Abstract: A test apparatus and method for testing passive optical networks is provided. The test apparatus includes an optical circuit having an optical coupler for splitting off a portion of optical traffic. During testing of a passive optical network, the optical circuit is coupled into an optical path of the passive optical network. A bit stream corresponding to an activating procedure is captured and analyzed to extract identification information of the module that sent the bit stream.

Abstract: The invention relates to a method and device for testing a data link. A single-lane or multi-lane bit error tester that transmits one or more PRBS signals through the data link is augmented with a raw bit error buffer for storing bit error information for each detected error event and an error pattern analyzer. Most frequently occurring intra-lane bit error patterns, inter-lane word error patterns, and bit slip patterns are identified and their characteristics are analyzed so as to provide information indicative of root causes of the detected bit errors and bit slips.

Abstract: A test apparatus and method for testing passive optical networks is provided. The test apparatus includes an optical circuit having an optical coupler for splitting off a portion of optical traffic. During testing of a passive optical network, the optical circuit is coupled into an optical path of the passive optical network. A bit stream corresponding to an activating procedure is captured and analyzed to extract identification information of the module that sent the bit stream.

Abstract: A test device for testing a device under test (DUT) includes an integrated control interface adaptable for a plurality of different communication standards. The integrated control interface can be adapted to be compliant with the communication standard used by a DUT connected to the test device.

Abstract: A test device is provided for testing a device under test (DUT) having a control interface compliant with a standard selected from a plurality of standards each supporting a common set of management data input/output (MDIO) and non-MDIO control signals. The test device includes a test interface and an integrated control interface. The integrated control interface adapts to the standard with which the control interface of the DUT complies, so that the integrated control interface directly and fully controls the DUT via at least the common set of MDIO and non-MDIO control signals. The integrated control interface exchanges control signals selected from the common set of MDIO and non-MDIO control signals with the control interface of the DUT to monitor the DUT and thereby obtain status information about the DUT.