Abstract: A pattern recognizing apparatus includes an image pick-up device for picking up an image of a component for teaching and an image of a component to be recognized, and a feature value calculating device for calculating a feature value based on the image picked up by the image pick-up device. Also provided is a processing control device for outputting a teaching signal indicating a processing rule to be applied to the components for teaching, a histogram forming device for receiving the teaching signal and the feature value calculated based on the image of the component to be recognized and forming a histogram of the feature value of the rule based on the teaching signal and the received feature value, and a membership function forming device for forming a membership function which includes a noise eliminating device for performing linear interpolation to valleys of the histogram, and a threshold processing device for changing the histogram to a membership function through a threshold process.

Abstract: A method and apparatus for obtaining an image from an object acquire training signal measurements which represent images of a plurality of training objects having at least one predetermined feature in common with the object and derive, from the training signal measurements, a set of basis functions that provide a convergent series expansion of the images. The method and apparatus determine a signal measurement prescription for the object based on the basis functions. A signal measurement acquiring device is controlled to acquire signal measurements of the object as determined by the signal measurement prescription. A truncated basis function expansion of the image is generated from the acquired signal measurements. Estimates of additional signal measurements are carried out based on the truncated basis function expansion. The image is reconstructed using the obtained signal measurements and the estimated additional signal measurements.