Abstract: An electronic device includes a first circuit to generate an output control signal when a first voltage across a first capacitor receiving an input current exceeds a threshold voltage, in response to an input signal having a first logic level. The input current is proportional to a frequency of the input signal. A second circuit is to generate an output reset signal when a second voltage across a second capacitor receiving the input current exceeds the threshold voltage, in response to the input signal having a second logic level. A flip flop is to generate a signal output as having the first logic level in response to the output control signal, and to reset and generate the signal output as having the second logic level in response to the output reset signal.

Abstract: A digital circuit can be used in a speaker system. An intermediate node provides a speaker protection control signal. A first latch for receives an offset control signal. A first logic gate receives a play control signal, the offset control signal, and the speaker protection control signal. A second logic gate is coupled to the first latch for receiving the play control signal and the speaker protection control signal. A second latch is coupled to the first logic gate for providing a forced mute signal. A third latch is coupled to the second logic gate and to the intermediate node.

Abstract: An electronic device includes a first circuit to generate an output control signal when a first voltage across a first capacitor receiving an input current exceeds a threshold voltage, in response to an input signal having a first logic level. The input current is proportional to a frequency of the input signal. A second circuit is to generate an output reset signal when a second voltage across a second capacitor receiving the input current exceeds the threshold voltage, in response to the input signal having a second logic level. A flip flop is to generate a signal output as having the first logic level in response to the output control signal, and to reset and generate the signal output as having the second logic level in response to the output reset signal.

Abstract: Limiting clipping in an amplifier is accomplished in the feedback loop of a class D PWM amplifier that includes an integrator coupled to an input node and configured to generate an integrated input signal such that a comparator may then generate a PWM signal for driving an amplifier output stage based on a comparison to a triangle wave signal. To this end, the amplifier also includes a threshold signal generator for generating high and low voltage thresholds based on the triangle wave signal to be used to engage compensation circuits for limiting the overall amplification. Such compensation circuits may be bipolar junction transistors that are disposed in the feedback loop of the integrator. Thus, the overall bandwidth of the amplifier itself is not affected by adding a limiter circuit aimed at reducing clipping.

Abstract: A voltage regulator includes a feedback regulation loop and a drive transistor configured to source current to a regulated output. A transient recovery circuit is coupled to the voltage regulator circuit and includes a first transistor coupled to source current into a control terminal of the drive transistor, wherein the source current is in addition to current sourced in response to operation of the feedback regulation loop. The first transistor is selectively actuated in response to a drop in voltage at the regulated output. The transient recovery circuit further includes a second transistor coupled to sink current from the regulated output. The sink current has a first non-zero magnitude in the quiescent operating mode of the regulator circuit. In response to an increase in voltage at the regulated output, the operation of the second transistor is modified to increase the sink current to a second, greater, non-zero magnitude.

Abstract: An electronic device disclosed herein includes a current comparator to generate an output current based upon a difference between a current flowing in an output branch and a current flowing in an input branch. A pair of transistors is coupled to an output of the current comparator. A first amplifier has inputs coupled to the pair of transistors and to a reference voltage, the first amplifier being configured to subtract the reference voltage from a voltage across the pair of transistors and output a difference voltage. A second amplifier has inputs coupled to the difference voltage and to the reference voltage, the second amplifier being configured to subtract the difference voltage from the reference voltage and output a pulse skipping mode reference signal.

Abstract: A class-D amplifier includes a signal processing block. The signal processing block generates a first processed signal representing a difference between a first differential signal and a second differential signal, when a duty cycle of the first differential signal is greater than that of the second differential signal. The signal processing block generates the first processed signal representing a reference DC level, when the duty cycle of the first differential signal is less than that of the second differential signal. A second processed signal representing a difference between the second differential signal and the first differential signal is generated when the duty cycle of the second differential signal is greater than that of the first differential signal, and the second processed signal representing the reference DC level is generated when the duty cycle of the second differential signal is less than that of the first differential signal.

Abstract: A generator circuit is coupled to apply a control signal to the gate terminal of a power transistor driving an output node. A reference voltage is generated having a first voltage value as the reference for the control signal and having a second, higher, voltage value for use in stress testing. A clamping circuit is provided between the reference voltage and the power transistor gate to function in two modes. In one mode, the clamping circuit applies a first clamp voltage to clamp the voltage at the gate of the power transistor when the generator circuit is applying the control signal. In another mode, the clamping circuit applies a second, higher, clamp voltage to clamp the gate of the power transistor during gate stress testing.

Abstract: Described herein is an electronic device. The electronic device includes a unity gain buffer having an input coupled to an input node to receive an input voltage and an output coupled to an output node. A current sink circuit operates in a sleep mode in an absence of a sink current flowing into the output node, and operates in a sinking mode to sink the sink current from the output node to a reference supply node when the sink current flows into the output node.

Abstract: An electronic device may include leads, an IC having first and second bond pads, and an encapsulation material adjacent the leads and the IC so the leads extend to a bottom surface of the encapsulation material defining first contact pads. The electronic device may include bond wires between the first bond pads and corresponding ones of the leads, and conductors extending from corresponding ones of the second bond pads to the bottom surface of the encapsulation material defining second contact pads.

Abstract: A first softstart signal indicates operation in a load phase for a boost rectifier and a second softstart signal indicates operation in a pulse drive phase which follows the load phase. A rectification transistor is actuated for the duration of the load phase in response to the first softstart circuit to generate a rising output voltage. The rectification transistor is further repeatedly actuated during the pulse drive phase in response to the second softstart circuit to generate a boosted output voltage. A first transistor coupled between a first conduction terminal and a body terminal of the rectification transistor is actuated, and a second transistor coupled between the body terminal and a second conduction terminal of the rectification transistor is deactuated, during the load phase. The first transistor is deactuated, and the second transistor is actuated, during the pulse drive phase.

Abstract: A power amplifier includes a clamping circuit configured to provide a clamped voltage from a power supply; an amplifier pair having first inputs coupled to the clamping circuit, second inputs and an output for providing an amplified signal; and a biasing circuit coupled between the clamping circuit and the second inputs. The biasing circuit is configured to adjust input bias voltages of the amplifier pair such that the output of the amplifier pair varies proportionally to a change of the power supply.

Abstract: A failure diagnosis circuit includes a multiplexer and a controller. The multiplexer receives address signals, and selectively outputs one of the address signals to an addressable module in response to a selecting signal. The controller generates a first one of address signals and the selecting signal. A built-in self-test circuit generates the second address signal. The addressable module includes addressable components responsive to the address signal. The controller processes the output of the addressable module responsive to the address signal to make a failure diagnosis. The built-in self-test circuit performs signature analysis on the read out output of the addressable module.

Abstract: A voltage regulator includes a feedback regulation loop and a drive transistor configured to source current to a regulated output. A transient recovery circuit is coupled to the voltage regulator circuit and includes a first transistor coupled to source current into a control terminal of the drive transistor, wherein the source current is in addition to current sourced in response to operation of the feedback regulation loop. The first transistor is selectively actuated in response to a drop in voltage at the regulated output. The transient recovery circuit further includes a second transistor coupled to sink current from the regulated output. The sink current has a first non-zero magnitude in the quiescent operating mode of the regulator circuit. In response to an increase in voltage at the regulated output, the operation of the second transistor is modified to increase the sink current to a second, greater, non-zero magnitude.

Abstract: A reference current path carries a reference current. A first transistor is coupled to the reference current path. A second transistor is also coupled to the reference current path. The first and second transistors are connected in parallel to carry the reference current. The first transistor is biased by a first voltage (which is a bandgap voltage plus a threshold voltage). The second transistor is biased by a second voltage (which is a PTAT voltage plus a threshold voltage). The first and second transistors are thus biased by voltages having different and opposite temperature coefficients with a result that the temperature coefficients of the currents flowing in the first and second transistors are opposite and the reference current accordingly has a low temperature coefficient.

Abstract: An electronic device may include a switching converter configured to convert an input voltage to an output voltage, and being selectively operable in a pulse skipping mode based upon a control signal. The switching converter may include a comparator having a first input configured to receive an error signal, a second input configured to receive a skipping mode reference signal, and an output configured to generate the control signal. A reference generator may be configured to generate the skipping mode reference signal as a function of a difference between the output voltage and the input voltage.

Abstract: An image sensor device may include an interconnect layer, an image sensor IC adjacent the interconnect layer and having an image sensing surface, and a dielectric layer adjacent the image sensor IC and having an opening therein aligned with the image sensing surface. The image sensor device may also include an IR filter adjacent and aligned with the image sensing surface, and an encapsulation material adjacent the dielectric layer and laterally surrounding the IR filter.

Abstract: A generator circuit is coupled to apply a control signal to the gate terminal of a power transistor driving an output node. A reference voltage is generated having a first voltage value as the reference for the control signal and having a second, higher, voltage value for use in stress testing. A clamping circuit is provided between the reference voltage and the power transistor gate to function in two modes. In one mode, the clamping circuit applies a first clamp voltage to clamp the voltage at the gate of the power transistor when the generator circuit is applying the control signal. In another mode, the clamping circuit applies a second, higher, clamp voltage to clamp the gate of the power transistor during gate stress testing.

Abstract: A method of operating a speaker system including a speaker coupled to an amplifier, and a dedicated digital speaker protection circuit includes turning on the amplifier in a mute mode, after a first delay period, issuing a play command to the amplifier to place the amplifier in a play mode, but without an input signal during a second delay period, and performing a speaker offset detection during the second delay period, wherein, if there is an offset, then the amplifier is forced back into the mute mode, and if there is no offset, then the amplifier is allowed to continue to operate in the play mode. The method also includes issuing a speaker protection control signal or command if an offset is detected.

Abstract: A low dropout amplifier may include an error amplifier having first and second inputs coupled to a reference signal and a feedback signal, respectively. The error amplifier may be configured to generate first and second error signals at first and second outputs, respectively, with the first and second error signals based upon a difference between the reference signal and the feedback signal. A sink stage may be coupled to the first output and configured to generate a sink current based upon the first error signal. A source stage may be coupled to the second output and configured to generate a source current based upon the second error signal. An output node may be coupled to receive the sink and source currents.