Patents Examined by Courtnery Thomas
  • Separate lateral processing of backscatter signals
    Patent number: 6424695
    Abstract: A system and a method for determining the depth of an object with respect to a surface behind which the object is concealed. The intensity of x-rays backscattered from the object is measured by at least two backscatter detectors disposed at different positions with respect to the scattering object. The depth of a scattering source within the volume penetrated by the x-rays is derived from the ratio of scattered x-rays measured by the detectors.
    Type: Grant
    Filed: December 16, 1999
    Date of Patent: July 23, 2002
    Assignee: American Science and Engineering, Inc.
    Inventors: Lee Grodzins, William Adams