Abstract: An array substrate includes a substrate, a first insulator layer on the substrate, a second insulator layer on the first insulator layer, a third insulator layer on the second insulator layer, and a first TFT and a second TFT on the substrate. The second TFT includes a second gate electrode on the first insulator layer, a second channel layer on the second insulator layer, and a second source electrode and a second drain electrode on the third insulator layer. The third insulator layer covers the second channel layer and defines a second source hole and a second drain hole.

Abstract: Non-planar semiconductor devices having omega-fins with doped sub-fin regions and methods of fabricating non-planar semiconductor devices having omega-fins with doped sub-fin regions are described. For example, a semiconductor device includes a plurality of semiconductor fins disposed above a semiconductor substrate, each semiconductor fin having a sub-fin portion below a protruding portion, the sub-fin portion narrower than the protruding portion. A solid state dopant source layer is disposed above the semiconductor substrate, conformal with the sub-fin region but not the protruding portion of each of the plurality of semiconductor fins. An isolation layer is disposed above the solid state dopant source layer and between the sub-fin regions of the plurality of semiconductor fins. A gate stack is disposed above the isolation layer and conformal with the protruding portions of each of the plurality of semiconductor fins.

Abstract: An optoelectronic semiconductor device is disclosed. The device comprises a plurality of stacked p-n junctions (e.g., multi junction device). The optoelectronic semiconductor device includes a n-doped layer disposed below the p-doped layer to form a p-n layer such that electric energy is created when photons are absorbed by the p-n layer. Recesses are formed on top of the p-doped layer at the top of the plurality of stacked p-n junctions. The junctions create an offset and an interface layer is formed on top of the p-doped layer at the top of the plurality stacked p-n junctions. The device also includes a window layer disposed below the plurality stacked p-n junctions. In another aspect, one or more optical filters are inserted into a device to enhance its efficiency through photon recycling. The device can be fabricated by epitaxial growth on a substrate and removed from the substrate through a lift off process.

Abstract: A multi-junction optoelectronic device and method of manufacture are disclosed. The method comprises providing a first p-n structure on a substrate, wherein the first p-n structure comprises a first base layer of a first semiconductor with a first bandgap such that a lattice constant of the first semiconductor matches a lattice constant of the substrate, and wherein the first semiconductor comprises a Group III-V semiconductor. The method includes providing a second p-n structure, wherein the second p-n structure comprises a second base layer of a second semiconductor with a second bandgap, wherein a lattice constant of the second semiconductor matches a lattice constant of the first semiconductor, and wherein the second semiconductor comprises a Group IV semiconductor. The method also includes lifting off the substrate the multi-junction optoelectronic device having the first p-n structure and the second p-n structure, wherein the multi-junction optoelectronic device is a flexible device.

Abstract: According to one embodiment, a display device includes a first line which is arranged across a display portion, and includes a first end portion and a second end portion located at a non-display portion such that the display portion is located between the first and second end portions, a first switch electrically connected to the first end portion, a second switch electrically connected to the second end portion, a first terminal electrically connected to the first end portion via the first switch, and a second terminal electrically connected to the second end portion via the second switch.

Abstract: A three-dimensional memory device includes an alternating stack of insulating layers and electrically conductive layers located over a substrate, memory stack structures extending through the alternating stack, where each of the memory stack structures contains a respective memory film and a respective vertical semiconductor channel, drain regions contacting an upper end of a respective one of the vertical semiconductor channels, first contact via structures directly contacting a first subset of the drain regions and each having a first horizontal cross-sectional area, and second contact via structures directly contacting a second subset of the drain regions and each having a second horizontal cross-sectional area that is greater than the first horizontal cross-sectional area.

Abstract: A semiconductor structure includes a first fin, a second fin, a first gate, a second gate, at least one spacer, and an insulating structure. The first gate is present on the first fin. The second gate is present on the second fin. The spacer is present on at least one side wall of at least one of the first gate and the second gate. The insulating structure is present between the first fin and the second fin, in which the spacer is substantially absent between the insulating structure and said at least one of the first gate and the second gate.

Abstract: An analog high gain transistor is disclosed. The formation of the analog high gain transistor is highly compatible with existing CMOS processes. The analog high gain transistor includes a double well, which includes the well implants of the low voltage (LV) and intermediate voltage (IV) transistors. In addition, the analog high gain transistor includes light doped extension regions of IV transistor and a thin gate dielectric of the LV transistor.

Abstract: The application provides an OLED device, a manufacturing method thereof, and a display device, which reduce or eliminate color cast in an image displayed by an existing OLED device due to different lifetimes of organic materials for light emitting layers emitting light of different colors in the OLED device. In the OLED device, a luminous efficiency regulator is disposed between a cathode and a light emitting layer of at least one sub-pixel, and a vibration characteristic peak of the luminous efficiency regulator falls within a wavelength range of light emitted from the corresponding light emitting layer, such that attenuation rates of lighting luminance of the light emitting layers emitting light of different colors are kept consistent with each other over time.

Abstract: A charge balance (CB) field-effect transistor (FET) device may include a CB layer defined in a first epitaxial (epi) layer having a first conductivity type. The CB layer may include a set of CB regions having a second conductivity type. The CB FET device may further include a device layer defined in a device epi layer having the first conductivity type disposed on the CB layer. The device layer may include a highly-doped region having the second conductivity type. The CB FET device may also include a CB bus region having the second conductivity type that extends between and electrically couples a CB region of the set of CB regions of the CB layer to the highly-doped region of the device layer.

Abstract: Embodiments of staircase structures for three-dimensional (3D) memory devices double-sided routing are disclosed. In an example, a 3D memory device includes a substrate, a memory stack disposed above the substrate and including conductor/dielectric layer pairs stacked alternatingly, and an array of memory strings each extending vertically through an inner region of the memory stack. An outer region of the memory stack includes a first staircase structure disposed on the substrate and a second staircase structure disposed on the substrate. First edges of the conductor/dielectric layer pairs in the first staircase structure along a vertical direction away from the substrate are staggered laterally toward the array of memory strings. Second edges of the conductor/dielectric layer pairs in the second staircase structure along the vertical direction away from the substrate are staggered laterally away from the array of memory strings.

Abstract: A display device may include at least one optical control unit including first refractive index layers, second refractive index layers, and an optical compensation layer. The second refractive index layers may be stacked in an alternating manner with the first refractive index layers and may have a refractive index different from that of the first refractive index layers. The optical compensation layer may be disposed at least on the uppermost refractive index layer of the first and second refractive index layers to be in contact with the uppermost refractive index layer or below the lowermost refractive index layer of the first and second refractive index layers to be in contact with the lowermost refractive index layer. The optical compensation layer may have a thickness less than those of the first and second refractive index layers.

Abstract: Display panel, repair method, and display device are provided. The display panel includes: a base substrate; an array substrate including driving thin film transistors (TFTs); first electrodes connected to the TFTs in a one-to-one correspondence; a light-emitting structure including first light-emitting diodes (LEDs) and second LEDs; a second electrode; and one of first and second insulating layers. In each sub-pixel unit, a first LED electrode and a third LED electrode of a first LED is connected to a corresponding first electrode and the second electrode, respectively; the first insulating layer is formed between a second LED electrode of a second LED and the corresponding first electrode, and a fourth LED electrode of the second LED is connected to the second electrode; and the second insulating layer is formed between the fourth LED electrode and the second electrode, and the second LED electrode is connected to the corresponding first electrode.

Abstract: A fin field device structure and method for forming the same are provided. The FinFET device structure includes a protruding structure extending from a substrate and an anti-punch through implant (APT) region formed in the protruding structure. The FinFET device structure includes a barrier layer formed on the APT region, and the barrier layer has a width in a horizontal direction. The width gradually tapers from a bottom of the barrier layer to a top of the barrier layer.

Abstract: A semiconductor device includes a semiconductor body comprising a first surface and an edge surface, a contact electrode formed on the first surface and comprising an outer edge side, and a passivation layer section conformally covering the outer edge side of the contact electrode. The passivation layer section is a multi-layer stack comprising a first layer, a second layer, and a third layer. Each of the first, second and third layers comprise outer edge sides facing the edge surface and opposite facing inner edge sides. The outer edge side of the contact electrode is disposed laterally between the inner edge sides and the outer edge sides of each layer. The inner and outer edge sides of the third layer are closer to the outer edge side of the electrode than the respective inner and outer edge sides of the first and second layer.

Abstract: The present disclosure relates to a resistive random access memory (RRAM) device architecture, that includes a thin single layer of a conductive etch-stop layer between a lower metal interconnect and a bottom electrode of an RRAM cell. The conductive etch-stop layer provides simplicity in structure and the etch-selectivity of this layer provides protection to the underlying layers. The conductive etch stop layer can be etched using a dry or wet etch to land on the lower metal interconnect. In instances where the lower metal interconnect is copper, etching the conductive etch stop layer to expose the copper does not produce as much non-volatile copper etching by-products as in traditional methods. Compared to traditional methods, some embodiments of the disclosed techniques reduce the number of mask step and also reduce chemical mechanical polishing during the formation of the bottom electrode.

Abstract: A process of forming a nitride semiconductor device is disclosed. The process includes steps of: (a) forming insulating films on a semiconductor stack, where the insulating films include a first silicon nitride (SiN) film, a silicon oxide (SiO2) film, and a second SiN film; (b) forming an opening in the insulating films; (c) widening the opening in the SiO2 film; (d) forming a recess in the semiconductor stack using the insulating films as a mask; (e) growing a doped region within the recess and simultaneously depositing the nitride semiconductor material constituting the doped region on the second SiN film; and (f) removing the nitride semiconductor material deposited on the second SiN film and the second SiN film by removing the SiO2 film.

Abstract: A semiconductor device includes a plurality of high-voltage insulated-gate field-effect transistors arranged in a matrix form on the main surface of a semiconductor substrate and each having a gate electrode, a gate electrode contact formed on the gate electrode, and a wiring layer which is formed on the gate electrode contacts adjacent in a gate-width direction to electrically connect the gate electrodes arranged in the gate-width direction. And the device includes shielding gates provided on portions of an element isolation region which lie between the transistors adjacent in the gate-width direction and gate-length direction and used to apply reference potential or potential of a polarity different from that of potential applied to the gate of the transistor to turn on the current path of the transistor to the element isolation region.

Abstract: At edge termination region, a trench is disposed near an interface of an active region. Inside the trench, an embedded insulating film is embedded, and inside the embedded insulating film, a FP long in a direction of depth is disposed. The FP curves outwardly away from an inner sidewall of the trench as a depth from a base front surface increases. At least near a bottom end of the FP, a distance between the FP and the inner sidewall of trench is greater than a width of the groove. The FP is connected to a front surface electrode that extends on the embedded insulating film. As a result, breakdown voltage can be enhanced, adverse effects of the surface charge can be reduced, and chip size can be further reduced.

Abstract: An organic light emitting diode display is disclosed. The organic light emitting diode display includes a first substrate and a second substrate facing each other. The first substrate includes an anode included in an organic light emitting diode, an auxiliary electrode, a barrier on the auxiliary electrode, a bank layer including a first opening exposing at least a portion of the anode and a second opening simultaneously exposing at least a portion of the auxiliary electrode and at least a portion of the barrier, a cathode included in the organic light emitting diode and divided by the barrier, a contact electrode disposed on the cathode and divided by the barrier, and a protective layer interposed between the cathode and the contact electrode. The contact electrode and the power line directly contact each other.