Abstract: A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

Abstract: A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

Abstract: An electrical socket (10) mounts a plurality of electrical contact probes (20, 22, 24, 26, 28, 30, 32) for providing an electrical connection between terminals of an electronic package (1,1′) received in a seat (10d) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip (20m, 26m, 28m, 30m, 32m) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface (20t, 28t, 30t, 32t) for interengagement with a removable retainer member of the socket.

Abstract: A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.

Abstract: A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

Abstract: A double-ended, coaxial contact assembly has a center probe rod (12) mounted in the bore of a dielectric center spacer bushing (16) and mounts a probe contact assembly on each end of the center probe rod. The center probe rod is received in a ground sleeve (19) with the probe contact assemblies maintained in coaxial relationship with the ground sleeve by a dielectric outer spacer bushing (17). In certain embodiments a movable ground plunger (18g,22) is slidably received in each end of the ground sleeves and biased outwardly by respective ground plunger coil springs (25). In one such embodiment the center spacer bushing (16′) is provided with an axially extending sleeve disposed between the respective probe contact assembly and the ground sleeve.

Abstract: A coaxial contact assembly (100,100′,100″) is shown in which the outer cylindrical barrel (102,102′,102′″) is adapted to be fixedly mounted in a support and with a ground plunger (104,104″) telescopically and slidably received therein and with an interface ductor member (106,106″) in turn telescopically and slidably received within the bore of the ground plunger. The interface member is fixedly attached to and in electrical engagement with the braid layer of a coaxial cable (1) and is formed with a plurality of elongated, longitudinally extending fingers (106b) which extend radially outwardly a selected amount so that when received in the bore of the ground plunger they are biased into intimate electrical engagement therewith. An inverse electrical connection between the ductor member and the ground plunger is shown with fingers (104b′) of ground plunger (104′) biased into electrical engagement with a solid tubular inductor member (106b′).

Abstract: An electrical contact assembly (10) for use, for example, in interfacing between a circuit board or the like to be tested and test apparatus has first and second contact plungers (14,16) which are slidably mounted in an outer barrel (12) with respective contact projections (14c,16c) extending out opposite ends of the barrel. The first contact plunger (14) is hollow and slidably receives therein an elongated longitudinally extending portion (16a) of the second contact plunger (16), the contact plungers being biased apart by a coil spring (18) mounted between respective spring seats (14e,16g) of the contact plungers. Alternate embodiments (10',10") include a plurality of longitudinally extending fingers (14h,16h) formed in one of the plungers which form an interference fit with the other plunger.

Abstract: A coaxial contact assembly (10,10', 10") has a cylindrical ground plunger (30) which is fixedly attached to the ground conductor (1b) of a coaxial cable (1,1') through a ground sleeve (28) and mounted in a test head support (4) for sliding movement therein. An inner contact plunger barrel (18) is fixedly attached to the signal conductor (1a) of the coaxial cable either through a signal sleeve (16) for a replaceable inner contact assembly, or directly for a dedicated unit. An inner contact plunger (20) received in the plunger barrel has a contact portion (20c) biased outwardly to extend a selected amount beyond the ground plunger (30) in a given direction by a first spring member (24) while a second spring (36) biases the ground plunger outwardly in the given direction to a preset location.