Patents Assigned to Tau-Tron, Inc.
  • Controlled phase off-set digital test system
    Patent number: 4495468
    Abstract: In the testing of a digital test system (e.g. the automatic testing of a digital integrated semiconductor circuit) it is necessary to provide a plurality of clock signals (periodic pulse signals), each with a definite phase relationship to a particular clock signal called the "reference". For example, when the clock signals are all in the same phase they define a common wavefront without skew.
    Type: Grant
    Filed: January 2, 1981
    Date of Patent: January 22, 1985
    Assignee: Tau-Tron, Inc.
    Inventors: Edward W. Richards, Paul T. Chang