Abstract: One or more embodiments described herein generally relate to systems and methods for calibrating an optical emission spectrometer (OES) used for processing semiconductor substrates. In embodiments herein, a light fixture is mounted to a plate within a process chamber. A light source is positioned within the light fixture such that it provides an optical path that projects directly at a window through which the OES looks into the process chamber for its reading. When the light source is on, the OES measures the optical intensity of radiation from the light source. To calibrate the OES, the optical intensity of the light source is compared at two separate times when the light source is on. If the optical intensity of radiation at the first time is different than the optical intensity of radiation at the second time, the OES is modified.

Abstract: A polarized Raman Spectrometric system for defining parameters of a polycrystalline material, said system comprising: a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory.

Abstract: Double-walled containment cells are described as may be used for storage, transport, and examination of a sample held within the cell by use of optical analysis techniques. A double-walled containment cell can include multiple types of windows that can be located as desired on the containment cells and thereby provide for optical access to a sample for multiple optical analysis techniques. Disclosed containment cells can be sized and designed for use with existing optical analysis systems, e.g., laser ablation, X-ray diffraction, spectral analysis (e.g., Raman spectroscopy, infrared spectroscopy, laser-induced breakdown spectroscopy, etc.), imaging analysis, etc.

Abstract: In some implementations, a device may receive spectroscopic data associated with a dynamic process. The device may generate a principal component analysis (PCA) model based on a first block of spectra from the spectroscopic data. The device may project a second block of spectra from the spectroscopic data to the PCA model generated based on the first block of spectra. The device may determine a value of a metric associated with the second block based on projecting the second block of spectra to the PCA model. The device may determine whether the dynamic process has reached an end point based on the value of the metric associated with the second block.

Abstract: A light condensing device for inspecting the quality inside fruits and vegetables, resolving problems in which manually holding fruits for inspection is inefficient and cannot be used in large-scale fruit packaging production. The device comprises a housing, a halogen lamp, a diaphragm, a plano-convex lens support a first plano-convex lens, a reflector lens fixing plate, a reflector, a plano-convex lens fixing plate, and a second plano-convex lens. The housing is a sealed and non-transparent housing. The halogen lamp is fixedly disposed at a left end of the housing, and extends into an inner portion of the housing. A pluggable diaphragm is disposed at the right side of the halogen lamp, and is used to guide a lighting direction of the halogen lamp. The diaphragm passes through the inner portion of the housing. The plano-convex lens support is fixedly disposed inside the housing at the right side of the diaphragm.

Abstract: A spectrometer is configured to form a spectrally resolved image of electromagnetic radiation from an electromagnetic radiation source. The spectrometer can include an optical guide device configured to guide electromagnetic radiation along an optical path. The optical guide device can include a first prism positioned in the optical path. The optical guide device can further include a focusing optic. The first prism can include at least one freeform prism surface that comprises at least some degree of cylindrical curvature having freeform polynomial terms formed thereon, which surface can be a substantially cylindrical, a substantially acylindrical, or a substantially flat surface having freeform polynomial terms formed thereon.

Abstract: An Attenuated total reflection measuring apparatus capable of Raman spectral measurement has an infrared optical instrument and a Raman module. The infrared optical instrument is disposed on an ATR prism side of a sample, and is provided to irradiate the ATR prism with an infrared light, and collect the infrared light from the ATR prism. The Raman module is disposed on a side opposite to the ATR prism side relative to the sample, and has a guide tube that outputs an excitation light from an excitation light source to the sample, and a lens portion disposed inside thereof. An end of the guide tube is in a position to push the sample to the ATR prism. The Raman module has a lens position adjustment mechanism that moves the lens portion along an optical axis, and a spectroscope that detects a Raman scattering light collected by the lens portion.

Abstract: A photonic integrated circuit including an input for receiving input electromagnetic radiation having a bandwidth greater than 60 nm; a spectral splitter splitting the electromagnetic radiation into a plurality of spectral channels; a modulator for modulating an amplitude and a phase of one or more of the spectral channels so as to form modulated outputs; and a spectral recombiner for combining the modulated outputs into a single output port outputting output electromagnetic radiation having the desired output spectral intensity profile shaped by and synthesized from the modulated outputs.

Abstract: In the disclosure provided herein, the described apparatus, systems and methods are directed to compensation of errors caused by the difference between the specular port and the sphere in a sphere-based color-measurement instrument, and improvement of the performance of the instrument. In one or more implementations, described approaches eliminate the need for hardware replacement, and therefore reduce costs associated with the operation of color measurement instruments.

Abstract: A sensor system includes an array of optical sensors on an integrated circuit and a plurality of sets of optical filters atop at least a portion of the array. Each set of optical filters is associated with a set of optical sensors of the array, with a set of optical filters including a plurality of optical filters, with each optical filter being configured to pass light in a different wavelength range. A first interface is configured to interface with the optical sensors and first processing circuitry that is configured to execute operational instructions for receiving an output signal representative of received light from the optical sensors and determining a spectral response for each set of optical sensors.

Abstract: The present invention includes a shell, a light emitter, a beam splitter, a convergent lens, an optical filter, a collimation unit, a discrete light detection unit, and a processing unit. The shell includes a sample well to contain a sample. The light emitter generates a detection beam towards the beam splitter, the detection beam is reflected by the beam splitter before being converged by the convergent lens onto the sample, and a Raman scattered beam is scattered from the sample. The Raman scattered beam respectively passes through the convergent lens, the beam splitter, the optical filter, and the collimation unit, allowing the collimation unit to collimate the Raman scattered beam into a collimated beam. The discrete light detection unit generates multiple light intensity signals according to the collimated beam received, and the processing unit generates a detection result according to the light intensity signals to help detect toxins.

Abstract: Systems and methods for determining properties of gemstones based, inter alia, on fluorescence properties of the gemstones, are presented. In one aspect, properties of at least one gemstone can be determined. In another aspect, a relationship between at least two gemstones can be determined. In one example, a first and a second gemstones are illuminated with illuminating light of at least one fluorescence-exciting wavelength range; corresponding at least one first fluorescence-emission light and at least one second fluorescence-emission light spectrum, emitted from the first and second gemstones respectively are detected and analyzed, either independently or by comparison, to determine the relationship between the first and second gemstones. In some examples, data indicative of visible light absorbance or three-dimensional models of the gemstones is combined with the fluorescence data to determine the properties or the relationship.

Abstract: Aspects of the present disclosure relate generally to systems and methods for use in the implementation and/or operation of quantum information processing (QIP) systems, and more particularly, to the correction of light-shift effects in trapped-ion quantum gates. Techniques are described for light-shift correction of single qubit gates when the gates are implemented using counter-propagating Raman laser beams and when the gates are implemented using co-propagating Raman laser beams. Moreover, techniques are also described for light-shift correction of two-qubit gates.

Abstract: Systems and methods are described for providing a representative, homogeneous, and planarized target for solid sample laser ablation. A method embodiment includes, but is not limited to, removing portions of a solid sample with an abrasive sampling system, the abrasive sampling system including at least one of a plurality of abrasive particles configured to hold the portions of the solid sample on an abrasive substrate between the abrasive particles or a texturized surface configured to hold the portions of the solid sample on the texturized surface; transferring the abrasive sampling system holding the portions of the solid sample to a laser ablation system; and ablating the portions of the solid sample held by the abrasive sampling system with the laser ablation system.

Abstract: A spectrometer includes: a dispersive element configured to split light; a detector comprising a plurality of pixels configured to receive the split light; an optical mask disposed in an optical path of the light between the dispersive element and the detector and comprising a plurality of light transmitting portions and a plurality of light blocking portions which are arranged alternately; and a driver configured to control a position of the optical mask or a position of the detector, and change a light incident area of each of the plurality of pixels to receive the light incident on the plurality of light transmitting portions of the optical mask.

Abstract: An optical underwater communication system is disclosed which includes a first transceiver and a second transceiver, each including one or more optical sources configured to provide light activated and deactivated according to a first bit stream, one or more sensor packages each comprising a plurality of photodetectors configured to receive light from the other transceiver and, in response, provide an output voltage signal and an output current signal, a detector configured to i) convert the output voltage signal and the output current signal to pulses associated with arrival of photons, and ii) count the number of pulses based on a predetermined timing sequence, an encoder configured to encode a message to be sent into a first bit stream, and a decoder configured to decode a message received into a second bit stream.

Abstract: The embodiments disclose a method for in-situ inspection and processing of an object including providing a pulsed laser source during the in-situ inspection of a surface of the object for modifying at least one of an optical, mechanical, or chemical property of a first region of the surface, directing the laser source through an optics path to shape, position and focus a pulsed laser beam at the first region, directing a probe illumination light beam to the optics path to produce a combined and collinear optical light path of the probe illumination light beam and the pulsed laser beam to focus and deliver the combined and collinear optical light path at a same region on the surface, superimposing a first focus spot of the probe illumination light beam over a second focus spot of the pulsed laser beam on an illuminated region of the surface.

Abstract: An apparatus for analysis of a sample of a material is disclosed. The apparatus has a body configured to accept the sample and a detector with a plurality of points. The detector is configured to provide a signal about the intensities of light received at the points. The apparatus also includes a slit array having a plurality of slits configured to collected light from the accepted sample and a collimating lens array having a plurality of lenses configured to receive the light from the slit array and collimate the collected light. The apparatus also includes a diffraction grating configured to diffract the light received from the collimating lens array and a focusing lens configured to focus the diffracted light of a common frequency on a common point of the detector.

Abstract: In some implementations, a device may identify, based on spectroscopic data, a pseudo steady state end point indicating an end of a pseudo steady state associated with the blending process. The device may identify a reference block and a test block from the spectroscopic data based on the pseudo steady state end point. The device may generate a raw detection signal associated with the reference block and a raw detection signal associated with the test block. The device may generate a statistical detection signal based on the raw detection signal associated with the reference block and the raw detection signal associated with the test block. The device may determine whether the blending process has reached a steady state based on the statistical detection signal.

Abstract: A method, a system, and a non-transitory computer readable medium for Raman spectroscopy. The method may include determining first acquisition parameters of a Raman spectroscope to provide a first acquisition set-up, the determining is based on at least one expected radiation pattern to be detected by a sensor of the Raman spectroscope as a result of an illumination of a first area of a sample, the first area comprises a first nano-scale structure, wherein at least a part of the at least one expected radiation pattern is indicative of at least one property of interest of the first nano-scale structure of the sample; wherein the first acquisition parameters belong to a group of acquisition parameters; setting the Raman spectroscope according to the first acquisition set-up; and acquiring at least one first Raman spectrum of the first nano-scale structure of the sample, while being set according to the first acquisition set-up.