Patents Assigned to UESTC (Shenzhen) Advanced Research Institute
  • Patent number: 11965929
    Abstract: Methods for detecting a glitch at a high sampling rate are provided. In some embodiments, a method includes the following steps: S1, acquiring to-be-identified data; S2, processing the to-be-identified data to obtain normal sampling data; and S3, performing glitch identification on the to-be-identified data to obtain a glitch position of the normal sampling data. In other embodiments, the disclosure provides a system for detecting a glitch at a high sampling rate and for implementing the method for detecting a glitch at a high sampling rate. The system includes an acquisition unit and a glitch identification unit. The acquisition unit acquires and processes the to-be-identified data to obtain the normal sampling data, and the glitch identification unit performs glitch identification on the to-be-identified data to obtain the glitch position of the normal sampling data.
    Type: Grant
    Filed: July 5, 2022
    Date of Patent: April 23, 2024
    Assignee: UESTC (Shenzhen) Advanced Research Institute
    Inventors: Zhijian Dai, Wanyu Yang, Jian Wu
  • Publication number: 20230061075
    Abstract: Methods for detecting a glitch at a high sampling rate are provided. In some embodiments, a method includes the following steps: S1, acquiring to-be-identified data; S2, processing the to-be-identified data to obtain normal sampling data; and S3, performing glitch identification on the to-be-identified data to obtain a glitch position of the normal sampling data. In other embodiments, the disclosure provides a system for detecting a glitch at a high sampling rate and for implementing the method for detecting a glitch at a high sampling rate. The system includes an acquisition unit and a glitch identification unit. The acquisition unit acquires and processes the to-be-identified data to obtain the normal sampling data, and the glitch identification unit performs glitch identification on the to-be-identified data to obtain the glitch position of the normal sampling data.
    Type: Application
    Filed: July 5, 2022
    Publication date: March 2, 2023
    Applicant: UESTC (Shenzhen) Advanced Research Institute
    Inventors: Zhijian DAI, Wanyu YANG, Jian WU