Abstract: In one aspect, a system for obtaining dielectric properties of an object is disclosed, which comprises a plurality of transceivers for generating radiation in the microwave or millimeter-wave region of the electromagnetic spectrum. The transceivers are positioned in spatially fixed relationships relative to one another. The system further includes a controller for selectively activating the transceivers for irradiating at least a portion of the object and detecting at least a portion of the radiation reflected from said portion of the object in response to the irradiation, where each of the activated transceivers generates a signal in response to detection of the reflected radiation. The reflected signals are analyzed to determine a plurality of reflectivity coefficients corresponding to different discrete locations of the object, and the reflectivity coefficients are used to determine the complex permittivity of the discrete locations.

Abstract: In one aspect, a system for obtaining dielectric properties of an object is disclosed, which comprises a plurality of transceivers for generating radiation in the microwave or millimeter-wave region of the electromagnetic spectrum. The transceivers are positioned in spatially fixed relationships relative to one another. The system further includes a controller for selectively activating the transceivers for irradiating at least a portion of the object and detecting at least a portion of the radiation reflected from said portion of the object in response to the irradiation, where each of the activated transceivers generates a signal in response to detection of the reflected radiation. The reflected signals are analyzed to determine a plurality of reflectivity coefficients corresponding to different discrete locations of the object, and the reflectivity coefficients are used to determine the complex permittivity of the discrete locations.