Abstract: Methods for detecting a glitch at a high sampling rate are provided. In some embodiments, a method includes the following steps: S1, acquiring to-be-identified data; S2, processing the to-be-identified data to obtain normal sampling data; and S3, performing glitch identification on the to-be-identified data to obtain a glitch position of the normal sampling data. In other embodiments, the disclosure provides a system for detecting a glitch at a high sampling rate and for implementing the method for detecting a glitch at a high sampling rate. The system includes an acquisition unit and a glitch identification unit. The acquisition unit acquires and processes the to-be-identified data to obtain the normal sampling data, and the glitch identification unit performs glitch identification on the to-be-identified data to obtain the glitch position of the normal sampling data.
Type:
Grant
Filed:
July 5, 2022
Date of Patent:
April 23, 2024
Assignee:
UESTC (Shenzhen) Advanced Research Institute
Abstract: Methods for detecting a glitch at a high sampling rate are provided. In some embodiments, a method includes the following steps: S1, acquiring to-be-identified data; S2, processing the to-be-identified data to obtain normal sampling data; and S3, performing glitch identification on the to-be-identified data to obtain a glitch position of the normal sampling data. In other embodiments, the disclosure provides a system for detecting a glitch at a high sampling rate and for implementing the method for detecting a glitch at a high sampling rate. The system includes an acquisition unit and a glitch identification unit. The acquisition unit acquires and processes the to-be-identified data to obtain the normal sampling data, and the glitch identification unit performs glitch identification on the to-be-identified data to obtain the glitch position of the normal sampling data.
Type:
Application
Filed:
July 5, 2022
Publication date:
March 2, 2023
Applicant:
UESTC (Shenzhen) Advanced Research Institute