Abstract: An electron imaging apparatus 100 is disclosed, which is configured for an electron transfer along an electron-optical axis OA of an electron 2 emitting sample 1 to an energy analyzer apparatus 200, and comprises a sample-side first lens group 10, an analyzer-side second lens group 30 and a deflector device 20, configured to deflect the electrons 2 in an exit plane of the electron imaging apparatus 100 in a deflection direction perpendicular to the electron-optical axis OA. An electron spectrometer apparatus, an electron transfer method and an electron spectrometry method are also described.

Abstract: The invention relates to a spin detector arrangement for detecting vector components of a predominating spin vector in a particle beam (T) having a predominating spin orientation of the particles. The spin detector arrangement comprises: a spin rotator (1) having a switchable coil (5), wherein the switchable coil (5) comprises an axial direction and is aligned such that the particle beam (T) passes through the switchable coil (5) along the axial direction; a deflection device (7) connected downstream of the spin rotator (1) and deflecting the path of the particle beam (T) electrostatically by a deflection angle; a spin detector (9) connected downstream of the deflection device (7), allowing the deflection of the vector component of the spin vector predominating in the particle beam (T) perpendicular to the direction of motion of the particle beam (T); and a switching unit (15) connected to the switchable coil (5), allowing switching of the excitation state of the coil (5).

Abstract: A mount for a scanning probe sensor package (27) comprises a support structure (1, 5) defining a plane within the mount and at least one movable snap joint element (9) designed for interacting with a respective counterpart (43) in a scanning probe sensor package (27). The snap joint element (9) is movable to a first position in which it exerts a force on a mounted scanning probe sensor package (27) so as to force said scanning probe sensor package (27) in a normal direction of said plane towards the support structure (1,5) and to a second position in which it allows a scanning probe sensor package (27) to be mounted to or dismounted from the support structure (1, 5) along normal direction of said plane.

Abstract: A metal tip (1) for scanning probe applications is provided. The tip (1) has an axial extension (I), a radial extension (d), a pointy section (B) that extends axially from a section of maximum radial extension (5) to an atomically sharp end (9), and a blunt section (A) that extends axially from the section of maximum radial extension (5) to a blunt end (7), where the axial extension of the pointy section (B) is larger than the axial extension of the blunt section (A) The metal tip (1) has a mass of 10 ?g or less.

Abstract: The invention relates to a spin detector arrangement for detecting vector components of a predominating spin vector in a particle beam (T) having a predominating spin orientation of the particles. The spin detector arrangement comprises a spin rotator (1) having a switchable coil (5), wherein the switchable coil (5) comprises an axial direction and is aligned such that the particle beam (T) passes through the switchable coil (5) along the axial direction; a deflection device (7) connected downstream of the spin rotator (1) and deflecting the path of the particle beam (T) electrostatically by a deflection angle; a spin detector (9) connected downstream of the deflection device (7), allowing the deflection of the vector component of the spin vector predominating in the particle beam (T) perpendicular to the direction of motion of the particle beam (T); and a switching unit (15) connected to the switchable coil (5), allowing switching of the excitation state of the coil (5).

Abstract: A mount for a scanning probe sensor package (27) comprises a support structure (1, 5) defining a plane within the mount and at least one movable snap joint element (9) designed for interacting with a respective counterpart (43) in a scanning probe sensor package (27). The snap joint element (9) is movable to a first position in which it exerts a force on a mounted scanning probe sensor package (27) so as to force said scanning probe sensor package (27) in a normal direction of said plane towards the support structure (1,5) and to a second position in which it allows a scanning probe sensor package (27) to be mounted to or dismounted from the support structure (1, 5) along normal direction of said plane.

Abstract: A metal tip (1) for scanning probe applications is provided. The tip (1) has an axial extension (I), a radial extension (d), a pointy section (B) that extends axially from a section of maximum radial extension (5) to an atomically sharp end (9), and a blunt section (A) that extends axially from the section of maximum radial extension (5) to a blunt end (7), where the axial extension of the pointy section (B) is larger than the axial extension of the blunt section (A) The metal tip (1) has a mass of 10 ?g or less.