Abstract: A pressing apparatus for clothing including a dummy torso, grip members for gripping end portions of both sleeves of a shirt, a rear ironing member, and a front ironing member; the front ironing member being comprised of a left front ironing member and a right front ironing member that are respectively movable between the outside of the grip members and the front of the dummy torso so that when moved to the front of the dummy torso the diagonally extending inside edges of the left and right front ironing members come in contact to mate each other with the mated inside edges located on one side of a vertical center line of the dummy torso and a shirt put on the dummy torso.

Abstract: The present invention describes a plasma generating device comprising a wave guide; a radiative part having slot antennas, each of said slot antennas being adapted to radiate electromagnetic radiation; and a plasma generation chamber being connected to the radiative part via a window made of a dielectric material and being adapted to receive the electromagnetic radiation from the slot antennas; wherein the dimensions of the radiative part are locally modified or are locally changeable, so that the actual wavelength of the microwave is allowed to be locally changed, thereby the amplitude distribution of the electromagnetic radiation towards the plasma generation chamber can be controlled. The present invention also describes a plasma processing apparatus including such a plasma generating device.

Abstract: An IC device to be inspected is received in a chamber, and an IC tester Judges performance of the IC device. An electrical connection device is arranged outside the chamber and has a conductive passage electrically connecting between the IC tester and the IC device. An IC socket is retained on the electrical connection device, for having the IC device inserted therein. A magnetometric sensor is arranged close to the conductive passage of the electrical connection device, for detecting a magnetic field generated when electric current is supplied to the IC device. A temperature control device controls a temperature of the IC device. A control unit controls the temperature control device based on a signal delivered from the magnetometric sensor, to maintain the temperature of the IC device within a predetermined temperature range.