Abstract: A multiple integrated circuit (IC) die assembly includes a base IC die and secondary IC dice mounted on a surface of the base IC die. A set of protruding contacts formed on the surface of the base IC die and extending beyond the secondary IC dice link the surface of the base IC die to a printed circuit board (PCB) substrate with the secondary IC die residing between the base IC die and the PCB substrate.

Abstract: A liquid crystal display panel for making a LOG-type signal line test for detecting a short imperfection with a LOG-type signal line group even upon shorting of a shorting bar. In the panel, a picture display part has a plurality of liquid crystal cells, each of which is arranged at each intersection area between gate lines and data lines. Line on glass type signal lines are provided at an outer area of the picture display part by a line on glass system to apply signals required for driving external drive integrated circuits. At least two gate-shorting bars apply a test signal by separating the gate lines into two groups and separating partial signal lines of the line on glass type signal lines into at least two groups. At least two data shorting bars apply a test signal by separating the data lines into two groups and separating the remaining signal lines of the line on glass type signal lines into at least two groups.