Abstract: A sensor device determines an alternating voltage between a conductor and a reference potential, particularly of a switch point drive. In order to reduce the installation cost and effort required to verify the absence of reaction, the sensor device has a sensor element, which is configured for capacitive coupling to the conductor, and a resistance element, which is provided for connection to the reference potential and is connected in series together with the sensor element. The sensor device further has a processing device, which is configured to determine a voltage drop via the resistance element.

Abstract: An apparatus and methods for detecting drill pipe connection joints via magnetic flux leakage. An apparatus may include a magnet operable to magnetize a portion of a drill string extending out of a wellbore that extends into a subterranean formation below a drill rig and a sensor operable to facilitate magnetic flux measurements indicative of an amount of magnetic flux that leaked from the drill string along the magnetized portion of the drill string. The apparatus may further comprise a processing device having a processor and a memory storing a computer program code, wherein the processing device is operable to receive the magnetic flux measurements and detect a connection joint between adjacent drill pipes of the drill string based on the magnetic flux measurements.

Abstract: An integrated circuit includes a first bandgap voltage reference sub-circuit configured to provide a first bandgap reference voltage; a second bandgap voltage reference sub-circuit configured to provide a second bandgap reference voltage; a voltage regulator sub-circuit configured to derive a first supply voltage using the first bandgap reference voltage and a second supply voltage using the second bandgap reference voltage; a bandgap comparator sub-circuit configured to derive a first internal voltage and a second internal voltage from the first supply voltage, wherein the first internal voltage decreases at a higher rate than the second internal voltage with respect to a decreasing first supply voltage, wherein the bandgap comparator sub-circuit is configured indicate which of the first and the second internal voltages is larger; and a comparator sub-circuit configured to indicate whether a difference between the first supply voltage and the second supply voltage is larger than a predefined threshold.

Abstract: Various means for improvement in signal-to-noise ratio (SNR) for a magnetic field sensor are disclosed for low power and high resolution magnetic sensing. The improvements may be done by reducing parasitic effects, increasing sense element packing density, interleaving a Z-axis layout to reduce a subtractive effect, and optimizing an alignment between a Z-axis sense element and a flux guide, etc.

Abstract: A system for diagnosing a squib loop in a restraint control module. The system may include a first amplifier, a capacitor, a second amplifier. The first amplifier may have a first input connected to a first side of the squib and a second input connected to a second side of the squib. The output of the first amplifier may generate an output voltage corresponding to the voltage drop across the squib. The capacitor may be connected in series with the output of the first amplifier and the output of the first amplifier may be connected to a first side of the capacitor. The second amplifier having a first input connected to a second side of the capacitor. A second input of the second amplifier may be connected to a reference voltage. The second amplifier may be configured with a feedback loop to generate a gain output.

Abstract: A voltage generator circuitry includes first to third bipolar transistors having commonly-connected base electrodes, first and second current mirror circuitries, first and second differential amplifiers; a first resistor; and a current-voltage conversion circuitry. The first current mirror circuitry supplies currents to the first to third bipolar transistors and to the current-voltage conversion circuitry. The second current mirror circuitry supplies currents to the first to third bipolar transistors, and s to the current-voltage conversion circuitry. The first and second differential amplifiers control the first and second current mirror. The current-voltage conversion circuitry converts a sum current of the first and second currents into an output voltage.

Abstract: This application relates to an absolute position detection device and detection method of a rotating body using a magnetic material. The device may include magnets coupled to a rotating body and configured to rotate together and having n pole pairs, wherein n is a natural number and (n+1) magnetic materials arranged adjacent to the magnets, spaced apart from each other by a predetermined interval, and configured to rotate together with the rotating body. The device may also include a first Hall sensor spaced apart from the magnets, installed to allow the magnetic materials to rotate in a space between the first Hall sensor and the magnets and configured to output a first signal based on the magnets when the magnetic materials approach the first Hall sensor. The device may further include a controller configured to measure an absolute position of the rotating body using the first signal.

Abstract: A signal analysis method is described. The signal analysis method comprises the following steps. An output signal is received from a device under test. A sampling point density is received and/or the sampling point density is determined based on the output signal. A response function of the device under test is determined based on the output signal and based on the sampling point density. The sampling point density represents a number of sampling points per frequency interval for determining the response function. The response function characterizes at least one property of the device under test as a function of frequency. Moreover a measurement system for determining a response function of a device under test is described.

Abstract: Disclosed is a distance measuring device, in particular for dielectric or metallic target objects, said device comprising a sensor with a resonance chamber and a resonance structure. The resonance structure has an element consisting of a dielectric material which has a narrowing at the edge, the resonance frequency of the resonance chamber being dependent on the distance between the element and a target object.

Abstract: A method, a system, and a computer program for executing high resolution spectrum monitoring. A sensor receives an input signal having a varying frequency content over time. One or more samples of the received input signal are sampled. The samples of the received input signal include one or more swept signal samples generated by sweeping, using a center frequency of the sensor, the received input signal across an entire frequency spectrum associated with the received input signal. Sampling of the samples of the received signal is performed while performing the sweeping. The signal samples are processed.

Abstract: A receiver coil assembly for a geophysical survey system comprising: a first receiver coil supported by a first tubular frame that forms a first loop; a second receiver coil supported by a second tubular frame that forms a second loop; releasable connectors connecting the first tubular frame to the second tubular frame with a sensing axis of the first receiver coil having a different orientation than a sensing axis of the second receiver coil.

Abstract: A system for testing a subject transistor with constant power. The system may include an amplifier, a measurement voltage source, and a exercise voltage source. The amplifier may have an output connected to a gate of the subject transistor. The amplifier may have a first input and a second input. The measurement voltage source may be connected to the first input of the amplifier for use in measuring characteristics of the subject transistor. The exercise voltage source may be connected to the first input of the amplifier for exercising the subject transistor. The second input of the amplifier may be connected to a source of the subject transistor through a resistor.

Abstract: A support frame is provided that includes an upper plate, a lower plate, side support members, an upper support structure, and a lower support structure. The upper plate defines a first inner surface and an opposed first outer surface. The lower plate defines a second inner surface and an opposed second outer surface. A TEM test space is defined between the first inner surface and the second inner surface. The side support members are disposed between the upper plate and the lower plate proximate a periphery of the test space. The upper support structure is coupled to and supports the upper plate. The upper support structure extends from the first outer surface of the upper plate. The lower support structure is coupled to and supports the lower plate. The lower support structure extends from the second outer surface of the lower plate.

Abstract: A method and system for diagnosing a squib loop in a restraint control module using a transient response is disclosed in the present application. The system may be used with a low energy actuator (LEA) which is primarily an inductive device. A diagnostic current may be applied to the squib loop for a diagnostic test period and the voltage between the feed line terminal and the return line terminal or the voltage between the return line terminal and the feed line terminal can be monitored at a specific time or times during the test period for the expected response (e.g. peak voltage, rise rate, etc). The current may also be reversed to check the correct polarity of a diode in the LEA.

Abstract: A system and method for direct and/or active detection and monitoring of civil engineering or other infrastructural structures, and in a preferred embodiment, for hydrocarbon leakage in oil and gas pipelines, storage structures, and/or transportation structures. Particularly, the system and method relate to various nanocomposite sensor coating and data gathering systems. In one embodiment, the apparatus includes a single measurement sensor coating (thin film) sensor. Other embodiments relate to multiple measurement sensor coating systems. The sensor is comprised of either a discrete conductive filament layer, or a single or multiple mesh of interwoven filaments of conductive material in one direction and nonconductive material in a perpendicular direction, as a substrate coated with sensitive coating materials to form a sensor grid. Various embodiments of the sensor coating and their applications are also disclosed.

Abstract: Devices, systems, and methods for measurement of parameters of electric power transmission lines can improve electric power usage, while wireless circuitry can provide communication from field-located devices. Connection to draw electrical power from the transmission line can be distinct from connection to sense line parameters.

Abstract: Wear detection in a plain bearing is proposed, with a first component comprising at least one sliding element of plastics material, which has a sliding surface for mobile guidance of a second component relative to the first component. The first component, in particular the sliding element, has a device for detecting wear in a critical region of the sliding element, in particular at the sliding surface thereof, with a transponder and with a detector element which cooperates with the transponder and is arranged on the sliding element. The detector element changes the behavior of the transponder when a predetermined degree of wear is reached in the critical region of the plastics sliding element, such that the wear-induced change is wirelessly detectable. The system and detection method are particularly advantageous for plain bearings for a lubricant-free bearing arrangement.

Abstract: A sensor device includes at least one first sensor element that generates a first sensor signal based on sensing a varying magnetic field; at least one second sensor element that generates a second sensor signal based on sensing the varying magnetic field; a signal tracking circuit that generates a trigger signal having trigger pulses that are generated based on crossings of the first sensor signal with an adaptive threshold and extracts vibration relevant information using the first sensor signal and the second sensor signal; an output controller that generates an output signal having output pulses that are triggered by the trigger pulses during a non-vibration event and suppress the output pulses during an entire duration of a vibration event; and a vibration detection circuit that detects the vibration event based on the extracted vibration relevant information and indicates the vibration event to the output controller.

Abstract: A testing probe structure for wafer level testing semiconductor IC packaged devices under test (DUT). The structure includes a substrate, through substrate vias, a bump array formed on a first surface of the substrate for engaging a probe card, and at least one probing unit on a second surface of the substrate. The probing unit includes a conductive probe pad formed on one surface of the substrate and at least one microbump interconnected to the pad. The pads are electrically coupled to the bump array through the vias. Some embodiments include a plurality of microbumps associated with the pad which are configured to engage a mating array of microbumps on the DUT. In some embodiments, the DUT may be probed by applying test signals from a probe card through the bump and microbump arrays without direct probing of the DUT microbumps.

Abstract: A measurement method of subcell photocurrents and a matching degree of the subcell photocurrents of a multi-junction photovoltaic cell is provided. The measurement method includes measuring an I-V characteristic of the multi-junction photovoltaic cell; and measuring currents corresponding to respective current steps in an I-V curve to obtain approximate values of short-circuit currents of subcells in the multi-junction photovoltaic cell, and then calculating a mismatching degree of the multi-junction photovoltaic cell using step currents. According to the measurement method, a current mismatching degree of the multi-junction photovoltaic cell is obtained by calculating the mismatching degree of the step currents occurring in the I-V curve. The measurement method is rapid and simple, the measurement method avoids complicated and time-consuming processes where the subcell photocurrents are calculated based on a standard light source spectrum integral with bias lights applied.