Patents Assigned to PARAGON SCIENCE, INC.
  • Patent number: 8738652
    Abstract: Methods and systems for detecting anomalies in sets of data are disclosed, including: computing components of one or more types of feature vectors at a plurality of values of one or more independent variables, each type of the feature vectors characterizing a set of input data being dependent on the one or more independent variables; computing one or more types of output values corresponding to each type of feature vectors as a function of the one or more independent variables using a nonlinear sequence analysis method; and detecting anomalies in how the one or more types of output values change as functions of the one or more independent variables.
    Type: Grant
    Filed: March 11, 2008
    Date of Patent: May 27, 2014
    Assignee: Paragon Science, Inc.
    Inventor: Stephen Patrick Kramer
  • Publication number: 20090234899
    Abstract: Methods and systems for detecting anomalies in sets of data are disclosed, including: computing components of one or more types of feature vectors at a plurality of values of one or more independent variables, each type of the feature vectors characterizing a set of input data being dependent on the one or more independent variables; computing one or more types of output values corresponding to each type of feature vectors as a function of the one or more independent variables using a nonlinear sequence analysis method; and detecting anomalies in how the one or more types of output values change as functions of the one or more independent variables.
    Type: Application
    Filed: March 11, 2008
    Publication date: September 17, 2009
    Applicant: PARAGON SCIENCE, INC.
    Inventor: Stephen Patrick Kramer