Patents Assigned to Tesa Metrology Limited
  • Patent number: 5296914
    Abstract: The disclosure relates to an electro-optical measurement apparatus comprising, a measurement station, a light source on one side of the measurement station and means to direct a beam of collimated light from the light source along an optical path through the measurement station. Photo-detector arrays are disposed in the optical path from the measurement station, and an object to be measured is located at the measurement station in said optical path to block part of the light beam from the light source leaving transmitted portions of the beam to reach and activate corresponding sections of said arrays. Dimension of the part of the object in the optical path are derived from the resulting activation of the array means.
    Type: Grant
    Filed: April 2, 1992
    Date of Patent: March 22, 1994
    Assignee: Tesa Metrology Limited
    Inventor: Philip J. E. Aldred
  • Patent number: 4753532
    Abstract: The disclosure relates to an apparatus for determining the dimensions of an object at linearly spaced locations on the object comprising, a measurement station in which a linear measurement between opposing edges of the object may be made, means to move the object through the measuring station with the dimensions to be measured extending transversely to said path, a light source on one side of the measurement station to direct a beam of light through the measurement station transversely to the path of movement of the object to span the dimension of the object to be measured. Two elongate photo-electric array means one arranged on the opposite side of the object to receive images of the respective edges of the object to produce signals from which the dimension between said edges may be calculated and two lens means are provided to focus images of opposing edges of the object illuminated by the light source on to said two photo-electric array means respectively.
    Type: Grant
    Filed: September 12, 1986
    Date of Patent: June 28, 1988
    Assignee: Tesa Metrology Limited
    Inventor: Philip J. E. Aldred
  • Patent number: 4747689
    Abstract: An optical measurement apparatus for determining a plurality of dimensions of an object at linearly spaced locations on the object, in which the object is moved through a measurement station for measurement of a linear dimension of the object, to present the locations to be measured one by one. A light source on one side of the measurement station directs a beam of light at the location of the object in the measuring station transversely to the required line of measurement and to the path of movement of the object through the station. An elongate photo-electric array is disposed on the opposite side of the measurement station to the light source. A lens system focuses an image of the part of the object to be measured on the photo-electric array to form an image thereon. An elongate measurement graticule is provided on which a scale is delineated.
    Type: Grant
    Filed: September 12, 1986
    Date of Patent: May 31, 1988
    Assignee: Tesa Metrology Limited
    Inventor: Philip J. E. Aldred