Abstract: A semiconductor storage device includes a first memory chip having a first memory cell, a first word line connected to the first memory cell, a first voltage step-up circuit, and a second voltage step-up circuit, and a second memory chip having a second memory cell, a second word line connected to the second memory cell, a third voltage step-up circuit, and a fourth voltage step-up circuit. During a read operation executed in the first memory chip, the first, second, and fourth voltage step-up circuits supply a first voltage to the first word line, and when a voltage of the first word line reaches a predetermined voltage, the first voltage step-up circuit continues to supply the first voltage to the first word line, and the second voltage step-up circuit and the fourth voltage step-up circuit stop supplying the first voltage to the first word line.

Abstract: A semiconductor memory device includes i first word lines connected to the i first memory cells, i second word lines connected to the i second memory cells, a driver capable of supplying voltage to each of the i first word lines and each of the i second word lines, and a logic control circuit controlling both a write operation including a verify operation and a read operation including a verify operation. In the semiconductor memory device, when an order of performing a sense operation for determining whether or not a threshold voltage of the k-th first memory cell has reached a j-th threshold voltage in the verify operation is different from that of in the read operation, a voltage applied to the k-th first word line in the verify operation is different from a voltage applied to the k-th first word line in the read operation.

Abstract: The present technology relates to an electronic device. According to the present technology, a memory device having improved verify accuracy may include a memory block including memory cells, a read and write circuit including a plurality of page buffers, a current sensing circuit configured to perform a verify operation of comparing sensing voltages with a reference voltage, and a control logic configured to control the current sensing circuit to perform the verify operation. The control logic controls performing a first verify operation on each of page buffer groups having a same logical group number, and performing a second verify operation on each of page buffer groups having a same physical group number, and the current sensing circuit outputs a verify pass signal in response to both results of the first verify operation and the second verify operation satisfying a pass criterion.

Abstract: A non-volatile memory includes a memory cell region including an outer region proximate a first end of the memory cell region and an inner region separated from the first end by the outer region, first and second bit lines, an outer memory cell string including memory cells connected to an outer pillar extending vertically upward through the outer region, and an inner memory cell string including memory cells connected to an inner pillar extending vertically upward through the inner region, and a data input/output (I/O). The data I/O circuit includes a page buffer circuit that connects the first bit line during a first read operation directed to memory cells of the outer memory cell string, and connects the second bit line during a second read operation directed to memory cells of the inner memory cell string, and a read voltage determination unit that selects a first optimal read voltage used during the first read operation, and a second optimal read voltage used during the second read operation.

Abstract: A magnetic recording array includes a plurality of spin elements, and a shared transistor connected to a first spin element and a second spin element adjacent to each other, in which each of the plurality of spin elements includes a wiring and a laminate including a first ferromagnetic layer laminated on the wiring, the shared transistor includes a first gate, a second gate, a first region, a second region, and a third region, in a plan view in a laminating direction of the laminate, the first region is sandwiched between the first gate and the second gate, the second region together with the first region sandwiches the first gate, and the third region together with the first region sandwiches the second gate, and one of the second region and the third region is connected to the first spin element, and the other is connected to the second spin element.

Abstract: A semiconductor device comprises: a first or a second path configured to transmit a first signal which swings between a ground level and a first level, a third path configured to transmit a second signal which swings between the ground level and a second level lower than the first level, a transmitter configured to output received the first signal through the first or second path as the second signal to the third path, and initialize in response to an enable signal, and a receiver configured to output received the second signal through the third path as the first signal through the first or second path, determine level of the second signal through a reference level that is regulated according to a fed-back level of an output terminal thereof, and initialize in response to the enable signal.

Abstract: Disclosed are a method and apparatus for determining mismatch of a sense amplifier, a storage medium, and an electronic equipment, relating to the field of integrated circuit technology. The method for determining mismatch of a sense amplifier includes: determining a first signal threshold on a first bit line when a first memory cell executes write and read operations; determining a second signal threshold on a second bit line when a second memory cell executes write and read operations; and determining, according to the first signal threshold and the second signal threshold, whether the sense amplifier is mismatched. A method for determining whether the sense amplifier is mismatched is provided.

Abstract: A sense component of a memory device in accordance with the present disclosure may selectively employ components having a relatively high voltage isolation characteristic in a portion of the sense component associated with relatively higher voltage signals (e.g., signals associated with accessing a ferroelectric random access memory (FeRAM) cell), and components having a relatively low voltage isolation characteristic in a portion of the sense component associated with relatively lower voltage signals (e.g., input/output signals according to some memory architectures). Voltage isolation characteristics may include isolation voltage, activation threshold voltage, a degree of electrical insulation, and others, and may refer to such characteristics as a nominal value or a threshold value. In some examples the sense component may include transistors, and the voltage isolation characteristics may be based at least in part on gate insulation thickness of the transistors in each portion of the sense component.

Abstract: In some examples, separate main I/O (MIO) lines may be used for writing to different banks of a memory array. In some examples, separate MIO lines may be used for writing to and reading from different memory banks. In some examples, the MIO lines for some banks may be used as shield lines between the MIO lines for other banks.

Abstract: In certain aspects, a circuit for multi-mode calibration can include a resistor input. The circuit can also include a first comparator connected to the resistor input and to a first plurality of voltage sources. The circuit can also include a first pull-up driver. The circuit can further include a logic pull-up code generator to calibrate the first pull-up driver. The circuit can additionally include a replica of the first pull-up driver. The circuit can also include a first pull-down driver and a second comparator connected to the replica, the first pull-down driver, and a second plurality of voltage sources. The second comparator can compare a voltage of a middle point between the first pull-down driver and the second pull-up driver to one of the second plurality of voltage sources. The circuit can further include a logic pull-down code generator.

Abstract: The present disclosure includes apparatuses, methods, and systems for three-state programming of memory cells. An embodiment includes a memory having a plurality of memory cells, and circuitry configured to program a memory cell of the plurality of memory cells to one of three possible data states by applying a voltage pulse to the memory cell, determining whether the memory cell snaps back in response to the applied voltage pulse, and applying an additional voltage pulse to the memory cell based on the determination of whether the memory cell snaps back.

Abstract: A storage device includes a storage circuit, a reading circuit, a first check circuit, and a second check circuit. The storage circuit includes a plurality of sense amplifier arrays and a plurality of storage unit arrays which are arranged alternately. A first data wire is electrically connected to each of the sense amplifier arrays. The reading circuit is configured to read data on the first data wire. Both the first check circuit and the second check circuit are electrically connected to the reading circuit. The reading circuit is configured to transmit a part of the read data to the first check circuit for error checking and/or correcting, and transmit another part of the read data to the second check circuit for error checking and/or correcting. The data transmitted to the first check circuit and the data transmitted to the second check circuit are respectively from adjacent sense amplifier arrays.

Abstract: A circuit and method for data transmission, and a storage apparatus are provided. A mode register decoding module is configured to generate a mode register unselected enable signal, a mode register read enable signal, or a mode register write enable signal according to received mode register address information, a mode register read control signal, or a mode register write control signal. A mode register read-write module is configured to: cache data on data line according to mode register write enable signal in write state, and output selected data and unselected data after setting the unselected data to zero according to the mode register read enable signal and the mode register unselected enable signal in a read state. The logic gate module is configured to calculate an OR value of the data outputted by each mode register read-write module in the read state and output a calculation result.

Abstract: The present invention relates generally to the field of semiconductor memories and in particular to memory cells comprising a static random access memory (SRAM) bitcell (100). Leakage current in the read path is reduced by connecting a read access transistor terminal either to GND or VDD during read access or write access and idle state. The SRAM cell inverters may be asymmetrical in size. The memory may comprise various boost circuits to allow low voltage operation or application of distinguished supply voltages.

Abstract: The present disclosure includes apparatuses and methods related to selectable trim settings on a memory device. An example apparatus can store a number of sets of trim settings and select a particular set of trims settings of the number of sets of trim settings based on desired operational characteristics for the array of memory cells.

Abstract: Several embodiments of reclaimable semiconductor device packages and assemblies are disclosed herein. A semiconductor device assembly (100) includes a package (101) having a housing (102) and a package contact (104) arranged to receive a signal indicative of a reclamation state. A plurality of modules of semiconductor dies (106) are located within the housing and electrically coupled to the package contact (104). The dies (106) of the first and second modules dies are configured to store a module configuration state. The first and second modules (107a, 107b) are enabled for operation based, at least in part, on the reclamation state and the module configuration state.

Abstract: The present disclosure includes apparatuses and methods related to configurable trim settings on a memory device. An example apparatus can include configuring a set of trim settings for an array of memory cells such that the array of memory cells have desired operational characteristics in response to being operated with the set of trim settings.

Abstract: Disclosed herein is an Artificial Intelligence (AI) processor. The AI processor includes multiple NVM AI cores for respectively performing basic unit operations required for a deep-learning operation based on data stored in NVM; SRAM for storing at least some of the results of the basic unit operations; and an AI core for performing an accumulation operation on the results of the basic unit operation.

Abstract: Disclosed is a memory system that has a memory controller and may have a memory component. The memory component may be a dynamic random access memory (DRAM). The memory controller is connectable to the memory component. The memory component has at least one data row and at least one tag row different from and associated with the at least one data row. The memory system is to implement a cache having multiple ways to hold a data group. The memory controller is operable in each of a plurality of operating modes. The operating modes include a first operating mode and a second operating mode. The first operating mode and the second operating mode have differing addressing and timing for accessing the data group. The memory controller has cache read logic that sends a cache read command, cache results logic that receives a response from the memory component, and cache fetch logic.

Abstract: A receiver circuit that includes a pair of pre-stage amplifier circuits and a post-stage amplifier circuit is introduced. A first pre-stage amplifier circuit includes a pair of first n-type transistors, and gate terminals of the first pair of the n-type transistors receive the input signal and the reference voltage signal, respectively. A second pre-stage amplifier circuit includes a pair of first p-type transistors, wherein gate terminals of the pair of the first p-type transistors receive the input signal and the reference voltage signal, respectively. The post-stage amplifier circuit outputs a post amplifying signal according to the first pre-stage amplifying signals and the second pre-stage amplifying signals. A memory device including the receiver circuit and an operation method thereof are also introduced.