Patents Assigned to SEEK THERMAL, INC.
  • Patent number: 9584750
    Abstract: An imaging system includes a shutter, an array of photodetectors, and electronic circuitry associated with the photodetectors to read intensity values from the photodetectors, the electronic circuitry including elements configured to provide an operating bias point of the photodetectors. The imaging system includes components, such as a controller, configured to adaptively adjust the operating bias for the photodetectors wherein the adjustment is based at least in part on intermittent measurement of a flat field image. During use, the imaging system can be configured to perform intermittent adjustments of the operating bias based on changes in photodetector values for intermittently acquired flat field images. Adjustment of the operating bias may provide compensation for drift over time of the photodetectors and/or electronics due to effects including but not limited to temperature changes.
    Type: Grant
    Filed: August 18, 2015
    Date of Patent: February 28, 2017
    Assignee: Seek Thermal, Inc.
    Inventors: Jason Wolfe, Willliam J. Parrish
  • Patent number: 9549130
    Abstract: In some embodiments, methods or systems may be provided for an imaging system including an imaging sensor, wherein frames or sub-frames of intensity data may be acquired from some or all pixels of the frame, and a moving kernel, smaller than the frame or sub-frame, is moved over the frame for analysis. The values of the center column of the kernel may be compared to the outer column values of the kernel and a column offset for the center column may be determined. Only one offset value may be stored at any one time for each pixel in the frame or sub-frame.
    Type: Grant
    Filed: May 1, 2015
    Date of Patent: January 17, 2017
    Assignee: Seek Thermal, Inc.
    Inventor: Jeffery Lee
  • Patent number: D757837
    Type: Grant
    Filed: January 14, 2015
    Date of Patent: May 31, 2016
    Assignee: SEEK THERMAL, INC.
    Inventor: Blake Henry