Patents Examined by Amanda Hoolahan
  • Patent number: 6671973
    Abstract: A method of adjusting the relative attitude of a work in a surface texture measuring instrument for measuring the work having a feature region includes a measurement step of performing measurement of the feature region along an X-axis direction after positioning a detector in a Y-axis direction and the X-axis direction, a determination step of repeating the measurement which is performed while changing the position in the X-axis direction, and a step of adjusting the attitude of the work on the basis of the amount of relative attitude correction. Therefore, the direction of the feature region in the work is adjusted so as to be parallel to the Y axis.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: January 6, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Fumihiro Takemura, Minoru Katayama