Patents Assigned to PHOENIX NEUTRON IMAGING LLC
  • Patent number: 11903117
    Abstract: Provided herein are systems, devices, articles of manufacture, and methods for generating neutrons employing a high energy ion beam target (HEM target) and a target backing configured to be in contact with the bottom surface of the HEIB target (e.g., to generate an ion beam target assembly). In certain embodiments, the HEM target has a thickness that is less than the penetration depth of protons or deuterons in the high energy ion beam that strikes the target. In certain embodiments, the target backing comprises a high hydrogen diffusion metal (e.g., palladium), has open spaces dispersed throughout for reduced proton diffusion distances, and has a shape and thickness such that all, or virtually all, of the protons or deuterons that pass through the HEIB target are stopped. Also provided herein are systems, devices, and methods for changing targets in an ion beam accelerator system.
    Type: Grant
    Filed: February 15, 2023
    Date of Patent: February 13, 2024
    Assignee: PHOENIX NEUTRON IMAGING LLC
    Inventors: Ross Radel, Tye Gribb
  • Patent number: 11662485
    Abstract: Provided herein are neutron imaging systems (e.g., radiography and tomography) systems and methods that provide, for example, high-quality, high throughput 2D and 3D fast or thermal neutron and/or X-ray images. Such systems and methods find use for the commercial-scale imaging of industrial components. In certain embodiments, provided herein are system comprising a plurality of independent neutron absorber-lined collimators (e.g., 4 or more collimators) extending outwards from a central neutron source assembly.
    Type: Grant
    Filed: September 8, 2021
    Date of Patent: May 30, 2023
    Assignee: PHOENIX NEUTRON IMAGING LLC
    Inventors: Ross Radel, Evan Sengbusch, Michael Taylor, Christopher M. Seyfert, Eli Moll, Lucas Jacobson
  • Patent number: 11612048
    Abstract: Provided herein are systems, devices, articles of manufacture, and methods for generating neutrons employing a high energy ion beam target (HEIB target) and a target backing configured to be in contact with the bottom surface of the HEIB target (e.g., to generate an ion beam target assembly). In certain embodiments, the HEIB target has a thickness that is less than the penetration depth of protons or deuterons in the high energy ion beam that strikes the target. In certain embodiments, the target backing comprises a high hydrogen diffusion metal (e.g., palladium), has open spaces dispersed throughout for reduced proton diffusion distances, and has a shape and thickness such that all, or virtually all, of the protons or deuterons that pass through the HEIB target are stopped. Also provided herein are systems, devices, and methods for changing targets in an ion beam accelerator system.
    Type: Grant
    Filed: December 22, 2020
    Date of Patent: March 21, 2023
    Assignee: PHOENIX NEUTRON IMAGING LLC
    Inventors: Ross Radel, Tye Gribb
  • Patent number: 11131783
    Abstract: Provided herein are neutron imaging systems (e.g., radiography and tomography) systems and methods that provide, for example, high-quality, high throughput 2D and 3D fast or thermal neutron and/or X-ray images. Such systems and methods find use for the commercial-scale imaging of industrial components. In certain embodiments, provided herein are system comprising a plurality of independent neutron absorber-lined collimators (e.g., 4 or more collimators) extending outwards from a central neutron source assembly.
    Type: Grant
    Filed: April 11, 2019
    Date of Patent: September 28, 2021
    Assignee: PHOENIX NEUTRON IMAGING LLC
    Inventors: Ross Radel, Evan Sengbusch, Michael Taylor, Christopher M. Seyfert, Eli Moll, Lucas Jacobson
  • Patent number: 10874013
    Abstract: Provided herein are systems, devices, articles of manufacture, and methods for generating neutrons employing a high energy ion beam target (HEIB target) and a target backing configured to be in contact with the bottom surface of the HEIB target (e.g., to generate an ion beam target assembly). In certain embodiments, the HEIB target has a thickness that is less than the penetration depth of protons or deuterons in the high energy ion beam that strikes the target. In certain embodiments, the target backing comprises a high hydrogen diffusion metal (e.g., palladium), has open spaces dispersed throughout for reduced proton diffusion distances, and has a shape and thickness such that all, or virtually all, of the protons or deuterons that pass through the HEIB target are stopped. Also provided herein are systems, devices, and methods for changing targets in an ion beam accelerator system.
    Type: Grant
    Filed: June 4, 2019
    Date of Patent: December 22, 2020
    Assignee: PHOENIX NEUTRON IMAGING LLC
    Inventors: Ross Radel, Tye Gribb