Patents Assigned to Vaclab, Inc.
  • Patent number: 10107277
    Abstract: A non-evaporable getter 1 includes a mesh 3, a frame 2 which is attached to the mesh 3 and suppresses deformation of the mesh 3, and a powder-state getter material 4 which is surrounded by the mesh 3 and the frame 2, and whose particle size is larger than a mesh opening of the mesh 3.
    Type: Grant
    Filed: February 26, 2018
    Date of Patent: October 23, 2018
    Assignee: Vaclab Inc.
    Inventors: Fumio Watanabe, Reiki Watanabe
  • Patent number: 9945368
    Abstract: A non-evaporable getter 1 includes a mesh 3, a frame 2 which is attached to the mesh 3 and suppresses deformation of the mesh 3, and a powder-state getter material 4 which is surrounded by the mesh 3 and the frame 2, and whose particle size is larger than a mesh opening of the mesh 3.
    Type: Grant
    Filed: August 5, 2015
    Date of Patent: April 17, 2018
    Assignee: Vaclab Inc.
    Inventors: Fumio Watanabe, Reiki Watanabe
  • Patent number: 8729465
    Abstract: A vacuum measurement device includes a grid (10) and an electron source (20) provided inside a vacuum vessel, and an ion beam (100) extracted outside the grid is captured by an ion collector (40) and is converted into a current signal. The grid (10) is a grid-shaped cylinder, and an ion outlet (11) is opened and elongated in the longitudinal direction along the side surface of the grid (10). The vacuum measurement device includes a primary ion collector (40) capturing specific ions and a secondary ion collector (50) capturing other ions. The gas molecule density of the ion source is obtained from a total current of the primary and secondary ion collectors, and a ratio of the gas molecule density of the specific ions relative to the gas molecule density is obtained from a ratio of the current of the primary ion collector (40) relative to the total current.
    Type: Grant
    Filed: September 28, 2010
    Date of Patent: May 20, 2014
    Assignee: Vaclab Inc.
    Inventor: Fumio Watanabe
  • Publication number: 20090134018
    Abstract: An ionization vacuum device measures a pressure in a vacuum vessel, and has: an anode provided inside the vacuum vessel; a cathode provided inside the vacuum vessel; a power source for discharge that supplies electric power for discharge between the anode and the cathode; a power source for cathode-heating that supplies power for heating to the cathode, means for forming a magnetic field in a space between the anode and the cathode; control means for controlling so as to heat said cathode by said power source for cathode-heating while discharge of gas inside said vacuum vessel is caused, and so as to maintain the temperature of said cathode within a temperature range where thermonic electrons are not emitted from said cathode.
    Type: Application
    Filed: September 9, 2008
    Publication date: May 28, 2009
    Applicant: VACLAB, INC.
    Inventor: Fumio Watanabe
  • Patent number: 7332714
    Abstract: In a quadrupole mass spectrometer which measures partial pressure strength according to a gas type in a vacuum system from ion current intensity, a quadrupole mass spectrometer with a total pressure measurement electrode has a total pressure measurement electrode for examining an ion density disposed in a demarcation space which is comprised of a grid electrode and an ion focusing electrode. And, a vacuum system is provided with only the quadrupole mass spectrometer which measures partial pressure strength according to a gas type in the vacuum system from an ion current intensity and does not have an ionization vacuum gauge other than the quadrupole mass spectrometer.
    Type: Grant
    Filed: March 15, 2006
    Date of Patent: February 19, 2008
    Assignee: Vaclab Inc.
    Inventors: Fumio Watanabe, Reiki Watanabe
  • Patent number: 7297419
    Abstract: The present invention relates to a manufacturing method of a material for vacuum device used in a vacuum apparatus that generates ultra-high vacuum and performs processing.
    Type: Grant
    Filed: June 8, 2004
    Date of Patent: November 20, 2007
    Assignee: Vaclab Inc.
    Inventor: Fumio Watanabe
  • Patent number: 7091443
    Abstract: A heating device includes a first electrode and a second electrode including a planar portion providing a support surface for supporting an object to be heated in an external gaseous atmosphere to which the object to be heated and the support surface are exposed. The second electrode is formed as an enclosure enclosing and spaced from at least a portion of first electrode to define an interior space therebetween isolated from the external gaseous atmosphere. An exhaust port provides communication with the interior space for reducing the pressure within the interior space. A power supplies current between the first and second electrodes to produce an electric discharge within the internal space, thereby heating the second electrode and the object supported thereon.
    Type: Grant
    Filed: April 26, 2004
    Date of Patent: August 15, 2006
    Assignee: Vaclab, Inc.
    Inventors: Reiki Watanabe, Fumio Watanabe
  • Publication number: 20040253448
    Abstract: The present invention relates to a manufacturing method of a material for vacuum device used in a vacuum apparatus that generates ultra-high vacuum and performs processing.
    Type: Application
    Filed: June 8, 2004
    Publication date: December 16, 2004
    Applicant: VACLAB, INC.
    Inventor: Fumio Watanabe