Patents Assigned to Trielectrix
  • Patent number: 5691642
    Abstract: A method and apparatus for accurately characterizing the electron density and distribution of a confined plasma on the basis of high-frequency, broadband electromagnetic measurements is disclosed herein. The technique involves noninvasive, broadband measurement of electromagnetic transmission through a plasma. In one implementation, multivariate analysis techniques are employed to correlate features of the resultant spectra with plasma characteristics such as electron density or electron distribution. Alternately, such techniques are used to correlate the resultant spectra with parameters relating to conditions under which the plasma is generated. More specifically, the quantitative plasma characterization technique involves generating a set of broadband calibration spectra by measuring transmission of electromagnetic energy through a calibration plasma. Each broadband calibration spectrum is obtained using a different set of reference parameters being related to predefined quantitative characteristics.
    Type: Grant
    Filed: July 28, 1995
    Date of Patent: November 25, 1997
    Assignee: Trielectrix
    Inventor: Daniel M. Dobkin