Abstract: The invention relates to methods of assessing one or more geometric properties of a particle of a substance using an infrared spectroscopic property of the substance. The method is useful, for example, for assessing particle sizes and size distributions in mixtures containing both particles of the substance and other materials.

Abstract: A multi-spectrum, multi-channel imaging spectrometer includes two or more input slits or other light input devices, one for each of two or more input channels. The input slits are vertically and horizontally displaced, with respect to each other. The vertical displacements cause spectra from the two channels to be vertically displaced, with respect to each other, on a single image sensor on a stationary image plane. The horizontal displacements cause incident light beams from the respective input channels to strike a convex grating at different respective incidence angles and produce separate spectra having different respective spectral ranges. A retroflective spectrometer includes a convex grating that, by diffraction, disperses wavelengths of light at different angles and orders approximately back along an incident light beam. A single concave mirror reflects both the input channel and the dispersed spectrum.

Abstract: A tristimulus colorimeter for measuring reflective or transmissive materials is provided. The colorimeter measures a sample under a calibrated light source, receives inputs to detectors, and determines CIE tristimulus values of the same sample as they would occur under a reference light source. The colorimeter includes a calibrated light source and a single silicon chip that includes three or more detectors. Each detector is permanently coated by a different mix of dyes or other colorants that form a wavelength-selective filter. A single silicon chip embodies all the detectors and electronics, with each detector coated over by deposited filter layers.

Abstract: The present invention is an engraved gemstone viewer for viewing a flat, smooth surface of a gemstone that has been micro or nano etched with an inscription such as an identification number. The gemstone is mounted on a piece of jewelry or can remain unmounted when placed inside or otherwise received by the viewer. A source of light directs a light beam toward a magnifying lens coated with a reflection enhancing coating. The lens reflects the light beam along a path incident to the surface of the gemstone containing the inscription. The smooth flat gemstone surface spectrally reflects the light beam along a path back toward the magnifying lens, which produces a viewable light image that reveals the inscription. The inscription is shown as a dark or lightless region of the light image.

Abstract: A spectrophotometric scanner suitable for producing spectral reflectance images of surfaces of samples for a plurality of wavelength bands is disclosed. The spectrophotometric scanner comprises a scanner head for collecting spectral reflectance data, a positioning mechanism for positioning the scanner head in relation to a surface, and a computing device for controlling the mechanism and recording and analyzing the spectral reflectance data. The computing device directs the positioning mechanism to position the scanner head on a row of locations in a grid of locations of the surface; directs the scanner head to measure spectral reflectance data for each location in the row of locations; records and analyzes the spectral reflectance data; and produces spectral reflectance images from the spectral reflectance data. A light source in the scanner head comprises a plurality of sequentially controllable LEDs, each producing light in a different wavelength band.

Abstract: An in-situ laser plasma spectroscopy (LPS) system for automated near real-time elemental depth profiling of a target including: an optical source configured to generate an optical beam, wherein the optical beam is pulsed; an optical probe system configured to deliver the optical beam from the optical source to a surface of a target to generate an ablation plasma; a time resolved spectral detection system configured to generate time resolved spectral data from emission signals from the ablation plasma; and a data acquisition and processing system configured to acquire the time resolved spectral data to determine, in combination with predetermined calibration data, an absolute elemental concentration as a function of depth in near real-time.

Abstract: The invention relates to a device for the IR-spectrometric analysis of a solid, liquid or gaseous medium. The device includes a process probe, which has a reflection element. The device additionally includes a linear variable filter, at least one detector element, and a control/evaluation unit. At least one light source is also provided, the light of which is coupled into the reflection element via a collimating optics. At least one optical waveguide having a light input section and a light output section is provided. The light is guided via the light output section of the optical waveguide into a defined region of the linear variable filter. The detector element and the linear variable filter are arranged movably relative to one another over approximately the length of the linear variable filter. The control/evaluation unit determines the spectrum of the medium on the basis of the measured values delivered from the detector element.

Abstract: The invention provides systems and methods for detecting aerosols. The systems and methods can be used to detect harmful aerosols, such as, bio-aerosols.

Abstract: Disclosed herein are systems and methods for measuring color and contrast in specular reflective devices such as interferometric modulators. To make color and contrast determinations, light reflected from a specular reflective device may be measured in-line with illumination of the device. The measurements may include measuring the spectra of light reflected from the device being tested as well as from specular bright and dark standards. The spectra may be used to determine a reflectance spectrum and color parameters for the specular reflective device.

Abstract: A system for reproducibly measuring motion along surfaces of arbitrary or indeterminate length and of arbitrary curvature, using an opto-electronic sensor mounted to an object in motion along the surfaces. The system involves the detection of alternating reflective and non-reflective markings, on surfaces which can be curved in a certain dimension and can be of any length. Additionally, the system can be applied to measure the motion of camera carts or dollies along straight track, curved track, or any combination of straight and curved track.

Abstract: The optical analysis system (20) for determining an amplitude of a principal component of an optical signal comprises a multivariate optical element (10) for reflecting the optical signal and thereby weighing the optical signal by a spectral weighing function, and a detector (9, 9P, 9N) for detecting the weighed optical signal. The optical analysis system (20) may further comprise a dispersive element (2) for spectrally dispersing the optical signal, the multivariate optical element being arranged to receive the dispersed optical signal. The blood analysis system (40) comprises the optical analysis system (20) according to the invention.

Abstract: A system and method for correcting for “wavelength drift” in an RES system. One advantage provided by the invention includes the ability to correct for offset amounts of “wavelength drift” that are not divisible by an integer number of pixels (e.g., fraction pixel offset amounts) in an optical detector used in the RES system. Correction of fractional pixel offset amounts may enhance spectral matching, enable substantially continuous calibration of an RES system, and/or other benefits.

Abstract: Systems and techniques for improved spectroscopy. In some embodiments, mechanical and/or optical zoom mechanisms may be provided for monochromator systems. For example, movable detector systems allow a detector to be positioned with respect to a dispersive element in order to obtain a first resolution. The detector systems may then allow the detector to be positioned with respect to a dispersive element to obtain a second different resolution. In some embodiments, spectroscopy of a first sample region may be performed using a plurality of excitation wavelengths. Multiple detectors may be positioned to receive light associated with different ones of the plurality of excitation wavelengths.

Abstract: A contamination detector in accordance with one embodiment of the invention includes a plasma generation system operable to direct an atmospheric plasma discharge towards a surface. The contamination detector further includes a light capture system to capture light generated by interaction of the atmospheric plasma discharge with the surface. The light capture system guides the captured light to an optical detection system configured to detect a contaminant.

Abstract: An apparatus for performing laser-induced breakdown spectroscopy comprises a handheld unit with a pump laser and a controller. A combination of a solid laser medium and a Q-switch receive a laser beam from said pump laser. Focusing optics focus laser pulses from said combination to a focal spot at a sample. Light collection optics collect light from plasma induced of sample material by focused laser pulses. A spectrometer receives collected light and produces information describing its spectral distribution. A power source delivers electric power to other parts of the apparatus. The pump laser, combination, focusing optics, light collection optics, spectrometer and power source are parts of said handheld unit.

Abstract: An optoelectronic system for measuring fluorescence or luminescence emission decay, including (a) a light source being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode detecting the emission; (d) a second integrated circuit comprising a detection analysis system determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.

Abstract: A greater efficiency and cost-effectiveness is achieved by optically assessing the condition of a gas discharge lamp. Herein, a system and method of optically assessing lamp condition includes measuring the intensity of emitted light within two portions of the emitted spectrum. One portion of the lamp's spectrum is selected such that the intensity of emitted light from that portion remains relatively constant as the lamp ages. The second portion of the lamp's spectrum is selected such that the intensity of the emitted light varies measurably as the lamp ages. A ratio is computed between the two intensities. Comparing this ratio to a reference ratio provides information of the relative present condition (i.e., age) of the lamp being tested. Associating the lamp with location data is a further aspect. Important advantages are the ability to predict relative lamp age, and thus avoid both premature lamp replacement and pre-failure lamp cycling.

Abstract: An imaging system having a programmable spectral transmission function, that includes an input image plane for passing input imaging light into the imaging system; a dispersive optical system for separating the input imaging light into its corresponding spectral components, thus creating spectrally-dispersed image components along a spectrally-dispersed direction. Also included is a spatial light modulator, having a plurality of operational states, for selecting spectral components for imaging; and having a width along the spectrally-dispersed direction; a de-dispersive optical system for re-combining the selected spectral components for imaging onto a detector array; and means for scanning the input imaging light from an object of interest to generate an output area image.

Abstract: A process for measuring a point comprising at least one spectrometer and a measuring transducer connected thereto for picking up, processing and forwarding measuring signals from the spectrometer, the spectrometer being arranged in an armature for introduction into a process or a process fluid and the data produced by the spectrometer is used to control a process. The armature comprises a housing for receiving the spectrometer and for securing the armature to a process container containing process fluid and a sensor holder with an inbuilt sensor, interacting with the spectrometer and which is guided in an axially displaceable manner in the armature, whereby the sensor holder protrudes into the process fluid in an extended state.

Abstract: An optical monitoring system for determining the constituents of a sample or specimen. An absorption spectrum is obtained from a sample and is passed through one or more filters having a specified absorption spectrum defined by a single atom or a compound. If the filter's absorption spectrum is included in the sample's absorption spectrum, then the sample contains that atom or compound. The apparatus includes a switching assembly that sequentially places one or more filters into the light path to determine if the subject atom or compound is contained in the sample.