Patents Assigned to VisiTech International Limited
  • Patent number: 11536953
    Abstract: A confocal microscope device for scanning a two-dimensional array of illumination beams over a target surface and scanning a corresponding two-dimensional array of emission beams stimulated by the array of illumination beams on to a sensor of an imaging device. The device comprises first scanning optics operable to scan the array of illumination beams over the target surface along a first axis and scan the array of emission beams over the sensor along the first axis.
    Type: Grant
    Filed: April 25, 2019
    Date of Patent: December 27, 2022
    Assignee: VisiTech International Limited
    Inventors: Steven Coleman, Andrew Roberts, Jafer Sheblee