Abstract: There is described a radiation source module for use in a fluid treatment system. The radiation source module comprises a plurality of elongate radiation source elements secured to a frame element, each elongate radiation source element having a longitudinal axis; a first motive element secured to a first side portion of the frame element; and a second motive element secured to a second side portion of the frame element. The first motive element and the second motive element are configured to reversibly translate the plurality of elongate radiation source elements in a direction substantially parallel to the longitudinal axis. A fluid treatment system comprising the radiation source module is also described.

Abstract: The subject of the present invention is a device for the in situ analysis of batteries by means of X-ray, synchrotron or another radiation. The device has a sample support, which is realized as a sample wheel rotatably mounted about the center axis. A plurality of sample holders, the center points of which are placed on a common circular line about the center point of the sample support, are arranged on the sample support, wherein each sample holder can be repeatedly opened and closed individually by an arrestable cover. Each sample holder has in its interior a cavity which receives the battery, which is to be examined, in a manner ideal in shape with regard to circumference, wherein the cover and the cavity have an opening for the passage of the beam. A spring, engaging in the edge region of the battery, presses the battery against the cover, wherein the spring and the edge region of the cover are embodied so as to be electrically conducting but insulated with respect to one another.

Abstract: Implementations of methods and apparatuses are disclosed for decoding multiplexed information in a chromatographic system. Implementations may include the method of pulsing ions from an ion source through an analyzer according to a predetermined multiplexing scheme, each pulse including one or more ions corresponding to a sample, detecting a plurality of ion strikes at a detector, determining a data point for each ion strike, wherein each data point includes an intensity of a detected ion strike and a time of the detected ion strike, maintaining a multiplexed spectrum of the data points, the multiplexed spectrum including the data points, and demultiplexing the time shifted spectrum using the data points of the multiplexed spectrum.

Abstract: An analytical apparatus for mass spectrometry comprises an electron impact ionizer including an electron emitter and an ionization target zone. The target zone is arranged to be populated with matter to be ionized for analysis. An electron extracting element is aligned with an electron pathway defined between the electron emitter and the ionization target zone. The electron extracting element is configured to accelerate electrons away from the emitter along the electron pathway between the emitter and the extracting element and to decelerate the electrons along the electron pathway between the extracting element and the ionization target zone to enable soft ionization while avoiding the effects of Coulombic repulsion at the electron source.

Abstract: A mass analyser comprises a pair of electrode arrays. Each array has a set of focusing electrodes which are supplied, in use, with voltage to create an electrostatic field in a space between the electrode arrays causing ions to undergo periodic, oscillatory motion in the space, ions passing between electrodes of the sets of focusing electrodes and being repeatedly focused at a center plane, mid-way between the electrode arrays. At least one electrode of each set of focusing electrodes has an electrode surface closer to the center plane than the electrode surfaces of other electrodes of the same set. The analyzer may be an ion trap mass analyser or a multi-turn ToF mass analyzer.

Abstract: The present invention relates to energy conversion device which contains one or more collection units (10) suitable for receiving environmental energy as well as a conversion unit (30) in an electrically conducting connection with the collection unit (10) with the help of a cable (20), at least one of the collection units (10) is formed by a set of metal material pipe members (11), while the conversion unit (30) has a condenser part-unit (32) consisting of metal armored plates (32a, 32a?) separated from each other by a gap (T) and located in the cover (31), as well as a frequency-setting part-unit (33) cooperating with the condenser part-unit (32), where the frequency-setting part-unit (33) has a reception space (35) located within the cover (31) of the conversion unit (30) and enclosed by a delimiting shell (34) in the vicinity of the condenser part-unit (32) and a charge (40) located in the reception space (35), and the charge (40) contains an organic component and an inorganic component distributed in a ca

Abstract: An ionization device includes a first electrode comprising a conductive member coated with a dielectric layer. The ionization device also includes a spine extending adjacent to and at least partially along the first electrode. The ionization device further includes a second electrode comprising conductive segments disposed adjacent the first electrode. Each one of the conductive segments contacts the spine at a respective contact location. The dielectric layer of the first electrode separates the conductive member of the first electrode from the spine and the second electrode. The ionization device is configured to create plasma generating locations corresponding to respective crossings of the first electrode and the second electrode.

Abstract: An off-axis ion transport optical system (20) including a front-stage quadrupole ion guide (21), a rear-stage quadrupole ion guide (22), and an ion deflector (23) is disposed inside an intermediate vacuum chamber (2) in a stage next to an ionization chamber (1) maintained at an atmospheric pressure. Both of the quadrupole ion guides (21 and 22) have the same configuration as that of a conventional ion guide that transports ions while trapping the ions using a radio-frequency electric field. The ion deflector (23) includes a pair of parallel flat electrodes (231 and 232) and deflects ions using a direct-current electric field. By causing the deflected ions to reach the ion receiving range of the rear-stage quadrupole ion guide (22), it is possible to efficiency introduce ions while deflecting the ions. Meanwhile, the ions and neutral particles are separated from each other in the ion deflector (23).

Abstract: A radio-frequency voltage generator includes a first DC power supply for generating first direct-current voltage; a second DC power supply for generating second direct-current voltage; a transient alternating voltage generation circuit for generating a transient alternating voltage having a cycle shorter than a cycle of the radio-frequency voltage and having a voltage value oscillating between the first direct-current voltage and the second direct-current voltage; and a voltage switch section for switching voltages from the first direct-current voltage, to the transient alternating voltage, to the second direct-current voltage, and to the transient alternating voltage in this order, wherein the voltage switch section switches the voltages applied to the load so that the transient alternating voltage oscillates a half-integer of times starting with an initial value having the value of the direct-current voltage applied immediately before the switching, the half-integer being equal to or greater than 1.5.

Abstract: The invention is directed at a method of advancing a probe tip of a probe of a scanning microscopy device towards a sample surface. The scanning microscopy device comprises the probe for scanning the sample surface for mapping nanostructures on the sample surface. The probe tip of the probe is mounted on a cantilever arranged for bringing the probe tip in contact with the sample surface. The method comprises controlling, by a controller, an actuator system of the device for moving the probe to the sample surface, and receiving, by the controller, a sensor signal indicative of at least one operational parameter of the probe for providing feedback to perform said controlling.

Abstract: Provided is a technology for suppressing a heat rise in a sample, the heat rise being generated due to ion beam irradiation at a low acceleration voltage. A blocking plate, which is different from a mask, is disposed in front of a sample. The blocking plate has an opening that overlaps a processing surface, and ion beams pass only through the opening of the blocking plate, and in the areas excluding the opening, the ion beams are blocked by the blocking plate, and the sample is not irradiated thereby. Furthermore, the heat rise in the sample is further suppressed by cooling the blocking plate.

Abstract: A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

Abstract: To provide a charged particle beam analyzer enabling an efficient and high-sensitivity analysis of a microscopic light element contained in a heavy metal sample, the charged particle beam analyzer equipped with a WDX spectrometer includes a storage unit 126 having stored therein a correlation database between average atomic numbers and WDX background intensity values obtained with use of a plurality of standard samples and a WDX background processing means 146 including a means 147 for calculating an average atomic number for a sample 129 and a means for eliminating a WDX background intensity value derived from the average atomic number for the sample 129 and the correlation database from a WDX spectrum for the sample 129.

Abstract: A method of producing a corrected beam of charged particles for use in a charged-particle microscope, comprising the following steps: Providing a non-monoenergetic input beam of charged particles; Passing said input beam through an optical module comprising a series arrangement of: A stigmator, thereby producing an astigmatism-compensated, energy-dispersed intermediate beam with a particular monoenergetic line focus direction; A beam selector, comprising a slit that is rotationally oriented so as to match a direction of the slit to said line focus direction, thereby producing an output beam comprising an energy-discriminated portion of said intermediate beam.

Abstract: A micro-chamber for inspecting sample material can be filled with sample material immersed in a liquid without the need of applying vacuum tubing's to the micro-chamber. The micro-chamber includes an inspection volume for holding the sample material for observation. The inspection volume is defined by a first rigid layer, a second rigid layer spaced from the first rigid layer, and a hermetic seal between the first and the second rigid layers. One of the rigid layers includes thin part can be punctured. The liquid with immersed sample material, when placed upon the thin part, is sucked into the evacuated inspection volume when the thin part is punctured.

Abstract: A charged particle beam writing apparatus includes a circuitry to set, when a charged particle beam is deflected to move between plural small regions by a deflector, plural first mesh regions obtained by virtually dividing a chip region into regions by length and width sizes same as those of each of the plural small regions; determine whether a shot figure having been assigned exists in each of the plural first mesh regions; a circuitry to perform, for the plural first mesh regions, merging of two or more adjacent first mesh regions; a circuitry to measure, for each of plural second mesh regions each obtained by merging, the number of first mesh regions each having been determined that an assigned shot figure exists therein; and a circuitry to generate a map for each chip, where measured number of first mesh regions with the shot figure is defined as a map value.

Abstract: In accordance with an embodiment, an analytical apparatus includes a member, a voltage source connected to the member and a detecting section. The member has an inserting portion into which a sample holder supporting a sample is insertable and whose shape corresponds to a shape of the sample holder. The detecting section is configured to detect a substance to be emitted from the sample by field evaporation. The shape of the inserting portion in a cross section of a direction perpendicular to an inserting direction of the sample holder is a shape excluding a perfect circle.

Abstract: Among other things, an energy shield (212) for a radiation system, such as a security imaging system, is provided. The energy shield is comprised of one or more flaps (300). At least one flap defines an aperture (320) providing a demarcation between a first flap segment (322) of the flap and a second flap segment (324) of the flap. The aperture (e.g., and a flexible member (326) positioned spatially proximate the aperture) provide for (e.g., facilitate) movement of the second flap segment relative to the first flap segment. In this manner, an amount of force required to be applied by an object to pass by the flap may be reduced when the object is small and merely contacts the second flap segment, for example. In this manner, baggage jams may be mitigated, for example, by reducing the likelihood that certain objects will be impeded from passing through the energy shield.

Abstract: A device for mass spectrometry in continuous operation can be equipped with a focused electron beam source or laser radiation source. It can further include a vacuum chamber, a stage for placing the specimen, and an ion beam column with a plasma source for producing a primary ion beam and a secondary ion mass spectrometer for secondary ion analysis. The ion beam column is connected to an inert gas source and to a reactive gas source and is modified for simultaneous introduction of at least two gases from the inert gas source and reactive gas source. The secondary ion mass spectrometer is of an orthogonal Time-of-Flight type to ensure the function with the ion beam column in continuous operation.

Abstract: The invention relates to a mass spectrometer having an electron impact ionization source which comprises an ejector for forming a beam of sample gas being driven in a first direction through an interaction region; a magnet assembly configured and arranged such that its magnetic field lines pass through the interaction region substantially parallel to the first direction; an electron emitter assembly for directing electrons toward the interaction region in a second direction being aligned substantially opposite to the first direction, wherein the electrons propagate along and are confined about the magnetic field lines until reaching the interaction region and forming sample gas ions therein; and a mass analyzer located downstream from the interaction region to which the sample gas ions are guided for mass analysis.