Patents Assigned to SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
  • Patent number: 11977191
    Abstract: Disclosed herein is a radiation detector comprising: an electronics layer comprising a first set of electric contacts and a second set of electric contacts; a radiation absorption layer configured to absorb radiation; a first set of electrodes and a second set of electrodes, wherein the first set of electrodes and the second set of electrodes are interdigitated and extend into the radiation absorption layer in a direction of thickness thereof; wherein the electronics layer and the radiation absorption layer are bonded such that the first set of electrodes are electrically connected to the first set of electric contacts and the second set of electrodes are electrically connected to the second set of electric contacts.
    Type: Grant
    Filed: June 24, 2022
    Date of Patent: May 7, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11946884
    Abstract: Disclosed herein is a method comprising: causing emission of characteristic X-rays of a first element attached to a first biological analyte; causing emission of characteristic X-rays of a second element attached to a second biological analyte; detecting a characteristic of the first biological analyte based on the characteristic X-rays of the first element and a characteristic of the second biological analyte based on the characteristic X-rays of the second element; wherein the first element and the second element are different; wherein the first biological analyte and the second biological analyte are in the same solution.
    Type: Grant
    Filed: January 10, 2022
    Date of Patent: April 2, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11944483
    Abstract: Disclosed herein is a method comprising: determining doses of radiation received by a first set of pixels of a radiation detector; determining that the doses satisfy a criterion; adjusting exposure of the radiation detector to the radiation in response to the doses satisfying the criterion; and forming an image based on radiation received by a second set of pixels of the radiation detector.
    Type: Grant
    Filed: February 18, 2021
    Date of Patent: April 2, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11948285
    Abstract: Disclosed herein is a method and a system for reconstructing a three-dimensional image of an object, based on stitched images of the object obtained using multiple beams.
    Type: Grant
    Filed: July 6, 2021
    Date of Patent: April 2, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11947059
    Abstract: An apparatus for detecting X-ray, comprising an X-ray absorption layer comprising an electrode, an electronics layer and a wall sealing a space among electrical connections between the X-ray absorption layer and the electronics layer. The electronics layer comprises: a first and second voltage comparators configured to compare a voltage of an electrode to a first and second thresholds respectively; a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer; and a controller configured to: start a time delay from a time at which an absolute value of the voltage equals or exceeds an absolute value of the first threshold; activate the second voltage comparator during the time delay; cause the number registered by the counter to increase by one, if, during the time delay, an absolute value of the voltage equals or exceeds an absolute value of the second threshold.
    Type: Grant
    Filed: April 28, 2023
    Date of Patent: April 2, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11941850
    Abstract: Disclosed herein is an image sensor with two radiation detectors, each having a planar surface for receiving radiation; and a calibration pattern. The planar surfaces of the radiation detectors are not coplanar. The image sensor can capture images of two portions of the calibration pattern, respectively using the radiation detectors. The image sensor can determine two transformations for the radiation detectors based on the images of the portions of the calibration pattern, respectively. The image sensor can capture images of two portions of a scene, respectively using the radiation detectors, determine projections of the images of the portions of the scene onto an image plane using the transformations, respectively, and form an image of the scene by stitching the projections.
    Type: Grant
    Filed: September 10, 2021
    Date of Patent: March 26, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Yurun Liu, Peiyan Cao
  • Patent number: 11918394
    Abstract: Disclosed herein is a detector, comprising: a radiation absorption layer comprising an electric contact; a filter electrically connected to the electric contact and configured to attenuate signals from the electric contact below a first cutoff frequency; an integrator electrically connected to the filter and configured to integrate signals from the filter over a period of time.
    Type: Grant
    Filed: December 21, 2020
    Date of Patent: March 5, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11921056
    Abstract: Disclosed herein is an apparatus comprising: a first radiation source configured to produce a first divergent beam of radiation toward an object; a second radiation source configured to produce a second divergent beam of radiation toward the object; and an image sensor. The image sensor, the first radiation source and the second radiation source are configured to rotate around the object, and relative positions among the image sensor, the first radiation source and the second radiation source are fixed during rotation around the object. The method of using the apparatus is also disclosed herein.
    Type: Grant
    Filed: December 22, 2020
    Date of Patent: March 5, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11906677
    Abstract: Disclosed herein is a method of recovering performance of a radiation detector, the radiation detector comprising: a radiation absorption layer configured to absorb radiation particles incident thereon and generate an electrical signal based on the radiation particles; an electronic system configured to process the electrical signal, the electronic system comprising a transistor, the transistor comprising a gate insulator with positive charge carriers accumulated therein due to exposure of the gate insulator to radiation; the method comprising: removing the positive charge carriers from the gate insulator by establishing an electric field across the gate insulator.
    Type: Grant
    Filed: March 2, 2022
    Date of Patent: February 20, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11906676
    Abstract: Disclosed herein is a radiation detector, comprising a first pixel; a first reflector; and a first scintillator, wherein the first reflector is configured to guide essentially all photons emitted by the first scintillator into the first pixel. The first reflector is configured to reflect photons emitted by the first scintillator toward the first reflector. The first scintillator is essentially completely enclosed by the first reflector and the first pixel.
    Type: Grant
    Filed: September 10, 2021
    Date of Patent: February 20, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11904187
    Abstract: Disclosed herein is a method comprising: generating multiple radiation beams respectively from multiple locations toward an object and an image sensor, wherein the image sensor comprises an array of multiple active areas, and gaps among the multiple active areas, and capturing multiple partial images of the object with the image sensor using respectively radiations of the multiple radiation beams that have passed through and interacted with the object, wherein each point of the object is captured in at least one partial image of the multiple partial images.
    Type: Grant
    Filed: July 6, 2021
    Date of Patent: February 20, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11901244
    Abstract: Disclosed herein is a method comprising: attaching a plurality of chips to a substrate, wherein each of the chips comprises only one pixel configured to detect radiation. Disclosed herein is a method comprising: attaching a wafer to a substrate, wherein the substrate comprises discrete electrodes, wherein the wafer comprises a radiation absorption layer and a plurality of electrical contacts, wherein each of the electrical contacts is connected to at least one of the discrete electrodes; identifying a defective area of the wafer; replacing a portion of the wafer with a chip configured to absorb radiation, the portion comprising the defective area.
    Type: Grant
    Filed: December 21, 2020
    Date of Patent: February 13, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11882378
    Abstract: Disclosed herein is a method, comprising sending radiation beam groups (i, j), i=1, . . . , M and j=1, . . . , Ni toward a same scene, wherein each radiation beam group comprises multiple parallel fan radiation beams sent simultaneously, wherein for each value of i, the radiation beam groups (i, j), j=1, . . . , Ni are parallel to each other and are sent one group at a time, and wherein no two radiation particle paths of two respective radiation beam groups with 2 different values of i are parallel to each other; for i=1, . . . , M and j=1, . . . , Ni, capturing with radiation of the radiation beam group (i, j) a partial image (i, j) of the scene; for each value of i, stitching the partial images (i, j), j=1, . . . , Ni; and reconstructing a 3-dimensional image of the scene from the stitched images (i), i=1, . . . , M.
    Type: Grant
    Filed: June 20, 2023
    Date of Patent: January 23, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Yurun Liu, Peiyan Cao
  • Patent number: 11860322
    Abstract: Disclosed herein is a radiation detector, comprising: an avalanche photodiode (APD) with a first side coupled to an electrode and configured to work in a linear mode; a capacitor module electrically connected to the electrode and comprising a capacitor, wherein the capacitor module is configured to collect charge carriers from the electrode onto the capacitor; a current sourcing module in parallel to the capacitor, the current sourcing module configured to compensate for a leakage current in the APD and comprising a current source and a modulator; wherein the current source is configured to output a first electrical current and a second electrical current; wherein the modulator is configured to control a ratio of a duration at which the current source outputs the first electrical current to a duration at which the current source outputs the second electrical current.
    Type: Grant
    Filed: November 7, 2022
    Date of Patent: January 2, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11852760
    Abstract: Disclosed herein is a method comprising: aligning a collimator and a plurality of radiation detectors of an image sensor by: moving the radiation detectors along a first direction; moving the collimator along a second direction perpendicular to the first direction; rotating the collimator about an axis perpendicular to the first direction and the second direction; wherein the plurality of radiation detectors are configured to capture images of portions of a scene at different image capturing positions, respectively, and to form an image of the scene by stitching the images of the portions.
    Type: Grant
    Filed: September 10, 2021
    Date of Patent: December 26, 2023
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11848347
    Abstract: Disclosed herein is an image sensor and a method of making the image sensor. The image sensor may comprise one or more packages of semiconductor radiation detectors. Each of the one or more packages may comprise a radiation detector that comprises a radiation absorption layer on a first strip of semiconductor wafer and an electronics layer on a second strip of semiconductor wafer. The radiation absorption layer may be continuous along the first strip of semiconductor wafer with no coverage gap. The first strip and the second strip may be longitudinally aligned and bonded together. The radiation detector may be mounted on a printed circuit board (PCB) and electrically connected to the PCB close to an edge of the radiation detector.
    Type: Grant
    Filed: December 10, 2019
    Date of Patent: December 19, 2023
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Chongshen Song, Yurun Liu
  • Patent number: 11837624
    Abstract: Disclosed herein are a radiation detector and a method of making it. The radiation detector is configured to absorb radiation particles incident on a semiconductor single crystal of the radiation detector and to generate charge carriers. The semiconductor single crystal may be a CdZnTe single crystal or a CdTe single crystal. The method may comprise forming a recess into a substrate of semiconductor; forming a semiconductor single crystal in the recess; and forming a heavily doped semiconductor region in the substrate. The semiconductor single crystal has a different composition from the substrate. The heavily doped region is in electrical contact with the semiconductor single crystal and embedded in a portion of intrinsic semiconductor of the substrate.
    Type: Grant
    Filed: March 28, 2022
    Date of Patent: December 5, 2023
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11826192
    Abstract: Disclosed herein is an apparatus, comprising: a platform configured to support a human body on a first surface of the platform; a first set of radiation detectors arranged in a first layer, wherein the radiation detectors of the first set are attached to a second surface of the platform opposite the first surface; wherein the radiation detectors of the first set are configured to detect radiation from a radiation source inside the human body.
    Type: Grant
    Filed: February 16, 2021
    Date of Patent: November 28, 2023
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: D1021093
    Type: Grant
    Filed: March 4, 2022
    Date of Patent: April 2, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Lele Wang, Shuai Zhang
  • Patent number: D1021094
    Type: Grant
    Filed: May 26, 2022
    Date of Patent: April 2, 2024
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventor: Guanghui Zhang