Abstract: The single-camera angled conveyance inspection method and apparatus includes upwardly and downwardly angled conveyance mechanisms positioned within an instantaneous field of view of a digital line scan camera. As a rotating object is moved over the conveyances by a helical guide, the camera obtains images of the object and communicates the images to a processor. The processor assembles a reflectance and fluorescence image of the object including detected defects and/or contamination on the outer surface of the object.
Type:
Grant
Filed:
March 1, 2013
Date of Patent:
February 14, 2017
Assignees:
The United States of America, as represented by the Secretary of Agriculture, Republic of Korea, as represented by the Administrator of Rural Development Administration
Inventors:
Moon S. Kim, Kuanglin Chao, Alan M. Lefcourt, Kangjin Lee, Sukwon Kang, Diane E. Chan