Patents Examined by Akbar H. Rizvi
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Patent number: 11999612Abstract: Provided is an optical micro-electro-mechanical system (MEMS) based monitoring system, comprising: a broadband light source, a tunable optical filter (TOF), an optical etalon, a plurality of optical receivers, a plurality of optical couplers, and a plurality of optical MEM sensors; the TOF is configured to capture a transmission, reflection or interference spectrum of the optical MEMS sensors; wherein the peak or depression wavelength in the transmission, reflection or interference spectrum corresponds to a parameter of the pressure, temperature or stress, and the peak or depression wavelength can be obtained by comparing the spectrum with the periodic spectrum of the optical etalon, the optical etalon has an absolute wavelength mark; and the optical MEMS sensor comprises an optical MEMS resonator. The parameter of the pressure, temperature or stress can be obtained by the peak or depression wavelength in the transmission, the reflection or the interference spectrum of the optical MEMS sensor.Type: GrantFiled: November 14, 2021Date of Patent: June 4, 2024Inventor: Naiqian Han
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Patent number: 11940562Abstract: Provided is a sensor apparatus including: a laser ranging device that scans a predetermined scan range with a laser light such that at least a part of the emitted laser light passes through a region including a predetermined detection region; and a reflection mirror that reflects at least a part of the laser light to a direction not parallel to an incident direction and is provided so that the laser light occurring after reflection passes through the detection region.Type: GrantFiled: February 22, 2019Date of Patent: March 26, 2024Assignee: NEC CORPORATIONInventors: Jun Uchimura, Hiroshi Takahashi
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Patent number: 11940349Abstract: Disclosed is a plane grating calibration system, comprising an optical subsystem, a frame, first vibration isolator, a vacuum chuck, a workpiece stage, second vibration isolator, a base platform and a controller; the optical subsystem is mounted on the frame, and the frame is isolated from vibration by the first vibration isolator; the vacuum chuck is rotatably mounted on the workpiece stage, the workpiece stage is positioned on the base platform, and the base platform is isolated from vibration by the second vibration isolator. A displacement interferometer is integrated into the optical subsystem, and the entire optical subsystem adopts a method of sharing a light source, thereby avoiding the problems of low wavelength precision and poor coherence of separate light sources.Type: GrantFiled: May 13, 2020Date of Patent: March 26, 2024Assignees: TSINGHUA UNIVERSITY, BEIJING U-PRECISION TECH CO., LTD.Inventors: Leijie Wang, Ming Zhang, Yu Zhu, Jiankun Hao, Xin Li, Rong Cheng, Kaiming Yang, Jinchun Hu
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Patent number: 11937912Abstract: A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.Type: GrantFiled: April 21, 2021Date of Patent: March 26, 2024Assignee: Hyperspectral Corp.Inventors: David M. Palacios, Harry Hopper
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Patent number: 11925456Abstract: A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.Type: GrantFiled: October 1, 2020Date of Patent: March 12, 2024Assignee: Hyperspectral Corp.Inventors: David M. Palacios, Harry Hopper
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Patent number: 11913886Abstract: This disclosure describes an example architecture for providing a delay line for optical techniques. The delay line architecture includes a focusing element that has a focal axis disposed parallel to its length. The line of symmetry provided by the focal axis obviates path-length-dependent aberrations caused by the off-axis beam translations. The systems described herein also provide varying geometries of movable mirrors, including a galvanometer mirror and a rotating polygonal mirror. The systems and methods described herein also provide techniques for generating and detecting coherent Raman spectra using a picosecond probe pulse.Type: GrantFiled: June 16, 2020Date of Patent: February 27, 2024Assignee: Georgia Tech Research CorporationInventors: Marcus Cicerone, Xavier Audier