Abstract: Disclosed are a power supplying apparatus, a backlight assembly and an LCD apparatus having the same. A control section outputs a switching signal so as to control an output of a constant current supplied to a lamp unit in response to on and/or off signals and a dimming signal and a switching section controls an output of a direct current voltage source in response to the switching signal. A power outputting section provides an alternating current voltage source having a constant voltage to the lamp unit. A sensing section senses variation of a power supplied to the lamp unit and a detecting section compares a sensing signal with a predetermined reference signal to output a detecting signal to the control section, thereby maintaining the constant current to be supplied to the lamp unit. Accordingly, the LCD apparatus may prevent deterioration of an image and damage of circuit thereof.

Abstract: The present invention relates to a socket for testing an integrated circuit utilizing an improved contact pin structure. In the test socket of the present invention, the length of the electrical path between the leads of tested IC and terminals of PCB is minimized and the contact pin may maintain wiping action in a wide area of contact portions. Further, as the contact pin may accommodate the pressure applied by the IC leads with great elasticity and provides sufficient floating suspension when the pressure is removed, the invention may efficiently prevent damages to the leads of IC being tested and extend the life of the contact pin.

Abstract: The present invention relates to a socket for testing an integrated circuit utilizing an improved contact pin structure. In the test socket of the present invention, the length of the electrical path between the leads of tested IC and terminals of PCB is minimized and the contact pin may maintain wiping action in a wide area of contact portions. Further, as the contact pin may accommodate the pressure applied by the IC leads with great elasticity and provides sufficient floating suspension when the pressure is removed, the invention may efficiently prevent damages to the leads of IC being tested and extend the life of the contact pin.

Abstract: The present invention relates to a socket for testing a module, including a contact pin that is an electrical connecting device for mutually connecting a connecting pin of a module to a terminal of a printed circuit board in testing the module and an elastic body for supporting the contact pin.