Abstract: Automatic non-contact measuring optical properties of an optical object is performed by a system comprising a light source, a reference pattern, and an imaging and detecting means and an image processing means for producing a measurement output. At least the reference pattern and the imaging and detecting means are disposed on an optical axis of the system. The system further comprises a support for the optical object located between the reference pattern and the imaging and detecting means for disposing thereon the optical object coaxially with the pattern and the imaging and detecting means. The light source is capable of directing to the pattern an illuminating light in such a manner as to produce a plurality of illuminating light beams outcoming from each point of the pattern at different angles.

Abstract: Inspection of an optical object for the existence therein of inhomogeneities, comprises providing a diverging beam of inspection radiation and directing the beam on the optical object so that each point thereof is illuminated at a single angle; projecting the beam through the optical object on a projection screen and obtaining thereby a shadow pattern thereof, the optical inhomogeneities being distinguishable in the shadow pattern owing to the difference in the brightness of the areas corresponding thereto over the background brightness of the pattern; imaging the shadow pattern via the optical object in such a manner that the rays forming the image pass through each point of the optical object at an angle corresponding to the angle at which the point is illuminated; and detecting and analyzing the image of the shadow pattern.

Abstract: There is provided a method and an apparatus for testing an optical component for cosmetic defects, the component having optical surfaces, a peripheral surface and a bulk defined by the optical and peripheral surfaces, a range of inspection of the component including at least one optical surface and the bulk of the component at least in the vicinity of the one optical surface. The method includes producing at least one beam of inspection radiation and directing rays of the at least one beam onto the peripheral surface at such angles as to enable the rays to travel in the bulk of the component by multiple total internal reflections from the at least one optical surface, providing illumination of each point in the inspection range by set of rays at different angles, and to emerge from the component through the peripheral surface, and monitoring a radiation scattered by the defects and emerging from the component through the at least one optical surface, thereby identifying the defects.