Patents Assigned to Thermal Wave Imaging, Inc.
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Patent number: 11474059Abstract: A method for performing non-destructive testing using active thermography includes applying, using at least one thermal excitation device, a first excitation pulse to a workpiece; capturing, using an imaging device, a first iso-time frame of the workpiece; and determining a second excitation pulse by modifying one or more of a duration D of the first excitation pulse, an amplitude A of the first excitation pulse, or a spacing W between the first excitation pulse and the second excitation pulse. The method also includes applying, using the at least one of the thermal excitation device, the second excitation pulse to the workpiece; capturing, using the imaging device, a second iso-time frame of the workpiece; and determining a numerical fit of the first iso-time frame and the second iso-time frame.Type: GrantFiled: April 27, 2021Date of Patent: October 18, 2022Assignee: Thermal Wave Imaging, Inc.Inventors: Steven M. Shepard, Maria Frendberg Beemer
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Publication number: 20210341403Abstract: A method for performing non-destructive testing using active thermography includes applying, using at least one thermal excitation device, a first excitation pulse to a workpiece; capturing, using an imaging device, a first iso-time frame of the workpiece; and determining a second excitation pulse by modifying one or more of a duration D of the first excitation pulse, an amplitude A of the first excitation pulse, or a spacing W between the first excitation pulse and the second excitation pulse. The method also includes applying, using the at least one of the thermal excitation device, the second excitation pulse to the workpiece; capturing, using the imaging device, a second iso-time frame of the workpiece; and determining a numerical fit of the first iso-time frame and the second iso-time frame.Type: ApplicationFiled: April 27, 2021Publication date: November 4, 2021Applicant: Thermal Wave Imaging, Inc.Inventors: Steven M. Shepard, Maria Frendberg Beemer
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Patent number: 9250134Abstract: An assembly including an optically excited infrared nondestructive testing active thermography system is disclosed. The optically excited infrared nondestructive testing active thermography system includes one or more illumination sources, at least one first reflector, at least one second reflector and a computing resource. The at least one first reflector is arranged about the one or more illumination sources. The at least one first reflector has a near focal point and a far focal point. The one or more illumination sources is/are positioned at least proximate the near focal point of the at least one first reflector. The at least one second reflector is positioned at least proximate the far focal point. The computing resource is communicatively-coupled to a motor that is coupled to the at least one second reflector for manipulating the at least one second reflector between at least: a first spatial orientation and a second spatial orientation.Type: GrantFiled: September 23, 2014Date of Patent: February 2, 2016Assignee: Thermal Wave Imaging, Inc.Inventors: Steven M. Shepard, Timothy Young, Maria Frendberg Beemer
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Patent number: 9157878Abstract: A system for detecting aberrations within a workpiece having a conduit with an input end and an output end is disclosed. The system comprises a fluid delivery device arranged proximate to input end of conduit to pass fluid into input end of the conduit, the fluid delivery device having one or more fluid controllers that control one or more conditions of the fluid passed thereby, a sensor having an input and an output, the input arranged proximate to output end of conduit to measure one or more conditions of the fluid experienced by input, a workpiece exciter situated to excite workpiece and a processor having an input connected to the output of sensor, the processor having a correlator to correlate any changed of the one or more conditions of the fluid experienced by input of sensor with an excitement of workpiece by sensor.Type: GrantFiled: October 10, 2012Date of Patent: October 13, 2015Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 9080453Abstract: A method of thermal inspection of a component defining at least one internal passageway at a thermal equilibrium state with its surrounding environment, the method includes: capturing a sequence of thermal indications of a surface of the component, delivering an airflow pulse at the thermal equilibrium state of the at least one internal passageway into the at least one internal passageway, and receiving a temperature response signal as a function of time based on the received thermal indication. The method also includes determining a level of blockage of the at least one internal passageway based on the temperature response signal.Type: GrantFiled: October 16, 2012Date of Patent: July 14, 2015Assignee: THERMAL WAVE IMAGING, INC.Inventors: Steven M. Shepard, James R. Lhota, Tasdiq Ahmed, Bharat Bhushan Chaudhry
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Patent number: 8449176Abstract: A method for processing thermographic data is disclosed including thermally disturbing a specimen of unknown quality, collecting thermal data from said specimen, converting the collected data into a measure of variance and comparing the variance from the sample of unknown quality against the variance of a sample of known quality in order to determine if the quality of the specimen of unknown quality is acceptable.Type: GrantFiled: April 20, 2010Date of Patent: May 28, 2013Assignee: Thermal Wave Imaging, Inc.Inventor: Steven Shepard
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Publication number: 20130091927Abstract: A system for detecting aberrations within a workpiece having a conduit with an input end and an output end is disclosed. The system comprises a fluid delivery device arranged proximate to input end of conduit to pass fluid into input end of the conduit, the fluid delivery device having one or more fluid controllers that control one or more conditions of the fluid passed thereby, a sensor having an input and an output, the input arranged proximate to output end of conduit to measure one or more conditions of the fluid experienced by input, a workpiece exciter situated to excite workpiece and a processor having an input connected to the output of sensor, the processor having a correlator to correlate any changed of the one or more conditions of the fluid experienced by input of sensor with an excitement of workpiece by sensor.Type: ApplicationFiled: October 10, 2012Publication date: April 18, 2013Applicant: THERMAL WAVE IMAGING, INC.Inventor: THERMAL WAVE IMAGING, INC.
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Publication number: 20130041614Abstract: A method of thermal inspection of a component defining at least one internal passageway at a thermal equilibrium state with its surrounding environment, the method includes: capturing a sequence of thermal indications of a surface of the component, delivering an airflow pulse at the thermal equilibrium state of the at least one internal passageway into the at least one internal passageway, and receiving a temperature response signal as a function of time based on the received thermal indication. The method also includes determining a level of blockage of the at least one internal passageway based on the temperature response signal.Type: ApplicationFiled: October 16, 2012Publication date: February 14, 2013Applicant: THERMAL WAVE IMAGING, INC.Inventor: THERMAL WAVE IMAGING, INC.
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Patent number: 8287183Abstract: A method of thermal inspection of a component defining at least one internal passageway. The method includes receiving a continuous sequence of thermal images of at least an exit hole defined by the at least one internal passageway at a surface of the component. The method also includes delivering a pressurized airflow pulse into the at least one internal passageway, receiving a temperature response signal as function of time based on the received thermal images, determining a first derivative of the temperature response signal, and determining a level of blockage of the at least one internal passageway based on the first derivative of the temperature response signal.Type: GrantFiled: March 17, 2011Date of Patent: October 16, 2012Assignee: Thermal Wave Imaging, Inc.Inventors: Steven Shepard, James R. Lhota, Tasdiq Ahmed, Bharat B. Chaudhry
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Publication number: 20110235672Abstract: A method of thermal inspection of a component defining at least one internal passageway. The method includes receiving a continuous sequence of thermal images of at least an exit hole defined by the at least one internal passageway at a surface of the component. The method also includes delivering a pressurized airflow pulse into the at least one internal passageway, receiving a temperature response signal as function of time based on the received thermal images, determining a first derivative of the temperature response signal, and determining a level of blockage of the at least one internal passageway based on the first derivative of the temperature response signal.Type: ApplicationFiled: March 17, 2011Publication date: September 29, 2011Applicant: THERMAL WAVE IMAGING, INC.Inventors: Steven Shepard, James R. Lhota, Tasdiq Ahmed, Bharat B. Chaudhry
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Publication number: 20100235115Abstract: A method for processing thermographic data is disclosed including thermally disturbing a specimen of unknown quality, collecting thermal data from said specimen, converting the collected data into a measure of variance and comparing the variance from the sample of unknown quality against the variance of a sample of known quality in order to determine if the quality of the specimen of unknown quality is acceptable.Type: ApplicationFiled: April 20, 2010Publication date: September 16, 2010Applicant: THERMAL WAVE IMAGING, INC.Inventor: Steven Shepard
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Patent number: 7724925Abstract: A method for compiling thermographic data including obtaining data indicative of a monotonically changing characteristic of a specimen, sequencing the data or a surrogate of the data into a plurality of groups, categorizing, within each group, the frequency distribution of an attribute of the data or an attribute of said surrogate data, and compiling, from one or more groups, a collection of two or more of the frequency distributions.Type: GrantFiled: May 18, 2004Date of Patent: May 25, 2010Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 7554086Abstract: A method for measuring the timing of a flash event including capturing a first image prior to the commencement of a flash event. Capturing a second image during the occurrence of the flash event, and comparing the second image to the first image to determine a time related characteristic of the flash event.Type: GrantFiled: October 7, 2005Date of Patent: June 30, 2009Assignee: Thermal Wave Imaging, Inc.Inventors: Steven Shepard, James R. Lhota
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Patent number: 7186981Abstract: A pulse controller device for controlling the excitation of a heat source used in thermographic imaging is disclosed. The pulse controller device comprises a power supply, a heat source coupled to the power supply, a device coupled to the power supply signaling the power supply to deliver electrical power to the heat source, a sensor for sensing the delivery of electrical power to the heat source, a flash duration module coupled to said sensor for measuring a duration of time, and a gate device coupled to said flash duration module for gating the electrical power utilized by the heat source. A method for thermographically evaluating a sample is also disclosed.Type: GrantFiled: July 29, 2004Date of Patent: March 6, 2007Assignee: Thermal Wave Imaging, Inc.Inventors: Steven M. Shepard, Timothy Young
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Publication number: 20070041422Abstract: A method for processing thermographic data is disclosed including thermally disturbing a sample collecting, as a function of time, thermal data from said sample, converting the collected data using a 2nd nd derivative function, and transforming the converted data using at least one Boolean operation.Type: ApplicationFiled: August 1, 2006Publication date: February 22, 2007Applicant: THERMAL WAVE IMAGING, INC.Inventor: Steven Shepard
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Patent number: 7083327Abstract: A active thermographic method for detecting subsurface defects in a specimen, particularly kissing unbond defects, includes heating a specimen, applying a force to the surface of the specimen to shift and separate the walls of the defect, and obtaining thermographic images of the specimen over time to monitor the heat flow through the specimen and detect thermal discontinuities. Because kissing unbond defects normally have good physical contact, and therefore good thermal conductivity, between its walls, these defects can go undetected in conventional active thermographic methods. By distorting the surface of the specimen, the kissing unbond defect is enlarged enough to generate sufficient thermal contrast for the defect to appear in the thermographic images.Type: GrantFiled: December 2, 1999Date of Patent: August 1, 2006Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Publication number: 20060062561Abstract: A method for measuring the timing of a flash event including capturing a first image prior to the commencement of a flash event. Capturing a second image during the occurrence of the flash event, and comparing the second image to the first image to determine a time related characteristic of the flash event.Type: ApplicationFiled: October 7, 2005Publication date: March 23, 2006Applicant: THERMAL WAVE IMAGING, INC.Inventors: Steven Shepard, James Lhota
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Patent number: 6795784Abstract: A method an apparatus for non-destructive testing and evaluation of part samples includes obtaining a defect image of the sample, displaying the defect image on a display, referencing the defect image, such as through marking or annotation, to highlight locations at which defects or measurements are found, superimposing the defect image onto a live image of the part, and physically marking/annotating the part, tracing the marks from the defect image onto the physical sample, while viewing the live image. Because both the defect image and the live image are viewed through the same camera lens and are therefore subject to the same amount of distortion, the actual sample can be marked exactly according to the marks made in the defect image; there is no need to attempt matching a distorted defect image with the physical sample, as has been done in the prior art.Type: GrantFiled: January 12, 2001Date of Patent: September 21, 2004Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 6751342Abstract: A method and system for non-destructive, reference-free thermographic detection of sub-surface defects uses an infrared camera to capture multiple, spatially different images of a sample that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and a least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel. This polynomial expression can be transformed into the original time domain to obtain temperature-time data with improved signal-to-noise characteristics.Type: GrantFiled: April 15, 2002Date of Patent: June 15, 2004Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard
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Patent number: 6585146Abstract: A method and apparatus for automated, non-destructive evaluation of spot welds includes a device for heating a sample containing a spot weld, an infrared camera for detecting changes in the surface temperature of the weld, and a computer to acquire and analyze data from the camera. In one embodiment, the sample is heated on one side and the time-temperature characteristic is monitored as the heat travels through the sample and the spot weld. The computer generates a histogram that represents the relationship between a particular time-temperature characteristic and the number of pixels exhibiting that characteristic, thereby representing the quality and size of the weld nugget. By generating a histogram corresponding to weld quality, the inventive apparatus and method provides an objective weld quality indicator and allows automation of the evaluation process.Type: GrantFiled: January 5, 2001Date of Patent: July 1, 2003Assignee: Thermal Wave Imaging, Inc.Inventor: Steven M. Shepard