Patents Assigned to Phaidra, Inc.
  • Publication number: 20240111260
    Abstract: Methods and systems are disclosed for determining a plan to optimize key performance indicators (KPIs) of an industrial process. Such a plan is determined based on generating a query for information associated with the KPIs and based on receiving user-provided object information corresponding to the KPIs. The method includes receiving, at a user interface, one or more KPIs associated with an industrial process. The method includes generating, based on the one or more KPIs, at least one query for information associated with the KPI. The method includes receiving, at the user interface, a response to the at least one query. The method includes determining, by an artificial intelligence agent, a plan for optimizing the KPI.
    Type: Application
    Filed: December 13, 2023
    Publication date: April 4, 2024
    Applicant: Phaidra Inc.
    Inventors: Jim Jingyue Gao, Vedavyas Panneershelvam, Katherine Elizabeth Hoffman, Paritosh Mohan, Christopher R. Vause
  • Patent number: 11868098
    Abstract: Methods and systems are disclosed for determining a plan to optimize key performance indicators (KPIs) of an industrial process. Such a plan is determined based on generating a query for information associated with the KPIs and based on receiving user-provided object information corresponding to the KPIs. The method includes receiving, at a user interface, one or more KPIs associated with an industrial process. The method includes generating, based on the one or more KPIs, at least one query for information associated with the KPI. The method includes receiving, at the user interface, a response to the at least one query. The method includes determining, by an artificial intelligence agent, a plan for optimizing the KPI.
    Type: Grant
    Filed: November 12, 2021
    Date of Patent: January 9, 2024
    Assignee: Phaidra, Inc.
    Inventors: Jim Jingyue Gao, Vedavyas Panneershelvam, Katherine Elizabeth Hoffman, Paritosh Mohan, Christopher R. Vause