Abstract: An example test system includes packs. The packs include test sockets for testing devices under test (DUTs) and at least some test electronics for performing tests on the DUTs in the test sockets. Different packs are configured to have different configurations. The different configurations include at least different numbers of test sockets arranged at different pitches.

Abstract: Example techniques may be implemented as a method, a system or more non-transitory machine-readable media storing instructions that are executable by one or more processing devices, Operations performed by the example techniques include obtaining data representing results of tests executed by one or more test instruments on an initial set of devices under test (DUTs) in a test system; and using the data to train a machine learning model. The machine learning model is for predicting which of the tests will produce failing results for a different set of DUTs. DUTs in the different set have one or more features in common with DUTs in the initial set.

Abstract: An example test system includes test sites comprising test sockets for testing devices under test (DUTs) and pickers for picking DUTs from the test sockets or placing the DUTs into the test sockets. Each picker may include a picker head for holding a DUT. The test system also includes a gantry on which the pickers are mounted. The gantry may be configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the test sockets or placing the DUTs into the test sockets. The test sockets are arranged in at least one array that is accessible to the pickers on the gantry.

Abstract: An example system includes a first circuit board having first conductive traces, where a first conductive trace is for conducting an alternating current (AC) digital signal having an edge; a second circuit board having second conductive traces, where a second conductive trace is within a predefined distance of the first conductive trace to produce a contactless coupling with the first conductive trace, and where the contactless coupling enables electrical energy on the first conductive trace to manifest on the second conductive trace as a transient response that is based on the edge; and circuitry to reconstruct the edge based on the transient response from the second conductive trace.

Abstract: An example test system includes test sites that include sockets for testing devices under test (DUTs), pickers for picking DUTs from the sockets or placing the DUTs in the sockets, and a gantry on which the pickers are mounted. The gantry is configured to move the pickers relative to the test sites to position the pickers for picking the DUTs from the sockets or placing the DUTs into the sockets. The test system also includes one or more LASER range finders mounted on the gantry for movement over the DUTs in the sockets and in conjunction with movement of the pickers. A LASER range finder among the one or more LASER rangefinders mounted on the gantry is configured to detect a distance to a DUT placed into a socket.

Abstract: An interposer for a test system includes coaxial cables, each of which is configured to transport a first portion of current originating from a current source, and printed circuit boards (PCBs), each of which is connected to a set of the coaxial cables in order to receive the first portion of the current from each coaxial cable in the set and to transport a second portion of the current. A spring leaf assembly includes spring leaves, each of which is connected to a PCB in order to transport a third portion of the current obtained from the PCB to a device interface board (DIB) that connects to devices under test (DUTs) to be tested by the test system. The coaxial cables on each PCB are arranged in parallel, the PCBs are arranged in parallel, and the spring leaves on each PCB are arranged in parallel.

Abstract: An example contact head includes coaxial contacts configured for transmission of radio frequency (RF) signals or digital signals between a test system and a device under test (DUT). Each of the coaxial contacts is configured to target a specific impedance. Each of the coaxial contacts includes a coaxial structure having an open-curve shape. The coaxial structure includes a spring material that bends in response to applied force and that returns to the open-curve shape absent the applied force. The coaxial structure includes a center conductor terminating in a contact pin and a return conductor separated by a dielectric from the center conductor. At least part of the center conductor and the return conductor include an electrically-conductive material. Flexible contacts on the coaxial contact include the electrically-conductive material.

Abstract: Aspects of the present disclosure are directed to a circuit and methods of operating the same to provide an off-state circuit path with a programmable impedance in combination with a negative gate-to-source voltage Vgs for power transistors in an inverter configuration to prevent gate voltage glitches. Gate voltage glitch may occur due to Miller current generation across the gate path of a power transistor in the off state during rapid voltage transient dV/dt when the other, complementary power transistor is switched on or off. According to one aspect, using a negative gate-to-source voltage to turn-off a power transistor may mitigate gate voltage spikes caused by a large voltage transient when the complimentary power transistor is turned on, thus preventing parasitic turn-on of the power transistor.

Abstract: An example test system includes a test socket for testing a DUT, a lid for the test socket, and an actuator configured to force the lid onto the test socket and to remove the lid from the test socket. The actuator includes an upper arm to move the lid, an attachment mechanism connected to the upper arm to contact the lid, where the attachment mechanism is configured to allow the lid to float relative to the test socket to enable alignment between the lid and the test socket, and a lower arm to anchor the actuator to a board containing the test socket. The actuator is configured to move the upper arm linearly towards and away from the test socket and to rotate the upper arm towards and away from the test socket.

Abstract: An example test system includes test sites for testing devices under test (DUTs), where the test sites include a test site configured to hold a DUT for testing. The test system includes a thermal control system to control a temperature of the DUT separately from control over temperatures of other DUTs in other test sites. The thermal control system includes a thermoelectric cooler (TEC) and a structure that is thermally conductive. The TEC is in thermal communication with the DUT to control the temperature of the DUT by transferring heat between the DUT and the structure.

Abstract: A method and system for programming picking and placing of a workpiece is provided. Embodiments may include associating a workpiece with an end effector that is attached to a robot and scanning the workpiece while the workpiece is associated with the end effector. Embodiments may also include determining a pose of the workpiece relative to the robot, based upon, at least in part, the scanning.

Abstract: An example polarity inverter includes multiple contactors, each of which includes switches that are controllable to configure a current path. Each of the multiple contactors includes contacts, which are interleaved such that first contacts to receive voltage having a first polarity alternate with second contacts to receive voltage having a second polarity, where the first polarity and the second polarity are different. The polarity inverter also includes a first conductive plate to connect electrically to each of the first contacts, and a second conductive plate to connect electrically to each of the second contacts. The first conductive plate and the second conductive plate are in parallel. A dielectric material is between the first conductive plate and the second conductive plate.

Abstract: An example test system includes a test head, and a device interface board (DIB) configured to connect to the test head. The DIB is for holding devices under test (DUTs). The DIB includes electrical conductors for transmitting electrical signals between the DUTs and the test head. Servers are programmed to function as test instruments. The servers are external to, and remote from, the test head and are configured to communicate signals over fiber optic cables with the test head. The signals include serial signals.

Abstract: A method and computing system comprising identifying one or more candidate objects for selection by a robot. A path to the one or more candidate objects may be determined based upon, at least in part, a robotic environment and at least one robotic constraint. A feasibility of grasping a first candidate object of the one or more candidate objects may be validated. If the feasibility is validated, the robot may be controlled to physically select the first candidate object. If the feasibility is not validated, at least one of a different grasping point of the first candidate object, a second path, or a second candidate object may be selected.

Abstract: Circuitry and methods of operating the same to strobe a DQ signal with a gated DQS signal are described. Some aspects are directed to a gating scheme to selectively pass a received strobe signal such as a DQS strobe signal based on a state of a drive enable (DE) signal in a drive circuit in the ATE, such that edges generated by the drive circuit are prevented from mistakenly strobing a received data signal such as a DQ signal.

Abstract: An example test head manipulator includes a tower having a base and a track, where the track is vertical relative to the base, and arms to enable support for the test head. The arms are connected to the track to move the test head vertically relative to the tower, and the arms are configured to control rotation of the test head. Each of the arms includes a cam that is rotatable, and at least one plunger in contact with the cam and that is configured to contact the test head. Rotation of the cam is controllable to move the at least one plunger to offset an uncontrolled rotation the test head.

Abstract: A method and computing system comprising identifying a plurality of robot configurations for each inspection point of a plurality of inspection points of a problem. A graph may be generated with each feasible robot configuration as a node on the graph. A distance may be calculated between a pair of feasible robot configurations. A shortest complete path connecting each node on the graph may be obtained based upon, at least in part, the distance between the pair of feasible robot configurations.

Abstract: An automated mobile vehicle (AMV) including a frame forming a pallet bed for a pallet, and having an automated mobile robot bus, separate and distinct from the pallet bed, a drive section coupled to the frame to provide automated vehicle mobility, and a controller operably coupled to the drive section to effect automated vehicle mobility, wherein, the robot bus has a bus interface for docking independent automated mobile robots (AMR) to the frame so that the AMR is carried by the frame, wherein the AMR has independent automated mobility so that undocked from the frame, the AMR is free to roam independent from the AMV, and wherein the AMR is fungible for docking with the frame from a number different AMRs, to effect a predetermined material handling characteristic, and wherein the controller is coupled to the AMR to manage control of the predetermined material handling characteristic with the AMR undocked from the frame and moving as a unit apart from the frame.

Abstract: An example includes the following operations: identifying parameters associated with a test program, where the parameters are based on at least one of a device under test (DUT) to be tested by the test program or a type of test to be performed on the DUT by the test program; assigning weights to the parameters; generating a numerical value for the test program based on the parameters, the weights, and equations that are based on the parameters and the weights, where the numerical value is indicative of a complexity of the test program; and using the numerical value to obtain information about effort needed to develop future test programs.

Abstract: Example automatic test equipment (ATE) includes a first test instrument to receive a waveform from a device under test, where the waveform is based on test signals sent from the ATE to the DUT; circuitry to generate digital pulses based on the waveform; and a second test instrument to receive the digital pulses over at least two digital pins and to process the digital pulses to test the DUT.