Abstract: An approach is provided that computes electrical delay ranges that correspond to a number of shapes included in a hardware design layout. The electrical delay ranges are converted to shape tolerances for each of the shapes. A lithography mask of the hardware design layout is generated using the shape tolerances so that the images of the shapes in the mask produced lie within the shape tolerances that correspond to the respective shape.

Abstract: Systems and methods are disclosed to automatically synthesize a custom integrated circuit by encoding architecture level knowledge in a data model to generate and pass new constraints for physical synthesis of a chip specification uniquely customized to computer readable code. The system receives a look-ahead cost function during architecture optimization consistent with cost observed later in the flow after detailed physical synthesis is performed. The look-ahead cost function is generated from a prior iteration and supplied to a subsequent iteration through the data model.

Abstract: Partitioning of a design allows static timing analysis (STA), signal integrity, and noise analysis to be performed in parallel on multiple, less demanding, and more available hardware resources. Therefore, runtime and throughput of the analysis can be significantly shortened. Notably, the partitioning can include redundancy. That is, partitions are allowed to share objects in order to preserve the timing path completeness and design structural integrity. Due to this redundancy, these partitions can account for many constraints specifically imposed by STA and ensure minimal inter-partition data dependency during the analysis. Once these partitions are populated, analysis can be performed on those partitions in parallel to generate the same timing results as if the design had been analyzed flat as a single unit. Therefore, the performance of the analysis can be optimized without compromising the accuracy and quality of results.

Abstract: Slacks or timing weights are determined during implementation of an electronic design to improve design optimization. Multiple failings paths are optimized simultaneously by generalizing the notion of constraint relaxation used when computing slacks and timing weights to apply to portions of the design that can be independently optimized, rather than strictly adhering to clock domains and other coupled timing constraints used by conventional relaxation-based approaches. Improved calculation of slacks or timing weights better guides optimization algorithms.

Abstract: An analysis and design apparatus for semiconductor device, which utilizes a transistor model using accurate channel impurity concentration distribution are provided. The analysis and design apparatus includes a parameter setting portion that divides a channel region into a plurality of regions, and temporarily sets a plurality of impurity concentrations for the plurality of regions as a plurality of parameters. Further, the analysis and design apparatus includes an element characteristic calculation portion that values of electric characteristics of the transistor using surface potential that is calculated by solving a Poisson equation using a plurality of effective impurity concentrations. Moreover, the determination portion compares the calculated values with measured values read from a storage portion based on the structure information, and determines that the plurality of parameters for the transistor when the measured values correspond to the calculated values.

Abstract: In one embodiment, a method for routing of a circuit design netlist is provided. A processing cost is determined for each net in the netlist. A plurality of regions are defined for the target device such that the total processing costs of nets are balanced between the plurality of regions. Concurrent with routing one or more nets of a first one of the plurality of regions, one or more nets are routed in at least one other of the plurality of regions. Synchronization and subsequent routing are performed for unrouted nets of the netlist.

Abstract: A computer system selects a signal conductor from an electronic circuit design layout and assigns a first potential to the selected signal conductor. Next, the computer system assigns a second potential to other signal conductors included in the electronic circuit design layout. The computer system then selects a metal fill from the electronic circuit design layout, which is void from carrying an electrical signal, and generates a zero charge equation for the selected metal fill. The zero charge equation establishes that a total charge residing on the selected metal fill is equal to zero. The computer system includes the zero charge equation in a system of equations, which includes grid point potential equations, and solves the system of equations. In turn, the computer system computes capacitance values for the signal conductors based upon the system of equation solutions, and simulates the electronic circuit design layout using the computed capacitance values.

Abstract: A method includes receiving an identification of a plurality of circuit components to be included in an IC layout. Data are generated representing a first pattern to connect two of the circuit components. The first pattern has a plurality of segments. At least two of the segments have lengthwise directions perpendicular to each other. At least one pattern-free region is reserved adjacent to at least one of the at least two segments. Data are generated representing one or more additional patterns near the first pattern. None of the additional patterns is formed in the pattern-free region. The first pattern and the additional patterns form a double-patterning compliant set of patterns. The double-patterning compliant set of patterns are output to a machine readable storage medium to be read by a system for controlling a process to fabricate a pair of masks for patterning a semiconductor substrate using double patterning technology.

Abstract: A method includes receiving an integrated circuit chip size and determining a frame structure segment size based on the chip size. The frame structure segment size is less than the chip size. An initial shot layout having a chip count is established in which a number of shots, each including at least one frame structure segment and at least one chip, are arranged in vertically and horizontally aligned columns and rows. At least one additional shot layout is established in which at least one of a row or column of shots is offset from an adjacent row or column of shots. The initial shot layout is compared to the at least one additional shot layout, and a final shot layout is selected based in part on the total number of shots in the shot layout and has a final chip count that is greater than or equal to the initial chip count.

Abstract: Method for generating data for an original plate used during processing for illuminating the original plate and projecting an image of a pattern onto the original plate onto a substrate via a projection optical system. A two-dimensional transmission cross coefficient is calculated based on a function indicating a distribution of an intensity of light formed on a pupil plane of the projection optical system. An approximate aerial image is calculated based on the calculated two-dimensional transmission cross coefficient and a first pattern on an object plane of the projection optical system. A second pattern is generated having the first pattern on the object place and auxiliary patterns based on the approximate aerial image. The original plate data is generated by repeatedly calculating the approximate aerial image and generating a second pattern that is used as the first pattern on the object plane.

Abstract: Method of analyzing noise sensitivity of integrated circuits having at least one memory storage device and a noise sensitivity analyzer. In one embodiment, the noise sensitivity analyzer includes a circuit reservoir, a circuit parser and a circuit evaluator. The circuit reservoir is configured to receive and store a model of a circuit having at least one memory storage device to be analyzed. The circuit parser is configured to identify nodes of the model. The circuit evaluator is configured to apply a large test current to each of the nodes for multiple circuit states of the at least one memory storage device and determine which of the nodes are sensitive nodes.

Abstract: An integrated circuit including a first wire of a first level of wiring tracks, a second wire of a second level of wiring tracks, a third wire of a third level of wiring tracks, and a fourth wire located at a first distance from the second wire in the second level of wiring tracks. A first via connects the first and second wires at a first location of the second wire. A second via connects the second and third wires at the first location, the second via is approximately axially aligned with the first via. A third via connecting the third and fourth wires at a second location of the fourth wire. A fourth via connecting the first and fourth wires at the second location, the fourth via is approximately axially aligned with the third via. The second, third, and fourth vias, and the third and fourth wires form a path between the first and second wires redundant to the first via.

Abstract: A mechanism is provided for electrical yield enhancement retargeting of photolithographic layouts. Optical proximity correction is performed on a set of target patterns in order to produce a set of optical proximity correction mask shapes. A set of lithographic contours is generated for each of the set of optical proximity correction mask shapes. A determination is made of electrical yield sensitivities for at least one shape in a set of shapes in the set of target patterns. A determination is also made as to an amount and a direction of retargeting for each of the at least one shape in the set of shapes based on the electrical yield sensitivity of the shape. A new set of target patterns with retargeted edges is generated for each shape in the at least one shape based on the amount and the direction of retargeting.

Abstract: The LSI design apparatus adds diagnostic circuitry for micro diagnosis to a behavior level description. Based on behavior level design data for a normal system of a LSI, high level synthesis generates RTL design data and register information. Based on the register information, a unique address used by a micro diagnosis program is allocated to each register. Circuit components within the normal system are grouped together. Based on the result of the address allocation and the result of the grouping, a behavior description for diagnostic circuits constituting a diagnosis system for the LSI is generated and added to the behavior level design data for the normal system, resulting in behavior level design data in which the normal and diagnosis systems are integrated together.

Abstract: In a support apparatus for analysis and design of a semiconductor device, a function indicating an impurity concentration distribution in a channel region of a first transistor in a depth direction is set. A structure data indicating a structure of a transistor device and a measurement value of each of electric characteristics of the transistor are related. A Poisson's equation, which is express by using the function, is solved by using a depletion layer width as a variable to calculate a surface potential, and a first calculation value of the electric characteristic of the first transistor is calculated by using the surface potential. A determining section determines the function to indicate the impurity concentration distribution of a first transistor when a measurement value corresponding to a first structure data which indicates a structure of the first transistor, and the first calculation value are substantially coincident with each other.

Abstract: A metrology target design may be optimized using inputs including metrology target design information, substrate information, process information, and metrology system information. Acquisition of a metrology signal with a metrology system may be modeled using the inputs to generate one or more optical characteristics of the metrology target. A metrology algorithm may be applied to the characteristics to determine a predicted accuracy and precision of measurements of the metrology target made by the metrology system. Part of the information relating to the metrology target design may be modified and the signal modeling and metrology algorithm may be repeated to optimize the accuracy and precision of the one or more measurements. The metrology target design may be displayed or stored after the accuracy and precision are optimized.

Abstract: Methods and systems are provided for dynamically generating a hint set for enhanced reachability analysis in a sequential circuitry design that is represented by a Binary Decision Diagram (BDD). After determining a ranking of the BDD variables, they are sorted in the order of the ranking. The ranking is used to select some of the variables for use in creating hints for more efficiently performing the reachability analysis in a creating an equivalent sequential circuitry design.

Abstract: The present invention provides a simplified process for inference using a generic logic pattern corresponding to one or more generic functions provided by the hardware component. A circuit design is mapped into a plurality of interconnected hardware components, and a subset of the hardware components that matches a logic pattern are identified. Components of the subset are replaced with an inferred hardware component associated with the logic pattern. After matching the pattern, additional components connected to the inferred hardware component are iteratively analyzed to determine whether those additional connected components can be implemented using additional logic of the inferred hardware component.

Abstract: Approaches for generating a specification of a pipelined packet processor. A textual specification includes input and output packet formats, each specifying a format for each field in the packet and a plurality of actions for processing one or more fields of an input packet. Pipeline stages are determined from the actions in the textual specification, and each action is assigned to one of the pipeline stages. A shared variable is determined that is accessed by actions in at least two stages. An action in an initial stage writes the shared variable, an action in a last stage reads the shared variable. A hardware description is generated including the pipeline stages and assigned actions, a respective first-in-first-out queue between each adjacent pair of pipeline stages, a respective register for transferring the shared variable between each adjacent pair of the pipeline stages, and control logic for writing to and reading from each respective register.

Abstract: A method and apparatus is provided for the automatic creation of timing constraints that are based upon input interface timing parameters entered through a graphical user interface that is associated with the one or more input interfaces. Ideal timing constraints are created from the input interface timing parameters for the one or more input interfaces, thereby enabling the analysis of the input interface(s) without requiring explicit constraints to be defined by the designer of the input interface(s). Timing constraints may, therefore, be automatically generated by the designer without the need for the designer to possess any detailed knowledge of the associated constraint language parameters. Once created, the automatically generated timing constraints are graphically displayed to the designer for verification and/or modification. The automated process removes any potential for improperly defining the input constraint language parameters associated with the input interface(s).