Abstract: This invention provides an improved method for evaluating the quality of images using a test Skr-matrix system. The index k refers to the fractal level in an Skr-matrix, having matrices themselves as elements. The index r?k refers to the Kronecker sub-level to which a typical internal sum structure is present. Skr-matrices can be explained in terms of cognition numbers, basic components, eigenvalues and sine-like eigenvectors. Skr-matrices also form vector spaces in which matrix distances can be properly calculated. The image Skr-quality parameters are derived from an intermediate quasi-Skr-matrix and its best-Skr-approximation in relation to a theoretical reference Skr-matrix. Useful applications are in the field of analogue and digital cameras, scanners, vision sensors, monitors, printers, spectrophotometers, infrared cameras, copying machines, TV-screens, GPS screens, X-rays, Gamma rays, Laser rays, or every other component in the image production and image handling field.