Abstract: A method for controlling a laser profiler, the laser profiler being configured for generating a laser line on a surface to be inspected, the method comprising: receiving an image of the laser line; determining an actual intensity of the laser line; calculating an amplification factor for the laser line based on the actual intensity of the laser line, a target intensity for the laser line, a power of the laser, a camera gain of the camera and an exposure time of the laser line on the surface to be inspected, the amplification factor allowing the actual intensity of the laser line to reach the target intensity while minimizing the power of the laser; and based on the calculated amplification factor, adjusting at least one parameter of the laser profiler so that the actual intensity of the laser line corresponds to the target intensity.

Abstract: A method for controlling a laser profiler, the laser profiler being configured for generating a laser line on a surface to be inspected, the method comprising: receiving an image of the laser line; determining an actual intensity of the laser line; calculating an amplification factor for the laser line based on the actual intensity of the laser line, a target intensity for the laser line, a power of the laser, a camera gain of the camera and an exposure time of the laser line on the surface to be inspected, the amplification factor allowing the actual intensity of the laser line to reach the target intensity while minimizing the power of the laser; and based on the calculated amplification factor, adjusting at least one parameter of the laser profiler so that the actual intensity of the laser line corresponds to the target intensity.

Abstract: Measuring a distance to a surface while compensating for variations in a transverse position and/or low speed displacement of the instrument. One method includes retrieving a predetermined transversal distance from a longitudinal feature at which to extract a relevant distance; retrieving a distance set; retrieving a position of the longitudinal feature relative to the distance set; extracting a range point at the predetermined transversal distance from the longitudinal feature; adding the extracted point to a longitudinal distance set. In another method, if two sensors are provided with an overlap in the transversal direction, extracting a range point at a predetermined transversal position; adding the extracted range point to a longitudinal distance set; retrieving a pitch angle of the instrument; calculating a local slope of the surface using an overlapping transversal point, the pitch angle and the separation length; calculating a height variation using the local slope and a longitudinal separation.

Abstract: Measuring a distance to a surface while compensating for variations in a transverse position and/or low speed displacement of the instrument. One method includes retrieving a predetermined transversal distance from a longitudinal feature at which to extract a relevant distance; retrieving a distance set; retrieving a position of the longitudinal feature relative to the distance set; extracting a range point at the predetermined transversal distance from the longitudinal feature; adding the extracted point to a longitudinal distance set. In another method, if two sensors are provided with an overlap in the transversal direction, extracting a range point at a predetermined transversal position; adding the extracted range point to a longitudinal distance set; retrieving a pitch angle of the instrument; calculating a local slope of the surface using an overlapping transversal point, the pitch angle and the separation length; calculating a height variation using the local slope and a longitudinal separation.