Patents Examined by Anthony T. Dougherty
  • Patent number: 7043406
    Abstract: Apparatus and methods are provided for reducing coherent noise in measurements of repetitive analog signal waveforms by digital signal averagers. Coherent noise is repetitive and synchronous with the signal waveform and is therefore undiminished by conventional signal averaging techniques. A major source of coherent noise is the repetitive voltage transitions that occur within the digital signal averager itself. The apparatus and methods of the present invention introduce a known and variable phase offset during the signal averaging process between the signal waveform being measured and the internally generated coherent noise, thereby allowing such coherent noise to be averaged, and therefore reduced, during the signal averaging process. Consequently, the apparatus and methods of the present invention allow greater signal-to-noise ratio and signal dynamic range than with the prior art.
    Type: Grant
    Filed: April 23, 2003
    Date of Patent: May 9, 2006
    Assignee: Analytica of Branford, Inc.
    Inventors: David G. Welkie, Craig M. Whitehouse
  • Patent number: 6934661
    Abstract: A method for detecting wafer flat shift, and an apparatus (500) having two sensors (506a) and (506b) in a power supply circuit (600) for wafer fabrication equipment, the sensors (506a) and (506b) detecting a shift in wafer flat position from a desired position and shutting off the wafer fabrication equipment.
    Type: Grant
    Filed: December 16, 2003
    Date of Patent: August 23, 2005
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Jean-Hua Yuen, Po-Ming Chen, Ming-Ji Chiang, Ji-Shen Yang
  • Patent number: 6934644
    Abstract: A method of determining a volume of fluid associated with a fluid storage and dispensing system, the volume of fluid having a height in the system, wherein the system include measurement apparatus for measuring the height. The method includes collecting a plurality of height measurement data from the measurement apparatus in a form readable by a computer; storing the plurality of height measurement data in a compressed matrix format in a computer memory; and performing regression analysis using the compressed matrix format to calculate the volume of fluid associated with the system.
    Type: Grant
    Filed: September 3, 2003
    Date of Patent: August 23, 2005
    Assignee: Warren Rogers Associates, Inc.
    Inventors: Warren F. Rogers, John R. Collins, Jillanne B. Jones
  • Patent number: 6934652
    Abstract: A temperature monitoring technique that eliminates the need for bipolar devices. In one embodiment of the present invention, a long-channel MOS transistor is configured in a diode connection to sense change in temperature. The diode drives a linear regulator and an oscillator. The oscillator in turn drives a counter, which counts pulses for a fixed period of time. The system clock on the chip is used as a temperature-independent frequency to generate a count. The temperature-dependent frequency is counted for a fixed number of system clock cycles. The present invention eliminates band gap circuitry currently used in most thermal sensing devices to provide a temperature-independent reference.
    Type: Grant
    Filed: November 10, 2003
    Date of Patent: August 23, 2005
    Assignee: Sun Microsystems, Inc.
    Inventors: Claude R. Gauthier, Gin S. Yee
  • Patent number: 6931347
    Abstract: The invention is directed to a method for assigning to a set of products a set of corresponding continuous demand densities. In a conversion step for each product its demand time series is converted into a discrete demand density. In a normalization step the discrete demand densities are transformed into normalized discrete demand densities. In a clustering step each of the normalized discrete demand densities is assigned to a cluster and for each cluster a cluster-representative discrete density is determined. In a selection step for each cluster-representative discrete density out of a predetermined set of continuous model densities a cluster-representative continuous density is selected. In a parameter-determination step for each product for its cluster-representative continuous density product-individual density parameters are determined under use of which for each product a continuous density is determined.
    Type: Grant
    Filed: December 22, 2003
    Date of Patent: August 16, 2005
    Assignee: International Business Machines Corporation
    Inventors: Richard A. Boedi, Abderrahim Labbi, Ulrich B. Schimpel
  • Patent number: 6928382
    Abstract: Disclosed are an apparatus and a method for measuring the speed of a moving body using an accelerometer. A value of earth's gravitational acceleration component is detected from the measurements from the accelerometer and is removed from the acceleration value. Then, the acceleration value, after removal of the earth's gravitational acceleration component, is used to obtain the speed of the moving body. The earth's gravitational acceleration component is detected using a movement average at a point of time when the speed of the moving body is to be measured. By using the magnitude of a difference between a value obtained by removing an x-axis movement average from an x-axis measurement from the two-axis accelerometer and another value obtained by removing a y-axis movement average from a y-axis measurement from the two-axis accelerometer, it is possible to regulate a window for calculating the movement average and a weight value to each of the measurements included in the window.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: August 9, 2005
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyun-Su Hong, Kook-Yeon Lee
  • Patent number: 6928383
    Abstract: A motion capture system includes a motion capture detecting device with sensor coils that are sequentially selected by a control section. Signals are communicated between respective input coils of input elements of an input device and the sensor coils by electromagnetic coupling. The signals received by each of the selected coils are detected by a detecting section. Three-dimensional coordinates and directions of each of the input elements are calculated by a control section so that the input elements become continuous, based on the detected signals by the detecting section.
    Type: Grant
    Filed: December 17, 2003
    Date of Patent: August 9, 2005
    Assignee: Wacom Co., Ltd.
    Inventors: Masamitsu Fukushima, Yasuo Oda, Masamitsu Ito
  • Patent number: 6928380
    Abstract: A system and method for measuring thermal distributions of an electronic device during operation is disclosed. The system includes an electronic device, a heat sink adjacent to the electronic device and an electrical-insulating layer disposed on the electronic device so as to separate the electronic device and the heat sink. The system further includes a plurality of thermal sensors located on the electrical-insulating layer, each of the plurality of thermal sensors in a different location. The plurality of thermal sensors is located within one or more thin film circuit layers disposed adjacent to the electrical insulating layer. The system further includes a module for receiving thermal information from the plurality of thermal sensors during operation of the electronic device. The system further includes a processor coupled to the module for generating a thermal distribution of the electronic device based on the thermal information received from the plurality of thermal sensors.
    Type: Grant
    Filed: October 30, 2003
    Date of Patent: August 9, 2005
    Assignee: International Business Machines Corporation
    Inventors: S. Jay Chey, Hendrik Hamann, James A. Lacey, James Vichiconti, Robert J. von Gutfeld
  • Patent number: 6925411
    Abstract: One embodiment of the present invention provides a system that facilitates measuring an alignment between a first semiconductor die and a second semiconductor die. The system provides a plurality of conductive elements on the first semiconductor die and a plurality of conductive elements on the second semiconductor die. The plurality of conductive elements on the second semiconductor die have a different spacing than the plurality of conductive elements on the first semiconductor die, so that when the plurality of conductive elements on the first semiconductor die overlap the plurality of conductive elements on the second semiconductor die, a vernier alignment structure is created between them. The system also provides a charging mechanism configured to selectively charge each of the plurality of conductive elements on the first semiconductor die, wherein charging a conductive element on the first semiconductor die induces a charge in one or more conductive elements on the second semiconductor die.
    Type: Grant
    Filed: December 19, 2003
    Date of Patent: August 2, 2005
    Assignee: Sun Microsystems, Inc.
    Inventors: Robert J. Drost, Ivan E. Sutherland
  • Patent number: 6925409
    Abstract: A system method for determining temperature anomalies that would affect the proper operation of a computer and, upon receipt of a determined temperature anomaly, causing certain data to be saved within a storage device in a file location appropriate for such data.
    Type: Grant
    Filed: October 3, 2002
    Date of Patent: August 2, 2005
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Kevin H. Smith, Andrew H. Dickson
  • Patent number: 6922657
    Abstract: A vibration diagnosis is performed by using a vibration mode interactive query section grasping vibration event of a machinery such as turbine rotor and characteristic feature thereof from detected data information, a vibration factor diagnosis section estimating a vibration factor based on the information from the vibration mode interactive query section, and a diagnosis result display section indicating the estimated vibration factor and a guidance for countermeasure to be taken against the vibration factor.
    Type: Grant
    Filed: April 24, 2003
    Date of Patent: July 26, 2005
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Seiichi Asatsu, Masanori Murakami, Mitsuyoshi Okazaki
  • Patent number: 6920403
    Abstract: There is provided a power supply voltage fluctuation analyzing method which performs power supply voltage fluctuation analysis for a semiconductor product, and the method comprises a step of determining a power consumption distribution in each function cell of the semiconductor product by using a power supply portion position and a ratio of each portion based on stored information of an input library which stores therein the power supply portion position and ratio information for each function cell of the semiconductor product, and allocating a power consumption to each function cell.
    Type: Grant
    Filed: April 23, 2003
    Date of Patent: July 19, 2005
    Assignee: NEC Electronics Corporation
    Inventor: Kazuo Ootouge
  • Patent number: 6920400
    Abstract: A method and apparatus for detecting and clearing a plugged sensor port in a system containing a fluid being monitored through the sensor port. The method comprises establishing a range beyond which a fluid variable is expected to vary within a predetermined time interval, measuring the fluid variable, and indicating a plugged sensor port in response to the measured fluid variable remaining within the range for the predetermined time interval. The apparatus includes a sensor mechanism that senses a fluid variable, and a controller. The controller establishes the range beyond which the fluid variable is expected to vary within a predetermined time interval, determines whether the fluid variable is within the range, and indicates a plugged sensor port in response to the fluid variable remaining within the range for the predetermined time interval. The apparatus may further include a mechanism that clears the plugged sensor port.
    Type: Grant
    Filed: December 20, 2001
    Date of Patent: July 19, 2005
    Assignee: United Electric Controls Co.
    Inventors: Dennis A. Lonigro, David J. Wilbur, Dale A. Zeskind
  • Patent number: 6915216
    Abstract: A system adapted to determine a property of a paving-related material is provided. Such a system comprises a central computing system housing database, such as a geographic information system (GIS). A measuring device for selectively and directly measuring the property of the paving-related material is remotely disposed with respect to the central computing system and operably engaged with a locating device, such as a global positioning system (GPS) device, for determining a location of the measuring device when the property of the paving-related material is selectively measured thereby.
    Type: Grant
    Filed: October 11, 2002
    Date of Patent: July 5, 2005
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventors: Robert Ernest Troxler, Andrew Kirk Dummer, James Daniel Pratt, Jr., William Finch Troxler, Jr., Michael E. Bienvenu, John Pjura, Robyn Lyn Myers, Dirk Steckman
  • Patent number: 6909989
    Abstract: Computer-based method and system are provided for establishing operational stability prior to determining temperature correction factors for a generator. The method allows providing (e.g., 102) a data file including data indicative of prescribed stability criteria for the generator. The method further allows monitoring (e.g., 104) respective operational parameters indicative of actual operational stability of the generator. The respective operational parameters indicative of the actual operational stability of the generator are related (e.g., 106) to the prescribed stability criteria in the data file. In response to the relating action, a graphical display (e.g., 82) is generated (e.g., 108) and the graphical display is indicative of whether or not the actual operational stability of the generator complies with the prescribed stability criteria.
    Type: Grant
    Filed: February 24, 2003
    Date of Patent: June 21, 2005
    Assignee: Siemens Westinghouse Power Corporation
    Inventors: Edward David Thompson, Ethan D. Frolich
  • Patent number: 6907356
    Abstract: A method and apparatus for detecting a damaged encoder strip are described. An encoder strip is scanned in two separate operations at two separate times, a first operation and a second operation. The number of markings sensed in each separate operation is counted. A circuit compares the count of markings in each separate operation. If the count differs between the two operations, the circuit determines that the encoder strip is damaged, and the circuit develops a signal indicating this damage. In an embodiment, the first operation is performed during a calibration, and the second operation is performed during a power-on, or upon operator command.
    Type: Grant
    Filed: October 10, 2002
    Date of Patent: June 14, 2005
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Samuel K. Swenson, Ryan Christensen
  • Patent number: 6907350
    Abstract: This invention provides libraries of information on chemical substances (which are termed “chenes”) as they interact with various biological systems, efficient methods to construct such libraries, and data sharing systems which enable efficient utilization of such libraries. Furthermore, this invention provides data bases which accommodate and maintain libraries of information relative to such chenes, methods and systems to construct such data bases by accumulating those pieces of information which concern chenes as they interact with various biological systems, methods and systems to enable a client to search through such construed data bases for desired information, methods and systems to transmit to such a client such desired pieces of information concerning chenes that are housed in such data bases, tangible electronic means to record and make use of such systems and data bases, and apparatus to enable construction and search of such data bases and/or transmission of desired information to such a client.
    Type: Grant
    Filed: March 13, 2001
    Date of Patent: June 14, 2005
    Assignee: Chugai Seiyaku Kabushiki Kaisha
    Inventor: Renpei Nagashima
  • Patent number: 6898549
    Abstract: An automated weighing station is provided which is advantageous for automatically weighing samples generally disposed in containers in an array of racks. The weighing station comprises a sample handling assembly which is operably connected to a balance, allowing a moveable sample carrier to bring samples into position beneath the balance and sample handling assembly, thereby minimizing the movement of individual samples in order to accomplish weighing. A weighing system that provides flexibility and convenience in generating and transforming a variety of data sets associated with measurements accomplished using the weighing apparatus is also provided. Also disclosed is an automated liquid dispensing system for dispensing liquid into sample containers. The liquid dispensing system may operate independently or in conjunction with the weighing system in a synchronized fashion.
    Type: Grant
    Filed: July 6, 2001
    Date of Patent: May 24, 2005
    Assignee: TransTech Pharma, Inc.
    Inventor: Reyad Sawafta
  • Patent number: 6895365
    Abstract: Systems and methods for analyzing data transferred through an SPI data bus are presented. In one exemplary preferred embodiment of the invention, an SPI data probe imitates an SPI device coupled to the SPI data bus and receives data from the SPI data bus so that the data may be analyzed. The SPI data probe transfers the data to an analysis unit without substantially altering impedance more than the SPI device would. The SPI data probe includes connectors configured for coupling the probe to the SPI data bus and for coupling the probe to an analysis unit. The SPI data probe also includes circuitry that may buffer, compensate and deskew the data as an SPI device would.
    Type: Grant
    Filed: April 25, 2003
    Date of Patent: May 17, 2005
    Assignee: LSI Logic Corporation
    Inventors: William W. Voorhees, William J. Schmitz, Mark A. Slutz
  • Patent number: 6892160
    Abstract: A method of locating an assembly point (P) on a first part (40), at which assembly point the first part is to be joined to a second part (1), the method comprising the steps of: determining an assembly location (1a, 1b, 1c, 1d) in respect of the second part; measuring a portion (42a, 42b, 42c) of a surface (43) of the first part, the surface being spaced away from the second part, so as to define the position and orientation of the surface; and, calculating the assembly point on the surface of the first part, where the surface of the first part is intersected by a vector (N) passing between the determined assembly location and the surface of the first part.
    Type: Grant
    Filed: April 6, 2001
    Date of Patent: May 10, 2005
    Assignee: BAE Systems plc
    Inventors: Richard Michael Gooch, Carol Anne Walker, John Stewart Anderson