Patents Assigned to Spectramet, LLC
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Patent number: 8861675Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: February 15, 2012Date of Patent: October 14, 2014Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 8855809Abstract: Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials.Type: GrantFiled: August 31, 2012Date of Patent: October 7, 2014Assignee: Spectramet, LLCInventors: David B. Spencer, Jeffrey J. Webster, Aldo M. Reti, Edward J. Sommer, Jr., Richard E. Hill, R. Lynn Conley
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Patent number: 8476545Abstract: A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or to more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.Type: GrantFiled: June 29, 2010Date of Patent: July 2, 2013Assignee: Spectramet, LLCInventors: Edward J. Sommer, David B. Spencer, R. Lynn Conley, Richard E. Hill, Robert H. Parrish, Charles E. Roos
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Publication number: 20130079918Abstract: Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials.Type: ApplicationFiled: August 31, 2012Publication date: March 28, 2013Applicant: Spectramet, LLCInventors: David B. Spencer, Jeffrey J. Webster, Aldo M. Reti, Edward J. Sommer, JR., Richard E. Hill, R. Lynn Conley
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Publication number: 20120148018Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: ApplicationFiled: February 15, 2012Publication date: June 14, 2012Applicant: SPECTRAMET, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 8144831Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: December 3, 2010Date of Patent: March 27, 2012Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 7978814Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: GrantFiled: October 26, 2009Date of Patent: July 12, 2011Assignee: Spectramet, LLCInventors: Edward J. Sommer, Robert H. Parrish, David B. Spencer, Charles E. Roos
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Publication number: 20110116596Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: ApplicationFiled: December 3, 2010Publication date: May 19, 2011Applicant: SPECTRAMET, LLCInventors: Edward J. Sommer, JR., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 7848484Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: June 29, 2009Date of Patent: December 7, 2010Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Publication number: 20100264070Abstract: A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or to more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.Type: ApplicationFiled: June 29, 2010Publication date: October 21, 2010Applicant: SPECTRAMET, LLCInventors: Edward J. Sommer, JR., David B. Spencer, R. Lynn Conley, Richard E. Hill, Robert H. Parrish, Charles E. Roos
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Patent number: 7763820Abstract: A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.Type: GrantFiled: November 27, 2007Date of Patent: July 27, 2010Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., David B. Spencer, R. Lynn Conley, Richard E. Hill, Robert H. Parrish, Charles E. Roos
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Publication number: 20100111252Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: ApplicationFiled: October 26, 2009Publication date: May 6, 2010Applicant: Spectramet, LLCInventors: Edward J. Sommer, JR., Robert H. Parrish, David B. Spencer, Charles E. Roos
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Patent number: 7616733Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: GrantFiled: June 13, 2008Date of Patent: November 10, 2009Assignee: Spectramet, LLCInventors: Edward J. Sommer, Robert H. Parrish, David B. Spencer, Charles E. Roos
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Publication number: 20090261024Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: ApplicationFiled: June 29, 2009Publication date: October 22, 2009Applicant: SPECTRAMET, LLCInventors: Edward J. Sommer, JR., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Patent number: 7564943Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: August 3, 2006Date of Patent: July 21, 2009Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Charles E. Roos, David B. Spencer, R. Lynn Conley
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Publication number: 20080279329Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: ApplicationFiled: June 13, 2008Publication date: November 13, 2008Applicant: Spectramet, LLCInventors: Edward J. Sommer, JR., Robert H. Parrish, David B. Spencer, Charles E. Roos
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Publication number: 20060239401Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: ApplicationFiled: February 17, 2006Publication date: October 26, 2006Applicant: Spectramet, LLCInventors: Edward Sommer, Robert Parrish, David Spencer, Charles Roos
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Patent number: 7099433Abstract: Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.Type: GrantFiled: March 1, 2005Date of Patent: August 29, 2006Assignee: Spectramet, LLCInventors: Edward J. Sommer, Charles E. Roos, David B. Spencer
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Patent number: 6888917Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: GrantFiled: February 11, 2003Date of Patent: May 3, 2005Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Robert H. Parrish, David B. Spencer, Charles E. Roos
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Patent number: 6519315Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.Type: GrantFiled: April 6, 2001Date of Patent: February 11, 2003Assignee: Spectramet, LLCInventors: Edward J. Sommer, Jr., Robert H. Parrish, David B. Spencer, Charles E. Roos