Abstract: An apparatus for non-contact monitoring of travelling objects being produced in an unguided linear process comprising: a toroidal structure with an open aperture defining a measuring zone, a source of radiation configured by a plurality of radiation devices circumferentially disposed within the measuring zone whereby the radiation source emits rays that generate a planar screen of radiation across the object circumferentially to envelop the object, a plurality of circumferentially disposed recording devices for receiving radiation from the radiation devices following interception of the rays by the objects, and analysis means for analyzing imaging information of the emitted radiation recorded by the recording devices thereby to provide a measure of the physical characteristics of the object.

Abstract: An apparatus for non-contact monitoring of travelling objects being produced in an unguided linear process comprising: a toroidal structure with an open aperture defining a measuring zone, a source of radiation configured by a plurality of radiation devices circumferentially disposed within the measuring zone whereby the radiation source emits rays that generate a planar screen of radiation across the object circumferentially to envelop the object, a plurality of circumferentially disposed recording devices for receiving radiation from the radiation devices following interception of the rays by the objects, and analysis means for analyzing imaging information of the emitted radiation recorded by the recording devices thereby to provide a measure of the physical characteristics of the object.

Abstract: The invention relates to apparatus for monitoring an extruded product moving in an inline extrusion process so as to effect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation which is adapted to provide a curtain of parallel rays of the radiation which is scanned across the product as the product passes therethrough in a linear manner. The composition of the emitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters of the moving products. The imaging analysis involves applying correction values to the measured transit times of the rays crossing the products which depends on its position within the curtain of rays thereby to remove inaccuracies in the final measurement results.

Abstract: The invention relates to an apparatus for monitoring extruded products moving in an inline extrusion process so as to affect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation, which is adapted to provide a curtain of parallel rays of the radiation, which is scanned across the product as the product passes there-through in a linear manner. The composition of the omitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters and contaminant free integrity of the extrusion process.

Abstract: The invention relates to an apparatus for monitoring extruded products moving in an inline extrusion process so as to affect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation, which is adapted to provide a curtain of parallel rays of the radiation, which is scanned across the product as the product passes there-through in a linear manner. The composition of the omitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters and contaminant free integrity of the extrusion process.