Abstract: A confocal microscope device for scanning a two-dimensional array of illumination beams over a target surface and scanning a corresponding two-dimensional array of emission beams stimulated by the array of illumination beams on to a sensor of an imaging device. The device comprises first scanning optics operable to scan the array of illumination beams over the target surface along a first axis and scan the array of emission beams over the sensor along the first axis.
Type:
Grant
Filed:
April 25, 2019
Date of Patent:
December 27, 2022
Assignee:
VisiTech International Limited
Inventors:
Steven Coleman, Andrew Roberts, Jafer Sheblee