plan parameters associated with generating an image of at least one flaw within a specimen based on acoustic echo data obtained using full matrix capture (FMC); applying the plurality of scan plan parameters to an acoustic model, the acoustic model configured to determine a two-way pressure response of a plurality of inspection modes based on specular reflection and diffraction phenomena; generating, by the acoustic model based on the plurality of scan plan parameters, an acoustic region of influence (AROI) comprising an acoustic amplitude sensitivity map for a first inspection mode amongst the plurality of inspection modes; and generating, for display, a first image comprising the AROI associated with the first inspection mode for capturing or inspecting the image of the at least one flaw.
    Type: Grant
    Filed: February 24, 2020
    Date of Patent: October 18, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Chi-Hang Kwan, Nicolas Badeau, Benoit Lepage, Guillaume Painchaud-April
  • Patent number: 11474075
    Abstract: An acoustic technique can be used for performing non-destructive testing. For example, a method for acoustic evaluation of a target can include generating respective acoustic transmission events via selected transmitting ones of a plurality of electroacoustic transducers, and in response to the respective acoustic transmission events, receiving respective acoustic echo signals using other receiving ones of the plurality of electroacoustic transducers, and coherently summing representations of the respective received acoustic echo signals to generate a pixel or voxel value corresponding to a specified spatial location of the target. Such summation can include weighting contributions from the respective representations to suppress contributions from acoustic propagation paths outside a specified angular range with respect to a surface on or within the target, such as to provide an acoustic path-filtered total focusing method (PF-TFM).
    Type: Grant
    Filed: March 31, 2020
    Date of Patent: October 18, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Benoit Lepage, Guillaume Painchaud-April
  • Patent number: 11467129
    Abstract: Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving, by one or more processors, data indicative of a detected tag on a specimen, the tag associated with one or more ultrasonic-based inspections that were previously performed on the specimen; retrieving, by the one or more processors, based on the detected tag, configuration data for a non-destructive testing (NDT) instrument, the configuration data being associated with the one or more ultrasonic-based inspections that were previously performed on the specimen; generating, by the one or more processors, new configuration data for the NDT instrument to perform a new inspection of the specimen at least in part using the received configuration data; and performing the new inspection of the specimen based on spatially positioning the NDT instrument relative to a position of the tag on the specimen.
    Type: Grant
    Filed: March 23, 2020
    Date of Patent: October 11, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Benoit Lepage, Jean Gauthier
  • Patent number: 11448621
    Abstract: An ultrasound probe can detect flaws in an object in a non-destructive manner. The probe includes a row-column addressed (RCA) array with a plurality of row and column electrodes. The row and column electrodes are configurable to have at least four states: 1) a transmission state, 2) a reception state, 3) a ground state, and 4) a high impedance state. The probe also includes a control circuit to operate the RCA array in different transmission and reception configurations.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: September 20, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Jinchi Zhang, Frederic Landry, Benoit Lepage
  • Patent number: 11408860
    Abstract: An ultrasound probe can detect flaws in an object in a non-destructive manner. The probe includes a row-column addressed (RCA) array with a plurality of row and column electrodes. The row and column electrodes are configurable to have at least four states: 1) a transmission state, 2) a reception state, 3) a ground state, and 4) a high impedance state. The probe also includes a control circuit to operate the RCA array in different transmission and reception configurations.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: August 9, 2022
    Assignee: Olympus NDT Canada Inc.
    Inventors: Jinchi Zhang, Frederic Landry, Benoit Lepage