Patents Assigned to Power Probe, Inc
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Patent number: 10837994Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold.Type: GrantFiled: October 25, 2016Date of Patent: November 17, 2020Assignee: Power Probe, Inc.Inventors: Jeff Whisenand, Randy Cruz
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Patent number: 10768205Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.Type: GrantFiled: September 18, 2017Date of Patent: September 8, 2020Assignee: Power Probe, Inc.Inventor: Wayne Russell
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Patent number: 9513320Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold.Type: GrantFiled: April 27, 2015Date of Patent: December 6, 2016Assignee: Power Probe, Inc.Inventors: Jeff Whisenand, Randy Cruz
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Publication number: 20160131316Abstract: An apparatus and a method are provided for a smart modular illumination system configured to orient and illuminate a plurality of illumination nodes toward a moving object within a target area. The system comprises a controller that signals the illumination nodes when a motion detector observes movement within the target area. The controller refrains from signaling the illumination nodes when ambient light within the target area exceeds a predetermined value. An adjustable mounting member coupled with each of the illumination nodes orients the illumination nodes according to signals received from the controller. The smart modular illumination system is configured to adjust the orientation and brightness of all of the illumination nodes so as to cast light on the moving object from a variety of angles with a reduced occurrence of shadows.Type: ApplicationFiled: November 6, 2015Publication date: May 12, 2016Applicant: Power Probe, Inc.Inventors: Wayne Russell, Joshua Carton, David Barden
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Publication number: 20150241489Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold.Type: ApplicationFiled: April 27, 2015Publication date: August 27, 2015Applicant: Power Probe, Inc.Inventors: Jeff Whisenand, Randy Cruz
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Patent number: 9063191Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The conductive probe element may be energized by a power supply. The probe element may be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system.Type: GrantFiled: February 24, 2012Date of Patent: June 23, 2015Assignee: Power Probe, Inc.Inventors: Jeff Whisenand, Randy Cruz
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Publication number: 20140184260Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.Type: ApplicationFiled: December 29, 2012Publication date: July 3, 2014Applicant: POWER PROBE, INC.Inventor: Wayne Russell
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Publication number: 20130221973Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The conductive probe element may be energized by a power supply. The probe element may be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system.Type: ApplicationFiled: February 24, 2012Publication date: August 29, 2013Applicant: POWER PROBE, INC.Inventors: Jeff Whisenand, Randy Cruz
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Patent number: 7184899Abstract: Provided is an electrical test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters. The electrical test device comprises a conductor probe element, a power supply, a processor and a display device. The power supply is interconnected between an external power source and a probe element. The processor is connected to the probe element and is configured to provide an input signal to the electrical system and receive an output signal in response thereto. The output signal is representative of at least one of the parameters of the electrical system. The display device is configured to display reading the output signal which is representative of the parameter. The electrical device is configured to allow for selective powering of the electrical system upon energization of the probe element during measurement of the parameters.Type: GrantFiled: January 5, 2005Date of Patent: February 27, 2007Assignee: Power Probe, IncInventor: Randy Cruz