Patents Assigned to Quanta Vision, Inc.
-
Patent number: 6831964Abstract: An x-ray radiation source in which a focused electron beam impinges upon a target positioned in front of the focal point of the electron beam and the radiation emitted by the target travels through the aperture of an aperture diaphragm with the aperture disposed at the focal point of the electron beam.Type: GrantFiled: August 16, 2001Date of Patent: December 14, 2004Assignee: Quanta Vision, Inc.Inventors: Pavel Ivanovich Lazarev, Oleg Valentinovich Komardin
-
Patent number: 6483891Abstract: The invention relates to the mammography devices based on registration of a reduced-angle coherently scattered radiation when an object is rayed by a penetrating radiation. Registration of the radiation coherently scattered by an object allows to produce an image of an object in the form of distribution of its structural characteristics. The device comprises a system for forming a directed on a tested object, narrow small-divergence beams, or a beam, having the same characteristics, and a system for extracting the radiation that is coherently scattered in small angles by an object. The invention proposes versions of a device that also provide for registration of the radiation passed through an object to make allowance for its thickness so that to obviate the necessity to compress the breast. The device allows to carry out relative movements of an object and system of irradiation-registration, as well as irradiate an object at different angles and by a number of radiation sources simultaneously.Type: GrantFiled: March 16, 2001Date of Patent: November 19, 2002Assignee: Quanta Vision, Inc.Inventors: Pavel Ivanovich Lazarev, Oleg Valentinovich Komardin
-
Patent number: 6281503Abstract: A method for characterizing a test sample of biological tissue is disclosed. The method includes obtaining a radiation scattering pattern produced by the test sample of biological tissue and processing the radiation scattering pattern to determine a pair distance distribution function for the test sample. The method also includes comparing sample data derived from the pair distance distribution function with known data derived from known samples which each have one or more known characteristics.Type: GrantFiled: April 5, 1999Date of Patent: August 28, 2001Assignee: Quanta Vision, Inc.Inventors: Pavel Lazarev, Mikhail Paukshto
-
Patent number: 6175117Abstract: An apparatus for analyzing substances within a breast is disclosed. The apparatus includes a breast positioning area and a beam forming apparatus having a geometry which forms breast penetrating radiation into at least one beam. A detector is configured to detect a scattering pattern of the portion of the breast which scatters radiation from the at least one beam when the breast is positioned within the breast positioning area.Type: GrantFiled: May 6, 1998Date of Patent: January 16, 2001Assignee: Quanta Vision, Inc.Inventors: Oleg Komardin, Pavel Lazarev
-
Patent number: 6054712Abstract: Devices for X-ray topography determine structures and compositions of objects. In accordance with an embodiment of the invention, a scanning system forms images using small angle scattering. A spatial filter selects radiation an object scatters at small angles and blocks other radiation. A coordinate-sensitive detector behind the filter records the scattered radiation. An object image is constructed based on the small-angle scattering information and the compositions of regions of the object are determined from scattering curves for the regions. One embodiment of the invention includes a source of penetrating radiation, a detector system for radiation transmitted through an analyzed object, a detector system for radiation the object scatters at small angles, and a unit for moving the object during scanning. A three-dimensional absorption factor distribution is determined for the object by X-raying the object at different angles.Type: GrantFiled: January 23, 1998Date of Patent: April 25, 2000Assignee: Quanta Vision, Inc.Inventors: Oleg V. Komardin, Albert F. Lawrence, Pavel I. Lazarev
-
Patent number: 5805662Abstract: A method of nondestructive investigation of the internal structure of an object uses deflected penetrating radiation. In one embodiment, an incident penetrating radiation flow 4 with angular divergence restricted by a collimator 3 passes through an object 5 to create the a radiation flow 6 registered by a direction-selective detector 10. Typically, the directivity pattern of detector 10 selects a desired angle and has a width no larger than twice the local angular divergence of the incident penetrating radiation flow 4. The desired angle can be the maxima of a scattering pattern for a substance suspected of being in object 5. To improve the quality and range of measurements, the local restrictions of radiation flow 4 is fulfilled in the two intersecting planes; and detector 10 and/or incident radiation flow 4 can be swept through a range of orientations to detect radiation deflected at a range of angles larger than the directivity pattern detector 10 has when fixed.Type: GrantFiled: December 7, 1995Date of Patent: September 8, 1998Assignee: Quanta Vision, Inc.Inventors: Alexey V. Kurbatov, Pavel I. Lazarev
-
Patent number: 5717733Abstract: A method and device for examining the internal structure of an object uses diffracted X-rays or other penetrating radiation. In one embodiment, spatial filters proximate to a source of radiation transmit an array of divergent pixel-beams which irradiate an object being examined. The object absorbs, refracts, diffracts, and incoherently scatters radiation from the pixel-beams. Spatial filters proximate to a detector block undeflected and refracted radiation which exits the object. The detector separately measures diffracted radiation for each pixel-beam. For example, an integral of the diffracted intensity around a pixel-beam provides a pixel intensity in an image of the object. Alternatively, analyzing the intensity in a diffraction pattern around a pixel-beam can identify structures and materials within the object. A non-invasive procedure identifies abnormal tissue by measuring radiation diffracted at an angle characteristic of the diffraction pattern for abnormal tissue.Type: GrantFiled: May 31, 1995Date of Patent: February 10, 1998Assignee: Quanta Vision, Inc.Inventors: Alexey V. Kurbatov, Pavel I. Lazarev
-
Patent number: 5684851Abstract: An imaging system spatially modulates penetrating radiation that passes through an object under investigation. The modulation introduces spatial irregularities which can be deflected while passing through the object under investigation. The deflection of each irregularity can be identified and is converted into contrast of in a projection of the object. One embodiment of the invention includes: a source of penetrating radiation 1, and a modulator 3 for the creation of spatial irregularities; and a detector 5 for measuring transverse translations of spatial irregularities and converting the measured transverse translations into contrast in a projection 8 of object 4.Type: GrantFiled: November 29, 1995Date of Patent: November 4, 1997Assignee: Quanta Vision, Inc.Inventors: Alexey V. Kurbatov, Pavel I. Lazarey