Abstract: The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material.
Type:
Grant
Filed:
March 11, 2013
Date of Patent:
April 8, 2014
Assignee:
Troxler Laboratories, Inc.
Inventors:
Robert Ernest Troxler, Wewage Hiran Linus Dep