Abstract: A system for confocal observation of a sample, having a mask, which is arranged in both an illumination beam path and in an image beam path and which is rotatable around a central axis, openings arranged in a pinhole plane, an arrangement of focusing micro-optics aligned with the geometric arrangement of the openings of the mask to generate a focal pattern, and an optical assembly with an objective, and which is configured to image the focal pattern onto the sample for generating an illumination pattern moving across the sample and to collect light from the sample by the objective and to image it onto the openings of the mask for confocal filtering. The focal plane and pinhole plane are separated by a distance and the optical assembly has a path length difference compensation arrangement which is selective with regard to the illumination light and the light collected from the sample.

Abstract: A system for confocal observation of a sample, having a mask, which is arranged in both an illumination beam path and in an image beam path and which is rotatable around a central axis, openings arranged in a pinhole plane, an arrangement of focusing micro-optics aligned with the geometric arrangement of the openings of the mask to generate a focal pattern, and an optical assembly with an objective, and which is configured to image the focal pattern onto the sample for generating an illumination pattern moving across the sample and to collect light from the sample by the objective and to image it onto the openings of the mask for confocal filtering. The focal plane and pinhole plane are separated by a distance and the optical assembly has a path length difference compensation arrangement which is selective with regard to the illumination light and the light collected from the sample.

Abstract: There is provided a microscope device comprising: means for creating a collimated beam of light collected from a sample and comprising at least a first spectral range and a second spectral range, means for separating the collimated beam into a first beam containing a higher percentage of light of the first spectral range than light of the second spectral range and a second beam containing a lower percentage of light of the first spectral range than light of the second spectral range, means for reflecting the first beam, means for reflecting the second beam, means for combining the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample on the detector, wherein the means for reflecting the first beam and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, w

Abstract: A microscope device comprising a microscope objective and a plate-like body limited by a flat top face and a flat lower face essentially parallel thereto, with the microscope objective being connected to the plate-like body, and with a portion of a beam path of the microscope device extending above and/or below the plate-like body, wherein another portion of the beam path of the microscope device extends, essentially parallel to the top face and the lower face, within a recess within the plate-like body.

Abstract: A device for confocal observation of a specimen, having a mask, which is located in the illumination beam path and the image beam path and is rotatable around a central axis, the mask being provided with openings for generating an illumination pattern moving on the specimen, an arrangement of a plurality of focusing microoptics which is adjusted to the geometric arrangement of the openings of the mask and to the rotation of the mask in order to concentrate the illumination light by each of the microoptics into a respective one of the openings of the mask, and a beam splitter for separating light from the specimen from illumination light, wherein the beam splitter is arranged in the beam path between the mask and the arrangement of the microoptics, and wherein an optical arrangement is provided in the beam path between the mask and the arrangement of the microoptics.

Abstract: A device for confocal observation of a specimen, having a mask, which is located in the illumination beam path and the image beam path and is rotatable around a central axis, the mask being provided with openings for generating an illumination pattern moving on the specimen, an arrangement of a plurality of focusing microoptics which is adjusted to the geometric arrangement of the openings of the mask and to the rotation of the mask in order to concentrate the illumination light by each of the microoptics into a respective one of the openings of the mask, and a beam splitter for separating light from the specimen from illumination light, wherein the beam splitter is arranged in the beam path between the mask and the arrangement of the microoptics, and wherein an optical arrangement is provided in the beam path between the mask and the arrangement of the microoptics.

Abstract: A device for confocal observation of a specimen, having a mask, which is located in the illumination beam path and the image beam path and is rotatable around a central axis, the mask being provided with openings for generating an illumination pattern moving on the specimen, an arrangement of a plurality of focusing microoptics which is adjusted to the geometric arrangement of the openings of the mask and to the rotation of the mask in order to concentrate the illumination light by each of the microoptics into a respective one of the openings of the mask, and a beam splitter for separating light from the specimen from illumination light, wherein the beam splitter is arranged in the beam path between the mask and the arrangement of the microoptics, and wherein an optical arrangement is provided in the beam path between the mask and the arrangement of the microoptics.

Abstract: There is provided a method for a microscope device for optionally examining a sample by at least a first light beam bundle from a first direction or a second light beam bundle from a second direction different to the first direction, having a microscope objective and a beam deflection element, wherein the beam deflection element is operable by a drive in order to optionally couple the first light beam bundle or the second light beam bundle into the microscope objective, and wherein the beam deflection element is rotatable by the drive in order to optionally change at least an exit direction of the first light beam bundle from the beam deflection element if the first light beam bundle is coupled into the microscope objective.

Abstract: There is provided a device for confocal observation of a specimen, comprising an objective, a mask, which is located in the illumination beam path and the image beam path and which is rotatable around a central axis, the mask being imaged onto the specimen by means of the objective and being provided with openings for generating an illumination pattern moving on the specimen, an arrangement of a plurality of focussing microoptics which is adjusted to the geometric arrangement of the openings of the mask and to the rotation of the mask in order to concentrate the illumination light by each of the microoptics into a respective one of the openings of the mask, and a beam splitter for separating light from the specimen which has been collected by the objective and which has passed through the openings of the mask from illumination light, wherein the beam splitter is arranged in the beam path between the mask and the arrangement of the microoptics, and wherein an optical arrangement is provided in the beam path be

Abstract: A microscope system having an objective lens (10) defining a central optical axis (14) of the microscope system; an optical beam hub unit (18, 20) having a center coinciding with the central optical axis, a plurality of optical beam ports (24, 26, 30, 32; 214) arranged radially around the central optical axis, a beam multiplexer system (22, 28, 222) arranged in the center of the hub unit, and a device for rotating the beam multiplexer system around the central optical axis for alternatively selecting at least one of the beam ports. The beam ports include at least two elements selected any one of input ports, output ports and dual input/output ports.

Abstract: There is provided a microscope device comprising an objective, a light source for illuminating a specimen via an illumination beam path, an arrangement for continuously moving the specimen during observation in a direction perpendicular to the optical axis of the objective, a two-dimensional detector for detecting light coming from the specimen via an image beam path, said detector being capable of shifting charges during observation in a row-wise manner in the direction of the movement of the specimen on the detector, a beam deflection element which is adjustable for moving the illumination beam path and the image beam path during observation relative to the specimen in the direction of the movement of the specimen, and a control unit for selecting the velocity of the specimen, the adjustment velocity of the beam deflection element and the charge shift velocity in such a manner that the charge shift velocity acts to compensate the movement of a point of the specimen, which point is imaged onto the detector,

Abstract: A microscope device comprising a microscope objective and a plate-like body limited by a flat top face and a flat lower face essentially parallel thereto, with the microscope objective being connected to the plate-like body, and with a portion of a beam path of the microscope device extending above and/or below the plate-like body, wherein another portion of the beam path of the microscope device extends, essentially parallel to the top face and the lower face, within a recess within the plate-like body.

Abstract: A microscope system having a plurality of exchangeable objective lenses (10); an objective lens changeover element (18) for supporting each of the objective lenses which is operable for placing a selected one of said objective lenses into an optical axis (22) of the microscope system, wherein each objective lens is supported by the changeover element in such a manner that each objective lens is moveable coaxially with respect to the optical axis and relative to the changeover element; and an actuator element (20, 40) for moving the selected one of the objective lenses coaxially relative to the optical axis and relative to the changeover element for focusing the selected one of the objective lenses relative to a specimen (12).

Abstract: There is provided a method for a microscope device for optionally examining a sample by at least a first light beam bundle from a first direction or a second light beam bundle from a second direction different to said first direction, comprising a microscope objective and a beam deflection element, wherein the beam deflection element is operable by means of a drive in order to optionally couple the first light beam bundle or the second light beam bundle into the microscope objective, and wherein the beam deflection element is rotatable by means of the drive in order to optionally change at least an exit direction of the first light beam bundle from said beam deflection element if the first light beam bundle is coupled into the microscope objective.

Abstract: A microscope system having an objective lens (10) defining a central optical axis (14) of the microscope system; an optical beam hub unit (18, 20) having a center coinciding with the central optical axis, a plurality of optical beam ports (24, 26, 30, 32; 214) arranged radially around the central optical axis, a beam multiplexer system (22, 28, 222) arranged in the center of the hub unit, and a device for rotating the beam multiplexer system around the central optical axis for alternatively selecting at least one of the beam ports. The beam ports include at least two elements selected any one of input ports, output ports and dual input/output ports.

Abstract: A microscope system having a plurality of exchangeable objective lenses (10); an objective lens changeover element (18) for supporting each of the objective lenses which is operable for placing a selected one of said objective lenses into an optical axis (22) of the microscope system, wherein each objective lens is supported by the changeover element in such a manner that each objective lens is moveable coaxially with respect to the optical axis and relative to the changeover element; and an actuator element (20, 40) for moving the selected one of the objective lenses coaxially relative to the optical axis and relative to the changeover element for focusing the selected one of the objective lenses relative to a specimen (12).

Abstract: A microscope for transmission viewing of a speciment including a light source for producing a light beam; an objective lens positioned for focusing the light beam produced by said light source on an area of the specimen for illuminating said area; and a reflector positioned for reflecting light transmitted through the specimen back through the illuminated area of the specimen.

Abstract: A fluorescence-measuring device for scanning a specimen (36, 226) with a selection element (26, 206). Excitation light is coupled to an excitation beam path and guided to the specimen surface. Fluorescent light, which is emitted by the specimen surface, crosses the excitation beam path in a reverse direction and at the same time is decoupled from the excitation beam path. In the beam path, there is a first dispersive element (30, 210) so that the fluorescent light emitted by the specimen surface can strike the selection element spectrally split. The selection element includes a first area (48, 240) and a second area (26, 242) allowing selection between the excitation and fluorescent light. According to a first aspect, a spatial extension of a transmission area (26) is adjustable in order to adjust the transmitted wavelength range of the emission light. According to a second aspect, the selection element (206) makes it possible to operate with a coherent excitation having several laser lines.