Patents Assigned to Simd Solutions, Inc.
  • Star-I: scalable tester architecture with I-cached SIMD technology
    Patent number: 6018814
    Abstract: A semiconductor tester high-speed system with Single Instruction-stream Multiple Data-stream (SIMD) organization, incorporating an event generator array, a plurality of pin channels for connecting to a device under test (DUT), a reconfigurable allocation switch for assignment of event generators to individual DUT pin channel connections, multi-clocking, and SIMD instruction cache. The result is a tester digital system exhibiting a maximum ratio of performance to hardware cost.
    Type: Grant
    Filed: June 1, 1999
    Date of Patent: January 25, 2000
    Assignee: SIMD Solutions, Inc.
    Inventor: Todd E. Rockoff
  • STAR-I: scalable tester architecture with I-cached SIMD technology
    Patent number: 5978942
    Abstract: A semiconductor tester high-speed system with Single Instruction-stream Multiple Data-stream (SIMD) organization, incorporating an event generator array, a plurality of pin channels for connecting to a device under test (DUT), a reconfigurable allocation switch for assignment of event generators to individual DUT pin channel connections, multi-clocking, and SIMD instruction cache. The result is a tester digital system exhibiting a maximum ratio of performance to hardware cost.
    Type: Grant
    Filed: March 26, 1997
    Date of Patent: November 2, 1999
    Assignee: Simd Solutions, Inc.
    Inventor: Todd E. Rockoff