Patents Assigned to ZHONGPAI S&T (SHENZHEN) CO., LTD
  • Patent number: 11635531
    Abstract: An apparatus for measuring photon information and a photon measurement device are disclosed.
    Type: Grant
    Filed: August 26, 2019
    Date of Patent: April 25, 2023
    Assignee: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Zhixiang Zhao, Siwei Xie, Jingwu Yang, Rendong Zhang, Zheng Gong, Qiyu Peng
  • Patent number: 11262463
    Abstract: The present invention provides a detector and an emission tomography device including the detector. The detector comprises: a scintillation crystal array comprising a plurality of scintillation crystals; and a photo sensor array, coupled to an end surface of the scintillation crystal array and comprising multiple photo sensors. At least one of the multiple photo sensors is coupled to a plurality of the scintillation crystals respectively. Surfaces of the plurality of the scintillation crystals not coupled to the photo sensor array are each provided with a light-reflecting layer, and a light-transmitting window is disposed in the light-reflecting layer on a surface among the surfaces adjacent to a scintillation crystal coupled to an adjacent photo sensor. The detector has DOI decoding capability. No mutual interference occurs during DOI decoding, and decoding is more accurate.
    Type: Grant
    Filed: June 4, 2018
    Date of Patent: March 1, 2022
    Assignee: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Siwei Xie, Xi Zhang, Fenghua Weng, Zhixiang Zhao, Yunlong Zan, Qiu Huang
  • Publication number: 20210389479
    Abstract: An apparatus for measuring photon information and a photon measurement device are disclosed.
    Type: Application
    Filed: August 26, 2019
    Publication date: December 16, 2021
    Applicant: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Zhixiang Zhao, Siwei Xie, Jingwu Yang, Rendong Zhang, Zheng Gong, Qiyu Peng
  • Patent number: 10838088
    Abstract: An apparatus, device and method for measuring a gain of a sensor are disclosed. The apparatus comprises a current detection circuit (122) and a processing circuit (124). An input end of the current detection circuit (122) is used for connecting to an output end of a sensor unit (110). The current detection circuit (122) is used for detecting a current signal output by the sensor unit and generating a corresponding detection signal. An input end of the processing circuit (124) is connected to an output end of the current detection circuit (122). The processing circuit (124) is used for calculating energy of dark events occurring in the sensor unit (110) according to the detection signal, generating an energy spectrogram of the dark event, and calculating a gain of the sensor unit (110) based on the energy spectrogram.
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: November 17, 2020
    Assignee: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Jianfeng Xu, Zhixiang Zhao, Qiu Huang, Qiyu Peng
  • Patent number: 10838089
    Abstract: An apparatus, device and method for measuring a breakdown voltage are disclosed. The apparatus comprises a controlled voltage source (122), a current detection circuit (124), and a processing circuit (126). The controlled voltage source (122) is used for providing a series of test bias voltages for the sensor unit (110). The current detection circuit (124) is used for detecting a current signal output by the sensor unit (110) and generating a corresponding detection signal. The processing circuit (126) is used for controlling the controlled voltage source (122) to provide a series of test bias voltages, calculating dark currents respectively corresponding to the series of test bias voltages on the basis of the detection signal, and determining a breakdown voltage of the sensor unit (110) on the basis of the series of test bias voltages and the dark currents.
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: November 17, 2020
    Assignee: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Jianfeng Xu, Zhixiang Zhao, Qiu Huang, Qiyu Peng
  • Publication number: 20200158893
    Abstract: The present invention provides a detector and an emission tomography device including the detector. The detector comprises: a scintillation crystal array comprising a plurality of scintillation crystals; and a photo sensor array, coupled to an end surface of the scintillation crystal array and comprising multiple photo sensors. At least one of the multiple photo sensors is coupled to a plurality of the scintillation crystals respectively. Surfaces of the plurality of the scintillation crystals not coupled to the photo sensor array are each provided with a light-reflecting layer, and a light-transmitting window is disposed in the light-reflecting layer on a surface among the surfaces adjacent to a scintillation crystal coupled to an adjacent photo sensor. The detector has DOI decoding capability. No mutual interference occurs during DOI decoding, and decoding is more accurate.
    Type: Application
    Filed: June 4, 2018
    Publication date: May 21, 2020
    Applicant: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Siwei Xie, Xi Zhang, Fenghua Weng, Zhixiang Zhao, Yunlong Zan, Qiu Fluang
  • Publication number: 20180292549
    Abstract: An apparatus, device and method for measuring a gain of a sensor are disclosed. The apparatus comprises a current detection circuit (122) and a processing circuit (124). An input end of the current detection circuit (122) is used for connecting to an output end of a sensor unit (110). The current detection circuit (122) is used for detecting a current signal output by the sensor unit and generating a corresponding detection signal. An input end of the processing circuit (124) is connected to an output end of the current detection circuit (122). The processing circuit (124) is used for calculating energy of dark events occurring in the sensor unit (110) according to the detection signal, generating an energy spectrogram of the dark event, and calculating a gain of the sensor unit (110) based on the energy spectrogram.
    Type: Application
    Filed: June 8, 2018
    Publication date: October 11, 2018
    Applicant: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Jianfeng Xu, Zhixiang Zhao, Qiu Huang, Zheng Gong, Qiyu Peng
  • Publication number: 20180292550
    Abstract: An apparatus, device and method for measuring a breakdown voltage are disclosed. The apparatus comprises a controlled voltage source (122), a current detection circuit (124), and a processing circuit (126). An output end of the controlled voltage source (122) is connected to an input end of a sensor unit (110). The controlled voltage source (122) is used for providing a series of test bias voltages for the sensor unit (110). An input end of the current detection circuit (124) is connected to an output end of the sensor unit (110). The current detection circuit (124) is used for detecting a current signal output by the sensor unit (110) and generating a corresponding detection signal. An input end of the processing circuit (126) is connected to an output end of the current detection circuit (124). An output end of the processing circuit (126) is connected to an input end of the controlled voltage source (122).
    Type: Application
    Filed: June 8, 2018
    Publication date: October 11, 2018
    Applicant: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Jianfeng Xu, Zhixiang Zhao, Qiu Huang, Zheng Gong, Qiyu Peng