Abstract: A method for controlling a mass spectrometer comprising a mass analyser and a detector. A test specimen is supplied into the mass analyser, to travel through the mass analyser and towards the detector, the test specimen comprising a carrier gas and/or analyte ions, the test specimen being one of a series of test specimens to be analysed. An ion intensity is measured, the ion intensity representing the intensity of ions within the test specimen received at the detector. The method determines if at least one validity criterion of a group of validity criteria is complied with, the group of validity criteria including: identification of a valid peak in the ion intensity measured within a predetermined time interval; and identification of a user-specified flag associated with the predetermined time interval. If none of the validity criteria are complied with, then terminating supplying into the mass analyser the test specimen and any further test specimen of the series of test specimens.

Abstract: Methods for operating a mass spectrometer having a skimmer and a circuit configured to apply an electric potential to the skimmer comprise obtaining an initial mass spectrum of a sample and measuring a value indicating an ion beam intensity of one or more ion species. A varying DC electric potential is applied to the skimmer to identify an operational electric potential, wherein the DC electric potential is varied until the value indicating the ion beam intensity of the one or more ion species changes by a predetermined amount. The mass spectrum with the operational electric potential applied to the skimmer is output. In some examples, a pressure within the mass spectrometer is varied to identify an operational pressure, and the mass spectrum with the pressure within the mass spectrometer at the operational pressure is output.

Abstract: An ion mobility analyser comprising an ion guide is provided. The ion guide defines an ion drift channel extending in an axial direction an includes first and second electrode assemblies provided on opposing sides of the ion drift channel. Each of the first and second electrode assemblies extend in the axial direction and in a transverse direction which is transverse to the axial direction. The first and second electrode assemblies are spaced apart on opposing sides of the ion drift channel by a first distance at a narrowest point along the axial direction. Each of the first and second electrode assemblies comprises a set of first electrodes, and a set of second electrodes. The electrodes in the first and second sets are arranged in an alternating pattern in the transverse direction. The alternating pattern extends in the transverse direction a second distance that is greater than the first distance.

Abstract: A component of an ion optical device is manufactured. The component comprises aligned first and second electrode sets. A first material is machined to provide a part-machined first electrode set that comprises the first electrode set attached to a frame part of the first material. A second material is machined to provide a part-machined second electrode set that comprises the second electrode set attached to a frame part of the second material. The component of the ion optical device is assembled by aligning the part-machined first and second electrode sets. Subsequent to aligning the part-machined first and second electrode sets, the part-machined first electrode set is further machined to separate the first electrode set from the frame part of the first material and the part-machined second electrode set is further machined to separate the second electrode set from the frame part of the second material.

Abstract: A voltage supply for a mass analyser is provided. The voltage supply comprises a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to a first electrode of the mass analyser, wherein the first electrode of the mass analyser has a first mass shift per volt perturbation. The second voltage output is configured to provide a second voltage to a second electrode of the mass analyser, wherein the second electrode of the mass analyser has a second mass shift per volt perturbation. The second mass shift per volt perturbation opposes the first mass shift per volt perturbation. The voltage divider network comprises a first resistor and a second resistor.

Abstract: Apparatuses for trapping ions comprise an array of electrodes extending along a surface and one or more further electrodes that are distinct from the array of electrodes. A trapping region for receiving the ions is defined by the array of electrodes and the one or more further electrodes. A control circuit is configured to apply a set of oscillatory voltages to the array of electrodes to repel the ions, wherein each electrode in the array has a different phase to each adjacent electrode. A trapping voltage is applied to at least one of the one or more further electrodes to force the ions towards the array of electrodes, the set of oscillatory voltages and the trapping voltage thereby trapping the ions within the trapping region, wherein the trapping voltage is a time-varying direct current, DC, voltage that increases in magnitude over time.

Abstract: A cleaning device for cleaning electrodes of an ion optical multipole device comprises at least one substantially longitudinal cleaning section, at least one handling section extending axially from the at least one cleaning section and at least one direction section extending axially from the at least one cleaning section. The at least one cleaning section has a larger cross section than the at least one handling section. The at least one direction section is capable of allowing a longitudinal movement of the cleaning device in a first axial direction and resisting a longitudinal movement of the cleaning device in a second, opposite axial direction.

Abstract: A gas supply system for a flame module of a spectrometer and a method of controlling a flame module. The gas supply system comprises an oxidant gas supply line for providing a supply of oxidant gas, an oxidant gas flow valve for varying a gas flow rate of an oxidant gas in the oxidant gas supply line, an oxidant gas safety controller configured to control the oxidant gas flow valve, a fuel gas supply line for providing a supply of fuel gas, a fuel gas flow valve configured to control a gas flow rate of a fuel gas on the fuel gas supply line, and a fuel gas safety controller configured to control the fuel gas flow valve. During normal operation, the oxidant gas safety controller is configured to charge an energy storage circuit of the oxidant gas safety controller.

Abstract: An ion guide is provided for a spectrometer. The ion guide comprises a first electrode assembly, comprising a plurality of guide electrodes aligned along a central axis. Each guide electrode comprises an aperture. The apertures define an ion channel from a first end of the first electrode assembly to a second end of the first electrode assembly. The ion channel is configured to receive an ion beam at the first end. The guide electrodes are configured to receive RF voltages to define a confinement volume for the ion beam, wherein the confinement volume is centred about the central axis. The ion guide comprises a second electrode assembly adjacent to the first electrode assembly, wherein the second electrode assembly is configured to receive a DC voltage, such that a centre of the ion beam is deflected to be off the central axis.

Abstract: A method of analysing a field of a mass spectrometer comprising a mass analyser and a static field mass filter having a first Wien filter and a second Wien filter is provided. The method includes, for each of a plurality of predetermined strengths of one of an electric field or a magnetic field of the first and second Wien filters: setting the one of the electric field or the magnetic field of the first and second Wien filters to the predetermined strength; causing a beam of ions comprising one or more ion species to be injected through the static field mass filter; and measuring, using the mass analyser, a respective intensity of ions of each of the one or more ion species in the beam.

Abstract: An analytical instrument comprises a mass analyser and first and second ion traps coupled to the mass analyser. A method of operating the instrument comprises operating the first ion trap in a mode of operation in which the first ion trap confines ions within a first mass-to-charge ratio (m/z) range, storing first ions in the first ion trap, operating the second ion trap in a mode of operation in which the second ion trap confines ions within a second different mass-to-charge ratio (m/z) range, and storing second ions in the second ion trap. The method further comprises ejecting the first ions from the first ion trap into the mass analyser, ejecting the second ions from the second ion trap into the mass analyser, and mass analysing the first ions and the second ions.

Abstract: A method of tuning a static field mass filter of a mass spectrometer, the static field mass filter having a first Wien filter and a second Wien filter. The method comprises injecting a beam of ions into the static field mass filter, applying a magnetic and an electric field in the first and second Wien filters, adjusting a second lens of the filter.

Abstract: A method of determining an expected response to injecting a beam of ions of a species of interest into a static field mass filter of a mass spectrometer including a mass analyser is provided. The method includes: measuring an intensity of ions injected into the static field mass filter for various combinations of test ion species, test magnetic field strengths, and test electric field strengths; determining electric field strengths corresponding to an intensity equal to a first and a second fraction of the measured peak intensity; based on a predetermined relationship between magnetic field strength, electric field strength and centre mass of the static field mass filter, determining mass values corresponding to the determined electric field strengths; and interpolating, from said mass values and for each ion species and for at least one of the test magnetic field strengths, expected mass values for an ion species of interest.

Abstract: A computer-implemented method of simulating a mass filter, which has a bandpass characteristic, of a mass spectrometer includes: receiving a first candidate magnetic field strength and a first candidate electric field strength of the mass filter; based on the received first candidate magnetic and electric field strengths, determining a corresponding centre mass of the mass filter; based on the received first candidate magnetic and electric field strengths, determining the width of a passband of the bandpass characteristic; and determining at least one of a lower or an upper bound of the passband of the bandpass characteristic of the mass filter, the determining of the upper bound including adding a first predetermined fraction of the determined width of the passband to the determined centre mass and the determining of the lower bound comprising subtracting a second predetermined fraction of the determined width of the passband from the determined centre mass.

Abstract: Methods for acquiring mass spectral data comprise determining first and second sets of m/z sub-ranges comprising respective first and second m/z sub-ranges. A sample is mass filtered to isolate ions in the first and second sets of m/z sub-ranges using respective mass filters. Mass analysis is performed to obtain first and second partial mass spectral data sets, the first and second mass filters having first and second response profiles having respective relatively high transmission regions and one or more relatively low transmission regions. The first and second sets of m/z sub-ranges are determined such that relatively high transmission regions of the first response profile and the second response profile at least partially overlap.

Abstract: Methods for acquiring mass spectral data of a sample across at least a portion of an m/z range comprise receiving mass spectral data across the m/z range and partitioning the m/z range into one or more sets of m/z sub-ranges, each set comprising one or more m/z sub-ranges, by dividing the m/z range into a plurality of m/z bins, determining an indication of ion abundance for each m/z bin, based on the mass spectral data, and forming an m/z sub-range of the one or more sets of m/z sub-ranges by assigning m/z bins having ion abundances that correspond to at least a threshold degree to the formed m/z sub-range. A mass analysis is performed on the sample for each set of m/z sub-ranges, thereby acquiring one or more partial mass spectral data sets.

Abstract: Methods for acquiring mass spectral data of a sample across at least a portion of an m/z range include receiving mass spectral data of the sample across the m/z range. The m/z range is partitioned into one or more sets of m/z sub-ranges, each set comprising one or more m/z sub-ranges, by dividing the m/z range into a plurality of m/z bins, determining an indication of ion abundance for each m/z bin, based on the mass spectral data, and forming an m/z sub-range of the one or more sets of m/z sub-ranges by assigning m/z bins having ion abundances that correspond to at least a threshold degree to the formed m/z sub-range. A mass analysis is performed on the sample for each set of m/z sub-ranges, thereby acquiring one or more partial mass spectral data sets.

Abstract: A Time of Flight (TOF) mass analyser comprises an ion source, a detector, an electrode, and a resistive divider comprising first and second resistors. The ion source and the detector define an ion flight path from the ion source to the detector. The electrode is arranged along the ion flight path and receives an output voltage. Thermal expansion produces a first mass shift/Kelvin of detected ions. The resistive divider is thermally coupled to the TOF mass analyser to receive an input voltage and output an output voltage to the electrode. The first and second resistors have respective first and second temperature coefficients that provide a voltage shift/Kelvin to the output voltage to the electrode producing a second mass shift/Kelvin of detected ions, compensating for the first mass shift/Kelvin.

Abstract: A method of optical spectroscopy for analysing a sample using an optical spectrometer is provided. The method comprises obtaining a sample spectrum of the sample using the optical spectrometer and obtaining a blank spectrum using the optical spectrometer. The blank spectrum comprises structured background radiation which is correlated with the sample spectrum. A cross-correlation of the sample spectrum and the blank spectrum is determined. A mapped blank spectrum is generated by mapping the blank spectrum to the sample spectrum based on the cross-correlation, and the mapped blank spectrum is subtracted from the sample spectrum to generate a background corrected sample spectrum.

Abstract: An isotope ratio mass spectrometer has an ion source, a static field mass filter, a reaction cell to induce a mass shift reaction, and a sector field mass analyser for spatially separating ions from the reaction cell according to their m/z. A detector platform detects a plurality of different ion species separated by the sector field mass analyser. The static field mass filter has a first Wien filter that deflects ions away from a longitudinal symmetry axis of the spectrometer in accordance with the ions' m/z, and a second Wien filter that deflects ions back towards the longitudinal symmetry axis in accordance with the ions' m/z. An inverting lens is positioned along the longitudinal axis between the Wien filters to invert the direction of deflection of the ions from the first Wien filter. The static field mass filter provides high transmission and improved spectrometer sensitivity. The first and second Wien filters permit simple tuning.