Patents Examined by Christopher J Gassen
  • Patent number: 11635466
    Abstract: A relay abnormality diagnosis system and method capable of diagnosing an abnormality of a relay by directly connecting a diagnosis resistor to a current measurement unit and by using a current input to the current measurement unit from the diagnosis resistor and a current flowing on an electric circuit measured by the current measurement unit, in the relay abnormality diagnosis system that diagnoses the abnormality of the relay using the diagnosis resistor.
    Type: Grant
    Filed: November 20, 2018
    Date of Patent: April 25, 2023
    Inventor: You Seob Gil
  • Patent number: 11624276
    Abstract: A pressure dosimeter can include a body-mountable housing comprising a well having a first end portion open to the atmosphere, a second closed end portion, and a cavity. The dosimeter can include a membrane assembly disposed within the cavity, and a sealing member disposed within the cavity between the membrane assembly and the second end portion. The membrane assembly has a diameter less than a diameter of the cavity and a thickness less than a height of the cavity such that it can move within the cavity allowing air to pass around it and into the second end portion. When exposed to a pressure event the membrane assembly is urged against the sealing member, sealing the second end portion. The membrane will rupture at a selected overpressure threshold.
    Type: Grant
    Filed: November 17, 2020
    Date of Patent: April 11, 2023
    Assignee: Brisance Corporation
    Inventor: Jeffrey R. Crowell
  • Patent number: 11614477
    Abstract: An inspection device according to an embodiment can conduct high temperature inspection and low temperature inspection on an object to be inspected. The inspection device includes an inspection chamber in which inspection is conducted on the object; a dry air supply section that is connected to the inspection chamber via a first valve and that is configured to supply dry air into the inspection chamber; a dew point meter that is connected to the inspection chamber via a second valve and that is configured to measure a dew point in the inspection chamber; and a bypass pipe connecting the dry air supply section and the dew point meter via a third valve.
    Type: Grant
    Filed: February 13, 2019
    Date of Patent: March 28, 2023
    Assignee: Tokyo Electron Limited
    Inventors: Yasuhiro Osuga, Koju Yamamoto
  • Patent number: 11614432
    Abstract: Provided is a gas sensor system with a gas sensor, and a microprocessor programmed to control the gas sensor with at least two operational modes. The first operational mode controls the gas sensor from a baseline level through analyte detection. Upon initiation of the recovery phase after analyte withdrawal, the gas sensor system switches to the second operational mode, which changes conditions of the gas sensor to (i) accelerate removal of the analyte from the gas sensor and (ii) accelerate recovery of the gas sensor output towards the baseline level. When no further analyte is detected, the gas sensor switches back to the first operational mode or to an additional operational mode to complete recovery.
    Type: Grant
    Filed: August 26, 2019
    Date of Patent: March 28, 2023
    Assignee: International Business Machines Corporation
    Inventors: Alberto Mannari, Andrea Fasoli, Aminat Adebiyi, Mohammed Abdi, Ronald Robert Labby
  • Patent number: 11435399
    Abstract: Systems and methods are provided for testing a threshold energy required to cause a latchup on an electronic component. An exemplary method includes applying a series of laser pulses to a testing object with a pulsed laser unit. The testing object is connected to a testing circuit which can measure the energy of each of the series of laser pulses, and detect whether a pulse of the series of laser pulses resulted in a latchup on the testing object. Upon detecting the pulse, the method provides for logging the energy of the pulse using a recording unit and logging the latchup status of the test device. If a latchup is detected, the testing circuit automatically mitigates the latchup event.
    Type: Grant
    Filed: February 8, 2018
    Date of Patent: September 6, 2022
    Assignee: Vanderbilt University
    Inventors: Andrew L. Sternberg, Ronald D. Schrimpf, Robert A. Reed